• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    An integrated wavelength monitor and a method for obtaining such a device are disclosed. The device suitable for integration into a laser semiconductor laser module for fiber optic communication can be made in the following way: An interference filter is created directly onto a position sensitive photo detector by depositing a number of layers of different optical transparent materials forming an optical filter. The interference filter may also be created separately and subsequently mounted directly on top of the detector. The integrated position sensitive device (13) is mounted with an angle behind a laser in the same position as a normal power monitor detector. The electrically derived lateral position of light hitting the Position Sensitive Device provided with the interference filter will be dependent of the wavelength of the incident light and this derived position is used for the wavelength monitoring.
    公开号:US20010007501A1
    申请号:US09/756,127
    申请日:2001-01-09
    公开日:2001-07-12
    发明作者:Krister Frojdh
    申请人:Telefonaktiebolaget LM Ericsson AB；
    IPC主号:G01J9-00
    专利说明:
    [0001] The present invention relates to wavelength monitoring of a laser light and more particularly to a method and a device for an integrated wavelength monitor for laser sub-modules. [0001] BACKGROUND
    [0002] Fiber-optical transmission is one of the main transfer methods for telecommunication today. Wavelength division multiplexing (WDM) is the preferred method to transfer several channels over an optical fiber. As transmitters Distributed Feedback lasers (DFB-lasers) with precisely controlled wavelengths are typically used for this. [0002]
    [0003] The spacing between individual channels in WDM systems is typically down to 100 GHz corresponding to a spacing of 0.8 nanometer or 0.05% of the wavelength of the laser. To avoid interference between the channels a typical wavelength drift of ±0.1 nanometer must be guaranteed. At the system level today a separate unit for monitoring all channels is typically used. [0003]
    [0004] There are several solutions disclosed for obtaining a wavelength monitoring and control for WDM optical transmission systems. U.S. Pat. No. 5,825,792 discloses a compact wavelength monitoring and control assembly for a laser emission source with a distributed feedback (DFB), which comprises an angled Fabry-Perot etalon and two separate photo-detectors, the differential output of which is used in the feedback loop for stabilizing the wavelength of the laser source. [0004]
    [0005] Another U.S. Pat. No. 5,896,201 discloses an optical device for wavelength monitoring and control. The device has an optical element formed as a wedge for dividing a light beam into two differently reflected beams, which beams via a filter reach a first and second photo-detector. On the basis of a difference in wavelength characteristics, the wavelength of the light beam can be monitored according to outputs from the first and second photo-detectors. [0005]
    [0006] Also an international application WO95/20 144 discloses an optical wavelength sensor consisting of a wedge shaped Fabry-Perot etalon which exhibits resonance for different optical wavelengths across its width and an array of detectors that detects the spatial disposition of resonant peaks which occurs. [0006]
    [0007] Still another document U.S. Pat. No. 5,305,330 discloses a system comprising a laser diode and a system to stabilize the wavelength of the laser diode. The system comprises a beam splitter and a diffraction grating for measurement and a number of photo-detectors. [0007]
    [0008] All solutions found so far are rather complex and are more or less difficult to simply implement in a standard laser device. However, a laser with an integrated wavelength monitor would be an attractive component on the market. Therefore there is a demand for a simple compact integrated device for monitoring of the wavelength of a laser device. [0008] SUMMARY
    [0009] A wavelength monitor suitable for integration into a laser semiconductor laser module for fiber optic communication can be made in the following way: An interference filter is deposited directly onto a position sensitive photo detector or mounted directly on top of the detector. The detector device is mounted with an angle behind the laser in the same position as a normal power monitor detector. The electrically derived lateral position of light hitting the Position Sensitive Device provided with the interference filter will be dependent of the wavelength of the incident light and this derived position is used for the wavelength monitoring. [0009]
    [0010] A method for obtaining a wavelength monitor device according to the present invention is set forth by the independent claim [0010] 1 and the dependent claims 2-5. Furthermore, a device for controlling the wavelength of a laser source is set forth by the independent claim 6 and further embodiments of the device are set forth by the dependent claims 7-10. BRIEF DESCRIPTION OF THE DRAWINGS
    [0011] The invention, together with further objects and advantages thereof, may best be understood by making reference to the following description taken together with the accompanying drawings, in which [0011]
    [0012] FIG. 1 illustrates a typical embodiment of a position sensitive diode according to the state of the art; [0012]
    [0013] FIG. 2 illustrates a combination of a position sensitive photo detector and an interference filter according to the present invention; [0013]
    [0014] FIG. 3 illustrates a mounting of a integrated wavelength monitor according to FIG. 1 with an angle at a distance from the back facet of a laser device; and [0014]
    [0015] FIG. 4 illustrates a line formed by the deposited filter of the position sensitive device, the position of this line being dependent on the wavelength. [0015] DETAILED DESCRIPTION
    [0016] In FIG. 1 is demonstrated a general embodiment of a position sensitive diode. A position sensitive diode i a modification of an ordinary photodiode. By using two front electrodes [0016] 1 and 2, the photo-current generated by the incoming light 3 will be split between the front electrodes, generating currents I1 and I2 in the two front electrodes. The lateral position x of the light can then be extracted from the ratio of the two currents obtained. This constitutes the basic principle for a Position Sensitive Detector normally referred to as a PSD, to be utilized in the present application.
    [0017] A wavelength monitor according to the present improvement is formed by an inventive combination of a Position Sensitive Detector and an Interference Filter. Thus, the PSD [0017] 10 constitutes a photo-detector, from which both position as well as intensity of incident light can be extracted. The PSD is obtained by applying several electrodes onto a photo diode detector. The position and intensity is then derived from the current observed in the respective electrodes.
    [0018] In a basic embodiment demonstrated in FIG. 2 an interference filter [0018] 12 is fabricated on top of the PSD 10 by depositing a number of layers of different optical transparent materials. In yet another embodiment an interference filter is made separately and subsequently bonded to the Position Sensitive Detector chip 10. The resolution and wavelength range of the monitor can be controlled by the thickness of the spacer layer of the interference filter 12. The filter may for instance in a typical embodiment be shaped as a Fabry-Perot etalon. By using a low thermal expansion material as the spacing layer the temperature dependence can be minimized.
    [0019] In a typical embodiment utilizing the present invention a wavelength monitor [0019] 13 made as indicated above is mounted with an angle at a distance from the back-facet of a laser 14 as illustrated in FIG. 3. Alternatively, some of the light from the front-facet can be directed to the monitor.
    [0020] As only light incident at a specific angle will be transmitted through the filter [0020] 12, a line 15 as indicated in FIG. 4 will be formed on the position sensitive detector 10, whereby the position of the line is dependent on the wavelength. From the current of detected by the electrodes of the photo-detector, the wavelength of the light can then be extracted.
    [0021] The detector is simple to fabricate using standard processes available. The present monitor can directly replace the power monitor used in current laser packages. Commercially produced Position Sensitive Detectors are for instance found at SiTek Electro Optics, Partille, Sweden. [0021]
    [0022] By mounting the component [0022] 13 according to the present invention in front of an optical fiber a low cost, highly reliable wavelength meter is created. By using more electrodes in the PSD even the double modes of a laser could be detected. By measuring the wavelength signal resolved in time, the chirp of the laser is then easily monitored.
    [0023] It will be understood by those skilled in the art that various modifications and changes may be made to the present invention without departure from the scope thereof, which is defined by the appended claims. [0023]
    权利要求:
    Claims (10)
    [1" id="US-20010007501-A1-CLM-00001] 1. A method for obtaining a light wavelength monitor comprising the steps of
    utilizing a Position Sensitive Detector providing information of position and intensity of incident light by means of extracted current from a number detector electrodes;
    positioning an interference filter directly on top of said Position Sensitive Detector to thereby form an integrated wavelength sensitive device;
    mounting said formed wavelength sensitive device with an angle at a distance from a light source to have said wavelength sensitive device serve as a light wavelength monitor.
    [2" id="US-20010007501-A1-CLM-00002] 2. The method according to
    claim 1 , comprising the further step of fabricating the interference filter directly on top of said Position Sensitive Detector by depositing a number of optical transparent layers of material forming an optical filter material layers.
    [3" id="US-20010007501-A1-CLM-00003] 3. The method according to
    claim 1 , comprising the further step of separately fabricating the interference filter with an umber of layers of material and subsequently bond the obtained interference filter to said Position Sensitive Detector.
    [4" id="US-20010007501-A1-CLM-00004] 4. The method according to
    claim 1 , comprising the further step of using a low thermal expansion material as spacing layer in the interference filter to minimize temperature dependence.
    [5" id="US-20010007501-A1-CLM-00005] 5. The method according to
    claim 1 , comprising the further step of utilizing output signals derived from the position sensitive detector for controlling the wavelength of a laser light emitter.
    [6" id="US-20010007501-A1-CLM-00006] 6. A device for forming a light wavelength monitor comprising
    a Position Sensitive Detector, which is utilized for providing information of position and intensity of incident light by using current extracted from a number of position sensitive diode electrodes;
    an interference filter being positioned directly on top of the Position Sensitive Detector thereby forming an integrated wavelength sensitive device,
    said wavelength sensitive device being mounted with an angle at a distance from a light source to have said wavelength sensitive device operate as a light wavelength monitor device.
    [7" id="US-20010007501-A1-CLM-00007] 7. The device according to
    claim 6 , wherein said interference filter is fabricated directly on top of said Position Sensitive Device by depositing a number of layers of different optical transparent materials forming an optical filter for creating said integrated wavelength monitor device.
    [8" id="US-20010007501-A1-CLM-00008] 8. The device according to
    claim 6 , wherein said interference filter is separately fabricated from a number of layers of different optical transparent materials forming the filter, which is subsequently bonded to said Position Sensitive Detector to thereby create said integrated wavelength monitor device.
    [9" id="US-20010007501-A1-CLM-00009] 9. The device according to
    claim 6 , wherein a low thermal expansion material is used as a spacing layer in said interference filter to minimize temperature dependence.
    [10" id="US-20010007501-A1-CLM-00010] 10. The device according to
    claim 6 , wherein a wavelength controller is formed by means of utilizing output signals derived from said Position Sensitive Detector for controlling the wavelength of a laser light emitter.
    类似技术:
    公开号 | 公开日 | 专利标题
    US6639679B2|2003-10-28|Integrated wavelength monitor
    EP1156563B1|2009-12-02|Laser wavelength stabilisation system for optical commmunication
    US7120176B2|2006-10-10|Wavelength reference apparatus and method
    JP2009522805A|2009-06-11|Monitor photodetector for integrated photonic devices
    US6678432B2|2004-01-13|Optical integrated device, semiconductor laser module and optical transmitter
    US20030173505A1|2003-09-18|Multiple phase wavelength locker
    US6937628B2|2005-08-30|Optical transmitter modules
    US20040022282A1|2004-02-05|Arrangement for monitoring the emission wavelength and power of an optical source
    US20050094685A1|2005-05-05|Simple and compact laser wavelength locker
    JP3848220B2|2006-11-22|Wavelength-fixed integrated light source structure using micro multi-resonator
    US6885462B2|2005-04-26|Wavelength monitoring device and method of tunable laser sources
    US6836490B2|2004-12-28|Optical module
    US7289544B2|2007-10-30|Optical module
    KR100343310B1|2002-07-15|Wavelength-stabilized Laser Diode
    EP1309049A1|2003-05-07|Wavelength sensitive device for wavelength stabilisation
    JP2004095920A|2004-03-25|Semiconductor laser device, its manufacturing method and semiconductor laser module
    JP2003163411A|2003-06-06|Variable wavelength laser module
    KR100282611B1|2001-02-15|Photodetector for wavelength stabilization device and active wavelength measurement device and manufacturing method of the photodetector
    JP2003069142A|2003-03-07|Wavelength monitor, optical module and optical communication system
    KR100593994B1|2006-06-30|Integrated optical device
    JP2004064011A|2004-02-26|Luminance module
    KR20010004403A|2001-01-15|Intergrated optic wavelength monitoring device
    同族专利:
    公开号 | 公开日
    AU2720901A|2001-07-24|
    SE0000041L|2001-07-11|
    EP1269586A1|2003-01-02|
    JP2003520439A|2003-07-02|
    CN1404640A|2003-03-19|
    TW484269B|2002-04-21|
    EP1269586B1|2004-09-08|
    DE60105403T2|2005-09-29|
    SE517341C2|2002-05-28|
    DE60105403D1|2004-10-14|
    AT275764T|2004-09-15|
    SE0000041D0|2000-01-10|
    CN1178342C|2004-12-01|
    WO2001052369A1|2001-07-19|
    US6639679B2|2003-10-28|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    US6186937B1|1999-07-30|2001-02-13|Lucent Technologies, Inc.|Method and device for obtaining a desired phase of optical characteristic of a fabry-perot etalon|US20030108071A1|2001-12-11|2003-06-12|Altitun Ab|Method and apparatus for laser wavelength stabilization|
    US20060039009A1|2004-08-23|2006-02-23|Palo Alto Research Center Incorporated|Chip-size wavelength detector|
    US7038782B2|2001-12-11|2006-05-02|Adc Telecommunications, Inc.|Robust wavelength locker for control of laser wavelength|
    US7075656B2|2001-12-11|2006-07-11|Adc Telecommunications, Inc.|Method and algorithm for continuous wavelength locking|
    US20090220189A1|2005-12-22|2009-09-03|Palo Alto Research Center Incorporated|Transmitting Light with Lateral Variation|
    US11125612B2|2017-09-13|2021-09-21|Kaneka Corporation|Photoelectric conversion element and photoelectric conversion device|US4938550A|1987-02-03|1990-07-03|Fujitsu Limited|Holographic deflection device|
    DE3885134D1|1987-03-30|1993-12-02|Siemens Ag|Arrangement for controlling or regulating an emission wavelength and emitted power of a semiconductor laser.|
    JP2840709B2|1989-12-28|1998-12-24|京セラ株式会社|Integrated semiconductor laser|
    JPH05275731A|1992-03-25|1993-10-22|Sharp Corp|Photodiode|
    AT396841B|1992-04-02|1993-12-27|Rsf Elektronik Gmbh|ARRANGEMENT FOR STABILIZING THE WAVELENGTH OF THE LIGHT BEAM AND LASER INTERFEROMETER DELIVERED BY A LASER DIODE|
    WO1995020144A1|1994-01-20|1995-07-27|British Telecommunications Public Limited Company|Optical wavelength sensor|
    JPH07226524A|1994-02-10|1995-08-22|Olympus Optical Co Ltd|Photoelectric conversion device|
    US5825792A|1996-07-11|1998-10-20|Northern Telecom Limited|Wavelength monitoring and control assembly for WDM optical transmission systems|
    JP3745097B2|1997-10-14|2006-02-15|富士通株式会社|Optical device for wavelength monitoring and wavelength control|US6864980B2|2002-01-22|2005-03-08|Digital Optics Corp.|Linear filter based wavelength locking optical sub-assembly and associated methods|
    JP4467571B2|2003-09-19|2010-05-26|アプライドマテリアルズインコーポレイテッド|Apparatus and method for detecting an electroless deposition endpoint|
    US7522786B2|2005-12-22|2009-04-21|Palo Alto Research Center Incorporated|Transmitting light with photon energy information|
    US7433552B2|2005-12-22|2008-10-07|Palo Alto Research Center Incorporated|Obtaining analyte information|
    US7315667B2|2005-12-22|2008-01-01|Palo Alto Research Center Incorporated|Propagating light to be sensed|
    US7718948B2|2006-12-04|2010-05-18|Palo Alto Research Center Incorporated|Monitoring light pulses|
    US8821799B2|2007-01-26|2014-09-02|Palo Alto Research Center Incorporated|Method and system implementing spatially modulated excitation or emission for particle characterization with enhanced sensitivity|
    US9164037B2|2007-01-26|2015-10-20|Palo Alto Research Center Incorporated|Method and system for evaluation of signals received from spatially modulated excitation and emission to accurately determine particle positions and distances|
    US7817281B2|2007-02-05|2010-10-19|Palo Alto Research Center Incorporated|Tuning optical cavities|
    US7852490B2|2007-02-05|2010-12-14|Palo Alto Research Center Incorporated|Implanting optical cavity structures|
    US7633629B2|2007-02-05|2009-12-15|Palo Alto Research Center Incorporated|Tuning optical cavities|
    US7936463B2|2007-02-05|2011-05-03|Palo Alto Research Center Incorporated|Containing analyte in optical cavity structures|
    US7554673B2|2007-02-05|2009-06-30|Palo Alto Research Center Incorporated|Obtaining information about analytes using optical cavity output light|
    US7817276B2|2007-02-05|2010-10-19|Palo Alto Research Center Incorporated|Distinguishing objects|
    US7471399B2|2007-02-05|2008-12-30|Palo Alto Research Center Incorporated|Photosensing optical cavity output light|
    US8320983B2|2007-12-17|2012-11-27|Palo Alto Research Center Incorporated|Controlling transfer of objects affecting optical characteristics|
    US8629981B2|2008-02-01|2014-01-14|Palo Alto Research Center Incorporated|Analyzers with time variation based on color-coded spatial modulation|
    US8373860B2|2008-02-01|2013-02-12|Palo Alto Research Center Incorporated|Transmitting/reflecting emanating light with time variation|
    US8723140B2|2011-08-09|2014-05-13|Palo Alto Research Center Incorporated|Particle analyzer with spatial modulation and long lifetime bioprobes|
    US9029800B2|2011-08-09|2015-05-12|Palo Alto Research Center Incorporated|Compact analyzer with spatial modulation and multiple intensity modulated excitation sources|
    DE102019210950A1|2019-07-24|2021-01-28|Robert Bosch Gmbh|LIDAR sensor for optical detection of a field of view and method for optical detection of a field of view|
    DE102020202824A1|2020-03-05|2021-09-09|OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung|SENSOR DEVICE USING THE ANGLE DEPENDENCE OF A DICHROITIC FILTER|
    法律状态:
    2001-01-09| AS| Assignment|Owner name: TELEFONAKTIEBOLAGET LM ERICSSON, SWEDEN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:FROJDH, KRISTER;REEL/FRAME:011434/0106 Effective date: 20001212 |
    2003-10-09| STCF| Information on status: patent grant|Free format text: PATENTED CASE |
    2007-04-30| FPAY| Fee payment|Year of fee payment: 4 |
    2011-04-28| FPAY| Fee payment|Year of fee payment: 8 |
    2015-04-28| FPAY| Fee payment|Year of fee payment: 12 |
    优先权:
    申请号 | 申请日 | 专利标题
    SE0000041||2000-01-10||
    SE0000041-4||2000-01-10||
    SE0000041A|SE517341C2|2000-01-10|2000-01-10|Integrated wavelength monitor for laser light|
    [返回顶部]