• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    1. Method for inspecting a transparent material sheet, especially sheet glass, for defects, such as foreign bodies or gas bubbles, trapped in the sheet, in which the material sheet is scanned across its width using a flying light spot and the light that passes through the sheet and/or is reflected is detected, converted into electrical signals and evaluated, characterised in that, during the scanning cycle, the light emerging laterally from the material sheet is additionally detected and converted into an electrical signal, the components of this signal that originate from trapped defects appearing in the form of electrical impulses, and that these impulses are used for evaluation.
    公开号:SU1276268A3
    申请号:SU823467495
    申请日:1982-07-28
    公开日:1986-12-07
    发明作者:Хаубольд Вольфганг；Фарвик Герхард
    申请人:Фельдмюле Аг (Фирма)；
    IPC主号:
    专利说明:

    It is suggested to additionally register the reliability of the control, which registers the beam emerging from the end of the strip during the scanning process, to convert its intensity into electrical pulses, the magnitude of which should be used for estimation. An apparatus for carrying out the method comprises a scanning unit 2, photodetectors 5 and 6, which receive the reflected and / or transmitted light and an evaluation unit 7. New is the introduction of at least one additional photomultiplier 8 located at the end surface of the strip 1 at the line level scanning probe ray. 2 sec. f-ly and 9 zp f-ly, 5 ill.
    The invention relates to a method and device for controlling a strip of transparent material, in particular sheet glass, for defects such as foreign bodies or gas bubbles. The aim of the invention is to increase the reliability of control by identifying defects that do not lead to surface deformation of the material, in particular gas bubbles located approximately in the center of the strip of material, such that they are covered with thicker layers than the material. If there are inclusions in the glass ribbon in the form of an internal bubble or a small cam, the top-down light beam is deflected in the internal bubble or on the surface of a pebble and is directed further into the material. The material itself acts in this case as a light guide. Since, as internal bubbles, i.e. gas bubbles, as well as the inclusion of pebbles, are generally spherical in shape, the light beam caught in them or penetrated into them reflects at least once a parallel scanning line of the material and in this way hits the right or left edge of the material strip, where it it appears as a brief, bright light point. Usually, sheet glass has, due to the presence of small traces of iron in the glass melt, a slightly greenish color, which is visible only when viewing sheet glass from the end. Due to the fact that the light beam must pass a relatively long way in the glass until its appearance sideways, this glass acts as a color filter, i.e. if in the presence of a green color, red light strikes the glass, then after passing a certain part of the way in the glass, it disappears under the filter's action, in other words, it is filtered out. Light with a wavelength corresponding to the color of the glass is not filtered out, but undergoes only normal absorption and therefore reaches the side surfaces with slight losses. The use of an emitter emitting light of the same color as the strip of material being monitored makes it possible to choose a radiator of lesser power and thereby reduce the cost of energy and materials, but at the same time achieve the optimal effect. All transparent materials absorb a known part of the light passing through them, i.e. in the presence of relative. wide strips of sheet glass, the width of which often exceeds 3 m, with the appearance of an internal bubble, i.e. gas bubble in the center of the tape, the light reflected from it ,. It must travel about 1.5 m to one of two sides before it is caught by a photoelectric converter, in particular, a photomultiplier tube. As a consequence, a significant absorption of light occurs, i.e. without additional amplification of the impulse sent by the photomultiplier, it is impossible to accurately judge the already detected defect. On the other hand, when the light beam moves towards the edge of the material strip, the error signal becomes more distinct, including when the size of the detected defect remains unchanged and its location in the strip is identical to the location of the defect detected in the center of the strip. In addition, the strip of material is controlled, i.e. Floating glass is never 100% clean. This means that there can be dust particles on both the upper side and the lower side, which can also reflect: a ray in the glass. Thus, a known noise level is constantly observed, and this noise level changes, i.e. when scanning at the center of the strip, it is significantly less than when scanning at the edge of the strip, so that defects at the center of the strip can be within the noise level observed at the edge of the strip. It is important to differentiate, suppress the noise level and take into account absorption from the transparent side material so that a uniform and equal in size defect at the edge gives the same electrical signals as the corresponding defect in the center of the strip of material. Therefore, each electric pulse corresponding to the intensity of the beam emerging from the end face is compared with a reference value corresponding to the instantaneous position of the light beam, and if this value is exceeded, it is judged that there are defects. The reference value is entered into the drive. This form of implementation is recommended when only one material is tested, for example, one kind of glass, so that the strip of material does not change due to its composition and thickness. In this case, it is enough to register once the reference absorption curve of the material and enter it into the drive. The term electronic drives refers to semiconductor memory devices that differ depending on the circuitry used. In addition to the shift registers, fixed and operative drives or programmable drives can be used. Programmable drives are permanent drives that, depending on the process, have the required configuration in binary code, which, for example, can be performed by burning out certain connections in a semiconductor circuit. This programming cannot be returned to the outgoing state, i.e. after the start-up of the accumulator, it is impossible to change the information entered once and thus it is impossible and undesirable to change its state. As the second possibility of controlling the accumulators, the capacitance of highly insulated gating electrodes is used, which, as a result of ultraviolet irradiation, discharges and, after repeated reapplication of the correspondingly high voltage, recharges, i.e. can be programmed. In the evaluation unit's logic unit, an electric pulse corresponding to the intensity of the beam emerging from the butt is compared with a reference value corresponding to the instantaneous position of the light beam, and judging the presence of defects by the value exceeded. In this case, you can use several software drives corresponding to different curves, i.e. various material bands can be checked by preselecting the appropriate storage device. In this case, it is advisable to use operative drives that can be programmed as a drive. The introduction of the reference tape provides a constant obtaining of exact values, since an identical quantity of material is used as the reference tape. The evaluation of the pulses is carried out by means of a trigger threshold. For this reference absorption curve, it is entered into a software drive. When using this method, absolute speed independence is achieved, moreover, it does not allow oscillations. The use of several software drives makes it possible to program the testing of shredded glasses. The additional location of a single photomultiplier tube along the monitored strip of a transparent material allows the detection of internal bubbles. In this case, the photomultiplier tube is located at the level of the scanning line to the light rays of the material surface, since the light beam falling on the glass strip is reflected in different directions, the segment parallel to the scanning line is the shortest line, from which point the light beam goes in the area of the edge of the material, the area of the scan line has the highest luminance value and thus gives the strongest and most visible signal. Light directed by an internal bubble or inclusion in a material comes out on the raw edge of a strip of material and is scattered here. It goes both sideways and up and down so that its interception when the photomultiplier is located only to the side is coupled with difficult ones. Thanks to a simple the location of the mirror surface under the longitudinal edge of a large part of the light energy emerging from the untreated end of a strip of material falls on a mirror and is reflected on the photoelectronic located above the strip of material a person who additionally receives light, exit directly upwards. As a result, it means (light interception is improved globally. By making notches on the reference tape, the number of signals corresponds to the number of notches. Each signal has its own value depending on the distance to the center of the strip of material, since as it approaches the end of the reference tape, t i.e., to its narrow side, less light is absorbed, and thus a stronger signal arrives at the photomultiplier tube.This signal can be simultaneously used at the same distance from one another to determine the location of defects, with an interval of 5-10 mm, allows to achieve a high degree of accuracy in the detection of defects. The matted strip along the standard tape is a surface formed as a result of post-treatment, or a transparent adhesive tape, applied to the reference tape. Both the surface of the sandblasting process and the transparency on the adhesive tape located under the reference tape allow light to enter the reference tape and thereby transfer to the ends and get into the photo oelectron68 multiplier. In contrast to the previously considered notches, no current signal is generated in the converter, and when the light beam hits the reference tape a certain voltage appears, the magnitude of which varies. This voltage is lowest when the light beam reaches the center of the reference tape, where the strongest absorption occurs. For this reason, photomultipliers are also installed on both sides of the reference tape, since only a little light energy reaches from one edge of the tape to the other. The characteristic curve of the multipliers thus originates for each of both multipliers in the center of the strip of material and has a value that is slightly larger than zero and then increases as the light beam approaches the edge of the strip. In order to estimate the total bandwidth, one should take into account the results obtained from both photomultiplier tubes, as a result of which a full characteristic curve is created. FIG. 1 is a block diagram of the device; FIG. 2 shows a device with a reference tape in FIG. 3 - the location of the mirror surface under the longitudinal edge of the strip} in figure 4: the individual signals from the side photomultipliers in the form of a characteristic curve; in fig. 5 is a curve with an error signal resulting from a counter-polarity of the curve. The strip of material I moves under the scanning unit 2 by means of the rollers 3 driven by the electric motor 4. The scanning unit 2 includes a photodetector 5 for reflected light and a photodetector 6 for transmitted light. Both photodetectors are connected to the evaluation unit 7, to which photomultipliers 8 and 9 are also connected, located on the side of the strip of material.1. The laser emitter 10, located in the scanning unit 2, has a beam divider I1 reflecting two beams 13 and 14 from a rotating circular mirror 12 12 as beam of light 15, beam 14 as light of beam 16 and due to rotation of the circular mirror 12 as a scanning beam 17 passes over the entire width of the strip of material 1. Beam 13, reflected as a dot 15, simultaneously passes over the reference tape 18 and through the notch 10 enters it. At the ends 20 of the reference tape 18, there is one photomultiplier 21 and 22 each, which receives the light coming out of the reference tape 18 and transfers it to the evaluation unit 7. If a defect appears in the strip of material 1 as an internal bubble, ka 23, then the scanning beam 17, like the reflected scanning beam 24, does not fall on the photodetector 5, is mainly retracted, as the light beam 25 and 26 passes along the line 27 scanning to the end surface of strip 28 of material 1, where it enters photomultipliers 8 and 9, which direct the received signal to evaluation unit 7. Photomultiplier tubes are connected to evaluation unit 7 by cable 29 or 30, photomultiplier tubes 21 and 22 are similar to cable 31 and 32. Electric line 33 passes between photoreceiver 5 and evaluation unit 7. If the scanning beam 17 hits the inner bubble 23, then the light deflects from the inner bubble 23 and comes out in the area of the end surface 28 of the strip of material 1. As the outgoing light is not detected, then installed horizontally at the edge of the strip of material 1 the mirror surface 35 and the vertically mounted mirror surface 36, both surfaces being mounted so that they direct the light incident on them to the photomultiplier 8 located above the edge of the strip of material. The partial beam 13 forms a light point 16 on the equilibrating round mirror 12. The reference beam 37 formed by it probes the reference tape 18 and enters it through the notches 19. Thus, through each notch 19 in the photomultiplier 21, a signal is produced, which is recorded in the evaluation unit and compared with the corresponding values determined using photomultiplier tubes 8 and 9. In the absence of 55 defects in the material band 1, the determined values are identical, i.e. no different from each other. Similar 1
    权利要求:
    Claims (11)
    [1]
    This method is characterized in that, in order to increase the reliability of control, a beam is additionally recorded outgoing from the end of the strip during the scanning process and its intensity is converted into electrical pulses, the magnitude of which is used in determining the presence of defects. 88, evaluation is performed using reference tape 18 having a matted strip or adhesive tape. At the same time, light, a passage along a frosted strip or adhesive tape, enters the reference tape 18 and leaves it at the ends 20, where it hits photomultipliers 21. Instead of a pulse, a voltage is generated here, changing to dees as the reference beam passes. This voltage can be represented as a characteristic curve. FIG. Figure 4 shows the absorption curve 38 passing through the peaks 39 of individual pulses generated by the reference beam 37 through the notches 1 9 in the reference belt 18. The absorption curve 40 shows the noise level 40. The noise level curve is the result of polluted glass above or below and has no meaning. However, it clearly shows that at the edges of the tape, the noise level is much higher, so that it is superimposed on defects that may occur in the center of the strip. FIG. 5 shows the counter-polarity of the absorption curve 38 obtained above the standard tape 18 with adhesive tape, with the probing curve 41 located above it. The sounding curve 41 has a fault signal 42, the absolute value of which is less than the value at the edge of the curve. The counter-polarity forms a counter-polarity curve 43, on which the error signal 42 clearly protrudes. Claim 1. Method of monitoring a strip of transparent material for defects, including scanning the strip across the width of the probing light beam. registration of transmitted and / or reflected from C-zeta rays, conversion of their intensities into electrical signals and determination of the presence of a defect by the signal values91
    [2]
    2. A method according to claim 1, characterized in that the scanning is carried out with a light beam of the same color as the strip being monitored.
    [3]
    3. A method according to PP, I and 2, that is, that the electric pulse corresponding to the intensity of the beam emerging from the end face is compared with the reference value corresponding to the instantaneous position of the light beam, and by exceeding this value defect comrade.
    [4]
    4. Method according to paragraphs. 1-3, characterized in that a control light beam is additionally formed from a gas probe probe, it scans a reference defect-free tape of the material, light is emitted from the end of the reference tape, its intensity is converted into an electrical impulse, and the presence of defects is compared by reference pulse with a pulse corresponding to the intensity of the light coming out of the end of the controlled band.
    [5]
    5. The device to monitor the bands of transparent material for defects, containing a strip scanning unit with a probing light beam and photodetectors located on the path of the reflected and / or passing through the strip of beams connected to the evaluation unit, in order to increase the reliability of control , it additionally contains at least one photomultiplier tube located at least at one end surface of the strip. 810
    [6]
    6. The device according to claim 5, wherein the photomultiplier tube is located at the level of the scanning line by the probing light beam of the material surface.
    [7]
    7. The device according to claim 5, characterized in that at least one mirror surface is additionally inserted in it, located under the longitudinal edge of the strip, and the photomultiplier tube optically coupled with it is located above the longitudinal edge.
    [8]
    8. The device according to PP. 5-7, characterized in that it additionally introduces a reference tape of non-defective material corresponding to a controlled strip in thickness, color and composition or identical to it, whose length is equal to the width of the strip, and photomultiplier tubes located at the ends of the tape.
    [9]
    9. A device according to claim 8, characterized in that the reference tape is provided with notches located at the same distance from each other in a parallel controlled strip.
    [10]
    10. A device according to claim 9, characterized in that the notches are located 5-10 mm apart from each other.
    [11]
    11. A device according to claim 8, characterized in that the reference tape is provided with a matted strip along the entire length. Priority points: 07/29/87 on PP. 1, 2, 5, 6 of 22.06.82 in paragraphs 3, 4, 7-11.
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    类似技术:
    公开号 | 公开日 | 专利标题
    US3652863A|1972-03-28|Detection of faults in transparent material using lasers
    US4750837A|1988-06-14|Fluorometer with reference light source
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    US4802768A|1989-02-07|Two light source reference system for a fluorometer
    US3814946A|1974-06-04|Method of detecting defects in transparent and semitransparent bodies
    US4004152A|1977-01-18|Apparatus for monitoring a moving web of material for faults
    US4874940A|1989-10-17|Method and apparatus for inspection of a transparent container
    SU1276268A3|1986-12-07|Method for checking transparent material strip for defects and device for effecting same
    US4536654A|1985-08-20|Device for detecting flaws on a piece
    US3779649A|1973-12-18|Method of and an electro-optical system for inspecting material
    US5157266A|1992-10-20|Method and device for testing transparent sheets
    US4707131A|1987-11-17|Optical arrangement for photometrical analysis measuring devices
    US4705957A|1987-11-10|Wire surface monitor
    US3804534A|1974-04-16|Detection of blemishes in a surface
    CA2384005A1|2001-03-15|Detection of inclusions in glass
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    JPS6488237A|1989-04-03|Surface inspecting apparatus
    JPS61149839A|1986-07-08|Testing device for fatigue
    US4097151A|1978-06-27|Method of and apparatus for locating B type and point type defects in a glass ribbon
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    SU1185193A1|1985-10-15|Method of measuring moisture content
    SU1296837A1|1987-03-15|Device for checking geometric dimensions and flaws of specimens with dissipating surfaces
    SU920369A2|1982-04-15|Touch-free meter of glass pane thickness
    SU1636739A1|1991-03-23|Device for fluorescent medium investigation
    同族专利:
    公开号 | 公开日
    AU8644782A|1983-02-03|
    DE3262426D1|1985-03-28|
    CS547682A2|1985-07-16|
    FI822637A0|1982-07-28|
    FI74148B|1987-08-31|
    FI74148C|1987-12-10|
    DD202470A5|1983-09-14|
    AU536514B2|1984-05-10|
    KR870001703B1|1987-09-24|
    DK334682A|1983-01-30|
    KR840000802A|1984-02-27|
    EP0071257B1|1985-02-20|
    EP0071257A1|1983-02-09|
    ES514466A0|1983-04-16|
    FI822637L|1983-01-30|
    CA1219933A|1987-03-31|
    CS241114B2|1986-03-13|
    ES8305929A1|1983-04-16|
    BR8204412A|1983-07-19|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    EA008773B1|2006-05-19|2007-08-31|Владимир Федорович Солинов|Method for detecting defects in sheet glass|GB1315654A|1969-05-21|1973-05-02|Pilkington Brothers Ltd|Detection of faults in transparent material using lasers|
    FR2187118A5|1972-05-30|1974-01-11|Saint Gobain Pont A Mousson|Testing glass sheet for defects - using a laser beam injected via the edge of the glass|
    US3871773A|1973-04-24|1975-03-18|Ppg Industries Inc|Method of and apparatus for detecting defects and the position thereof in transparent articles|
    FR2263509B1|1974-03-09|1981-04-10|Feldmuehle Anlagen Prod|EP0189551B1|1984-12-14|1988-10-26|Flachglas Aktiengesellschaft|Method and device for inspecting transparent strip material, in particular flat glass ribbons|
    DE3806385A1|1988-02-29|1989-09-07|Feldmuehle Ag|METHOD AND DEVICE FOR TESTING TRANSPARENT RAILS|
    US5724140A|1996-10-28|1998-03-03|Ford Motor Company|Method and apparatus for determining the quality of flat glass sheet|
    AU2011375401B2|2011-08-19|2015-12-24|Industries Machinex Inc.|Apparatus and method for inspecting matter and use thereof for sorting recyclable matter|
    CN107703094B|2017-09-27|2021-03-26|安徽中科光电色选机械有限公司|Near-infrared multispectral sorting equipment|
    法律状态:
    优先权:
    申请号 | 申请日 | 专利标题
    DE3129808A|DE3129808C2|1981-07-29|1981-07-29|Method for testing transparent material webs|
    DE19823223215|DE3223215A1|1982-06-22|1982-06-22|Method and device for testing transparent material webs|
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