Lighting Test and Repair Device for Plasma Display Panel

专利摘要:
PURPOSE: A lighting test and repair apparatus is provided to minimize damages of dielectric layer and MgO layer and achieve improved stability of display panel. CONSTITUTION: A lighting test and repair apparatus comprises a lighting tester(10) mounted with a panel to be tested, wherein the lighting tester performs a lighting test when a power is applied; a laser unit(40) for repairing flickering cells by scanning a laser beam having a spot of 10 to 20μm on the panel mounted on the lighting tester by using a galvanometer; a convey unit(20) for guiding the laser unit toward the flickering cells by conveying the laser unit in a three-axis direction; and an enlargement and display unit mounted on the head of the laser unit, and which enlarges and displays the part being repaired.
公开号:KR20030086686A
申请号:KR1020020024807
申请日:2002-05-06
公开日:2003-11-12
发明作者:정재훈；박임배；변인섭；서정근；노철래
申请人:삼성에스디아이 주식회사；
IPC主号:

专利说明:

Lighting Test and Repair Device for Plasma Display Panel
[8] The present invention relates to a lighting inspection and repair apparatus for a plasma display panel, and more particularly, to minimize the thermal loss after the repair process, thereby minimizing the effects on adjacent cells and damage to dielectrics, thereby ensuring stability of the plasma display panel. The present invention relates to a plasma display panel lighting inspection and repair apparatus which performs repair using a laser while watching an abnormal discharge cell through an image magnifier while the lighting inspection is performed.
[9] In general, there is a lighting test process that checks for abnormality of a cell while it is turned on during a manufacturing process of a plasma display panel (PDP; Plasma Display Panel). Defective spots) are often found.
[10] If a defect is found in the lighting inspection process as described above, the operator checks the position of the blinking point while the panel is mounted on the lighting inspection device and displays it.The lighting inspection device is turned off and the panel is transferred to the repair device. After performing the repair on, the transfer to the lighting inspection device again to check the repair result through the process of darkening the dark spots to perform a repair.
[11] The conventional repair apparatus has a large spot size of the laser beam used for repair processing, which is likely to damage adjacent cells and films located on the rear surface of the processing.
[12] In the prior art, the lighting inspection apparatus checks and displays the dark spot, repairs the repair apparatus, and then repairs the lighting inspection apparatus. It takes time and a decrease in productivity occurs.
[13] In addition, it is impossible to check the dark spot by lighting on the panel in the repair device, and the dark spot can be confirmed only in the lighting inspection device. Therefore, the repair is performed by the operator's confirmation and indication, which reduces the accuracy of the repair and improves the quality. The deviation is very severe and there is a high possibility that the repair of the good parts adjacent to the dark spots is performed and the quality is largely damaged.
[14] SUMMARY OF THE INVENTION An object of the present invention is to solve the above problems, while minimizing thermal loss since repairing is performed using a laser beam having a fine spot of 10 to 20 μm while confirming the position of the dark spot while the panel is turned on. It is to provide a lighting test and repair device for a plasma display panel that can minimize the effects on adjacent cells and damage to dielectrics, secure stability of the plasma display panel, and perform repair processing with improved accuracy. .
[1] 1 is a block diagram schematically showing an embodiment of a lighting test and repair apparatus for a plasma display panel according to the present invention.
[2] 2 is a perspective view schematically showing an embodiment of a lighting test and repair apparatus for a plasma display panel according to the present invention.
[3] 3 is a conceptual diagram schematically showing the configuration of a laser device in one embodiment of a lighting inspection and repair apparatus for a plasma display panel according to the present invention.
[4] Figure 4 is a perspective view schematically showing the configuration of a laser device in an embodiment of a lighting inspection and repair apparatus for a plasma display panel according to the present invention.
[5] 5 is a partially enlarged cross-sectional view illustrating a state in which a repair process is performed on a panel by using an embodiment of a lighting test and repair apparatus for a plasma display panel according to the present invention.
[6] 6 is a partially enlarged plan view of a panel for explaining a repair processing region of the panel.
[7] 7 is a partially enlarged cross-sectional view illustrating a state in which a repair process is performed on a panel by using an embodiment of a lighting test and repair apparatus for a plasma display panel according to the present invention.
[15] The lighting test and repair device for a plasma display panel proposed by the present invention includes a lighting tester for mounting a panel to be inspected and applying a power supply to perform a lighting test, and a panel having a size of 10 to 20 μm in the panel mounted to the lighting tester. A laser device that performs a repair on a dark spot cell by scanning a laser beam having a spot with a galvanometer with precise control, and transfers the laser device in three axes to perform repair. It includes a transfer device for guiding to the position of the dark cell to be enlarged, and an enlarged display device mounted on the head portion of the laser device to enlarge the portion to perform a repair.
[16] The laser device includes a laser generating unit for generating a laser beam, a plurality of mirror units for changing a path of a laser beam generated by the laser generating unit, and a mirror as described above. A beam enlarger disposed between the sections and extending the laser beam generated by the laser generation section, and a laser beam extended from the beam enlargement section and guided through the mirror section and incident; A galvanometer for guiding the scan with a rate and the like, and a scan lens for guiding the laser beam guided through the galvanometer to be irradiated onto the object with a fine spot of 10 to 20 μm. .
[17] In addition, it is preferable that the laser device be equipped with a distance measuring sensor so as to secure a depth of focus of the scan lens.
[18] The enlarged display device is formed by using an optical system, and is configured to check a processing surface at various magnifications.
[19] Next, a preferred embodiment of a lighting inspection and repair apparatus for a plasma display panel according to the present invention will be described in detail with reference to the drawings.
[20] First, an embodiment of a lighting test and repair apparatus for a plasma display panel according to the present invention is a lighting tester for mounting a panel 2 to be inspected and applying a power to perform a lighting test as shown in FIGS. 1 to 4. (10) and a laser beam having a fine spot of 10 to 20 탆 on the panel 2 mounted on the lighting tester 10 described above with a galvanometer 46 while being precisely controlled and scanned on the flicker cell. A laser device 40 for performing a repair, a transport device 20 for guiding the laser device 40 in three axes, and guiding to a position of a dark cell for repairing, and the laser device ( And an enlarged display device 30 mounted on the head of 40 to enlarge and show a repaired portion.
[21] Since the lighting tester 10 can be generally implemented by using a device used for the lighting test of the plasma display panel, detailed description thereof will be omitted.
[22] 3 and 4, the laser device 40 is made of a DPSS method and generates a laser beam, and the laser beam generated by the laser generator 42 A plurality of mirror portions 43 for changing paths, a beam expanding portion 44 provided between the mirror portions 43 and extending the laser beam generated by the laser generation portion 42, and A galvanometer 46 which extends from the beam expanding unit 44 and guides the laser beam that is guided through the mirror unit 43 to be incident with a predetermined shape, speed and overlap ratio, and the like; It includes a scan lens 48 for guiding the laser beam guided through the galvanometer 46 to be irradiated to the object having a fine spot of 10 to 20㎛.
[23] It is also possible to provide an aperture 45 between the galvanometer 46 and the mirror portion 43 as necessary.
[24] Although not shown in the drawings, the laser device 40 may be equipped with a distance measuring sensor so that the depth of field (DOF) of the scan lens 48 can be secured.
[25] Since the enlarged display device 30 can be generally implemented using an optical system used for magnifying and observing a specific portion in a measuring device or an inspection device, a detailed description thereof will be omitted. It is preferable that the enlarged display device 30 is configured so that the repaired surface to be repaired can be checked at various magnifications.
[26] As shown in FIG. 2, the transfer device 20 is configured to move the laser device 40 three-dimensionally on the X-axis, Y-axis, and Z-axis, and generally includes an LM guide or the like mainly used in an automation device. It is possible to perform using.
[27] The transfer device 20 is a pair of vertically installed in the base frame 21 and the base frame 21 at a predetermined interval (interval corresponding to the X-axis movement distance of the laser device 40). X-axis direction (left and right in Fig. 2) in the support 25, the horizontal support 23 is installed across the upper portion of the vertical support 25, and the horizontal support 23 and the base frame 21, respectively Direction) and a vertical column supported by a pair of X-axis guides 22 installed in a pair of X-axis guides 22 and the pair of X-axis guides 24 which are slidably coupled to the pair of X-axis guides 22, respectively. 26), the Y-axis guide 27 is installed in the vertical column 26 in the Y-axis direction (up and down direction in Figure 2), and the Y-axis guide 27 is coupled to the sliding movement so as to be possible A sliding movement in the Z-axis direction (front and rear direction in Figure 2) is coupled to the shaft movable table 28, and at one end of the laser device ( 40) comprises a Z-axis guide 29 is installed.
[28] The conveying apparatus 20 controls the operation of the X-axis moving table 24 and the Y-axis moving table 28 by using hydraulic pressure (or pneumatic) or a motor. It is made to precisely control the position of the.
[29] Next, a method of operating the lighting inspection and repair apparatus for a plasma display panel according to the present invention configured as described above will be described.
[30] First, when the panel 2 is mounted on the lighting tester 10 and the lighting switch (not shown) is turned on, the panel 2 emits light as a whole, and the operator blinks abnormally. A lighting test is performed to check whether there are defective cells (spot cells).
[31] If it is confirmed in the lighting test that there is a flickering cell, the X-axis moving table 24 and the Y-axis moving table 28 of the transfer device 20 are operated to operate the laser device 40 of the flickering cell. After moving to a position, confirm the exact position of the fleck cell through the enlarged display device 30 installed in the laser device 40, and place the laser device 40 in the exact location of the flicker cell, In the galvanometer 46 of the laser device 40, a region (indicated by R in FIG. 6) for scanning a laser beam is set in order to repair the dark spot cell.
[32] In the above state, as shown in FIG. 5, the laser beam L scanned from the laser device 40 is scanned in the set area to perform repair processing for enlarging the ITO interval S. FIG. At this time, the scanning area is controlled to scan the laser beam L according to the set area through the galvanometer 46 of the laser device 40. As the laser beam L is scanned and scanned, repair processing is normally performed. It is checked through the enlarged display device 30 as described above. That is, since the repair process is performed while the panel 2 mounted on the lighting checker 10 is turned on, it is possible to determine whether the repair process is normally performed depending on whether the dark spot cell is darkened.
[33] In general, the ITO interval S performs repair in the plasma display panel at intervals between the neighboring ITO electrodes 5, so that the laser beam L is scanned on a portion of the ITO electrode 5 to electrically repair the ITO. This means that the cell is darkened when a steady voltage is applied by modifying the property to lose conductivity. At this time, it is necessary to take care that a part of the laser beam L irradiated penetrates the ITO electrode 5 and does not damage the dielectric layer 6, the MgO layer 9, and the partition wall 7 of the rear panel 4. have. In this embodiment, the laser beam L having a wavelength of 523 nm is used to accurately repair only the set area, and the size of the scanned spot is controlled to be maintained in the range of 10 to 20 µm.
[34] When repairing is performed as described above, the ITO interval S is enlarged as shown in FIG.
[35] 5 to 7, reference numeral 1 denotes glass, reference numeral 3 denotes a front panel, reference numeral 4 denotes a rear panel, and reference numeral 8 denotes an address electrode.
[36] In the above description, the lighting tester 10 is installed vertically, and the laser device 40 is installed to scan the vertical plane. However, the present invention is not limited thereto, and the lighting tester 10 is installed horizontally. It is also possible to implement such a configuration that the laser device 40 is installed to scan the horizontal plane. In addition, the panel 2 mounted on the lighting tester 10 may be configured to perform inspection and repair by separately irradiating light from the opposite side of the laser device 40 without directly lighting the panel 2 mounted on the lighting tester 10.
[37] In addition, the lighting inspection and repair apparatus for a plasma display panel according to the present invention may be configured to inspect a cell for defects and perform repair in a state in which a driving board (not shown) is coupled to the panel 2.
[38] In the above, a preferred embodiment of the lighting inspection and repair apparatus for a plasma display panel according to the present invention has been described, but the present invention is not limited thereto, and various modifications are made within the scope of the claims and the detailed description of the invention and the accompanying drawings. It is possible to implement, and this also belongs to the scope of the present invention.
[39] According to the lighting inspection and repair apparatus for a plasma display panel according to the present invention made as described above, since the repair processing is performed using a laser beam having a wavelength of 523 nm and the spot size is controlled in the range of 10 to 20 ㎛, It is possible to minimize damage to the dielectric layer and the MgO layer. In addition, it is possible to precisely control the scan area of the laser beam by using a galvanometer and to perform repair processing by checking the exact position of the dark spot cell through the enlarged display device, thereby minimizing the influence on the adjacent cells. . Therefore, the stability of the plasma display panel can be secured.
[40] In addition, according to the lighting test and repair apparatus for the plasma display panel according to the present invention, since the repair processing can be performed while the panel is mounted on the lighting tester, the repair processing is performed after the lighting test is performed, and the lighting test is performed again. Compared to the conventional one, the work process is simple and the productivity is greatly improved.
[41] In addition, according to the lighting inspection and repair apparatus for the plasma display panel according to the present invention, the lighting inspection and repair processing is possible not only before the driving board is mounted on the panel but also after the driving board is coupled to the panel, so that the yield rate and quality of the final product This is improved.

权利要求:
Claims (3)
[1" claim-type="Currently amended] A lighting tester equipped with a panel to be inspected and configured to perform a lighting test by applying power;
A laser device for performing a repair on a dark spot cell by scanning a laser beam having a fine spot of 10 to 20 μm on the panel mounted to the lighting tester while precisely controlling the galvanometer using a galvanometer;
A conveying apparatus for conveying the laser apparatus in three axial directions to guide the position of a dark cell for repair; And
An enlarged display device mounted on the head of the laser device to enlarge a portion for repairing.
Lighting inspection and repair device for a plasma display panel comprising a.
[2" claim-type="Currently amended] The method of claim 1,
The laser device described above,
A laser generator for generating a laser beam by using a DPSS method;
A plurality of mirrors for changing a path of a laser beam generated by the laser generator;
A beam expanding unit installed between the mirror units and extending the laser beam generated by the laser generating unit;
A galvanometer that extends from the beam enlarger and guides the laser beam that is guided through the mirror to be incident with a predetermined shape, speed, and overlap rate; And
A scanning lens for guiding the laser beam guided through the galvanometer to be irradiated to the object with a fine spot of 10 to 20 μm.
Lighting inspection and repair device for a plasma display panel comprising a.
[3" claim-type="Currently amended] The method of claim 1,
The above transfer device,
A base frame;
A pair of vertical supports installed on the base frame at predetermined intervals;
A horizontal support installed across the upper portion of the vertical support;
A pair of X-axis guides installed in the X-axis direction on the horizontal support and the base frame, respectively;
A vertical column supported by a pair of X-axis moving tables that are slidably coupled to the pair of X-axis guides, respectively;
A Y-axis guide installed in the Y-axis direction on the vertical column; And
Z-axis guide which is slidably coupled in the Z-axis direction to the Y-axis guide that is slidably coupled to the Y-axis guide, and one end of the Z-axis guide is installed
Lighting inspection and repair device for a plasma display panel comprising a.

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同族专利:

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公开号 | 公开日

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KR100450194B1|2004-09-24|

引用文献:

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公开号 | 申请日 | 公开日 | 申请人 | 专利标题

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法律状态:
2002-05-06|Application filed by 삼성에스디아이 주식회사

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2002-05-06|Priority to KR20020024807A

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2003-11-12|Publication of KR20030086686A

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2004-09-24|Application granted

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2004-09-24|Publication of KR100450194B1

优先权:

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申请号 | 申请日 | 专利标题

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KR20020024807A|KR100450194B1|2002-05-06|2002-05-06|Lighting Test and Repair Device for Plasma Display Panel|