• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    end. TECHNICAL FIELD The present invention relates to an electronic device, and more particularly, to a failure diagnosis apparatus capable of easily diagnosing a failure of each device inside an electronic device. I. The technical problem to be solved by the present invention: conventionally it takes a relatively long time to disassemble all the structures inside the device to find the fault of the electronic device, there was a complicated process. All. SUMMARY OF THE INVENTION The present invention relates to a failure diagnosis apparatus in an electronic device; Located in the outer case of the electronic device and provided with a plurality of test ports, each of the test ports are connected to the power port of the respective internal devices to enable the operator to diagnose the failure of each device from the outside of the device It is characterized by consisting of fault diagnosis connection board. la. Important use of the invention: Applied to electronic devices.
    公开号:KR19990040188A
    申请号:KR1019970060511
    申请日:1997-11-17
    公开日:1999-06-05
    发明作者:이종래
    申请人:윤종용；삼성전자 주식회사；
    IPC主号:
    专利说明:

    Fault diagnosis device in electronic equipment
    The present invention relates to an electronic device, and more particularly, to a failure diagnosis apparatus capable of easily diagnosing a failure of each device inside the electronic device.
    In general, when a fault occurs in the electronic device and a repair is required, the structure of the device itself is disassembled, and a test device is connected to each accessory device therein to check and repair the fault.
    However, the above-described conventional method takes a relatively long time by disassembling all the structures inside the device to find the failure part, and the process has a complicated problem.
    Accordingly, an object of the present invention is to provide a fault diagnosis connection board device having a plurality of test ports for easily diagnosing faults in respective parts of an electronic device.
    The present invention for achieving the above object is a failure diagnosis apparatus in the electronic device; Located in the outer case of the electronic device is provided with a plurality of test ports, each of the test ports are connected to the power port of the respective devices inside the device to allow the operator to diagnose the failure of each device from the outside of the device It is characterized by consisting of fault diagnosis connection board.
    1 is a schematic diagram of a failure diagnosis apparatus in an electronic device according to an embodiment of the present invention.
    Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the following description of the present invention, if it is determined that a detailed description of a related known function or configuration may unnecessarily obscure the subject matter of the present invention, the detailed description thereof will be omitted.
    First, a facsimile will be described as an example to explain the present invention.
    1 is a schematic diagram of a failure diagnosis apparatus in a fax according to an embodiment of the present invention. Referring to FIG. 1, first, each sub-device of the apparatus includes a main board 100 that is in charge of operating the system, and a line interface that forms a trunk line and a call path that are introduced under the control of the main board 100. A unit (LIU: Line Interface Unit, hereinafter referred to as a line interface unit) 110, and a power supply unit 120 for supplying operating power to the main board 100 and the line interface unit 110. In addition, a plurality of test failure diagnosis connection boards 130 for connecting the power ports P1 to P9 of the respective devices 100, 110, and 120 are mounted on an external case of the device. At this time, the measurement pointers of the sub-devices and the failure diagnosis connection port 130 are connected using a harness or a flat cable. In addition, the test ports in the troubleshooting connection board 130 are spaced apart to facilitate connection of probes / tips of a test apparatus (oscilloscope, multi tester).
    Therefore, when a failure occurs in the device, the operator may use a probe / tip of an external test device (oscilloscope, multi tester) at a plurality of test ports in the failure diagnosis access board 130 mounted on the external case. Check the fault status of each part device by connecting them sequentially.
    Meanwhile, in the detailed description of the present invention, specific embodiments have been described, but various modifications may be made without departing from the scope of the present invention. Therefore, the scope of the present invention should not be limited to the described embodiments, but should be defined not only by the scope of the following claims, but also by those equivalent to the scope of the claims.
    As described above, the present invention provides an error diagnosis connection board having a plurality of test ports for diagnosing failures of respective devices inside the electronic device, and thus, there is an advantage of improving the work yield required for failure diagnosis. .
    权利要求:
    Claims (1)
    [1" claim-type="Currently amended] In the failure diagnosis device in the electronic device,
    Located in the outer case of the electronic device and provided with a plurality of test ports, each of the test ports are connected to the power port of the respective internal devices to enable the operator to diagnose the failure of each device from the outside of the device Device characterized by consisting of a fault diagnosis connection board.
    类似技术:
    公开号 | 公开日 | 专利标题
    US4459693A|1984-07-10|Method of and apparatus for the automatic diagnosis of the failure of electrical devices connected to common bus nodes and the like
    US5428624A|1995-06-27|Fault injection using boundary scan
    US7036062B2|2006-04-25|Single board DFT integrated circuit tester
    US5937154A|1999-08-10|Manufacturing functional testing of computing devices using microprogram based functional tests applied via the devices own emulation debug port
    EP1387176B1|2013-08-21|Time-domain reflectometer for testing terminated network cable
    US5532927A|1996-07-02|Automotive diagnostic tool
    US7047462B2|2006-05-16|Method and apparatus for providing JTAG functionality in a remote server management controller
    CA2421047C|2005-01-25|Method and apparatus for optimized parallel testing and access of electronic circuits
    TWI345638B|2011-07-21|Compensation for voltage drop in automatic test equipment
    US6983441B2|2006-01-03|Embedding a JTAG host controller into an FPGA design
    JP3201980B2|2001-08-27|Test instrument, measurement method, and test method for patch cord
    TWI260417B|2006-08-21|Automated circuit board test actuator system
    US7146584B2|2006-12-05|Scan diagnosis system and method
    US4196386A|1980-04-01|Method and portable apparatus for testing digital printed circuit boards
    US5469064A|1995-11-21|Electrical assembly testing using robotic positioning of probes
    EP0489511B1|1996-02-28|Method and apparatus for diagnosing failures during boundary-scan tests
    US4709366A|1987-11-24|Computer assisted fault isolation in circuit board testing
    US20060015785A1|2006-01-19|Test apparatus for mixed-signal semiconductor device
    KR101383754B1|2014-04-10|Self-test, monitoring, and diagnostics in grouped circuitry module
    CN100549711C|2009-10-14|remote integrated circuit testing method and device
    JP4608516B2|2011-01-12|Method for integrating test modules into a modular test system and modular test system
    JP4959941B2|2012-06-27|Interactive software probing
    US20110055632A1|2011-03-03|Wireless Diagnostic System
    KR20090089371A|2009-08-21|Testing apparatus and device interface
    WO1991011728A1|1991-08-08|Ic testing device
    同族专利:
    公开号 | 公开日
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    法律状态:
    1997-11-17|Application filed by 윤종용, 삼성전자 주식회사
    1997-11-17|Priority to KR1019970060511A
    1999-06-05|Publication of KR19990040188A
    优先权:
    申请号 | 申请日 | 专利标题
    KR1019970060511A|KR19990040188A|1997-11-17|1997-11-17|Fault diagnosis device in electronic equipment|
    [返回顶部]