• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
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    • 专利摘要:
    A gas analyzing apparatus which includes a laser light emitting unit, a laser light receiving unit (41), an operating unit for modifying a length of the optical path of the light by moving an optical element and a calculation unit for calculating a concentration of gas on the basis of signals detected by the light receiving unit in two states where the optical element is at different positions of n / 2 times a wavelength of the light .
    公开号:FR3075961A1
    申请号:FR1871288
    申请日:2018-10-24
    公开日:2019-06-28
    发明作者:Yu TANIGUCHI；Kazuhiro Koizumi；Houjyun Yamauchi
    申请人:Fuji Electric Co Ltd；
    IPC主号:
    专利说明:

    Description
    Title of the invention: GAS ANALYSIS INSTALLATION
    1. TECHNICAL AREA
    The present invention relates to a gas analysis installation.
    2, RELATED TECHNIQUE
    [0003] Gas analysis installations are known for measuring a gas concentration using laser absorption spectroscopy. In the gas analysis installation, a plurality of optical elements are provided in a light path between the light source unit and the light receiving unit, which sandwich the atmosphere at measure. The coherence of the laser light causes interference light due to multiple reflections of light between the optical elements. The interference light is superimposed on the light to be measured in the form of interference noise. To reduce the appearance of interference light, a technology is known which consists in finely moving the condensing lens randomly in the direction of the optical axis (see patent document 1, for example). However, it is difficult to reduce the interference only by finely moving the condensing lens, etc. randomly.
    Patent document 1: publication of Japanese patent application no. 2008-70314 [0005] In gas analysis installations, it is better to reduce interference noise.
    ABSTRACT
    The first facet of the present invention provides a gas analysis installation. The gas analysis installation can analyze constituents included in the gas being measured. The gas analysis installation may include a light emission unit. The light emitting unit can send laser light to the gas being measured. The gas analysis installation may include a light receiving unit. The light receiving unit can receive laser light, which is passed through the gas being measured. The gas analysis installation may include an actuation unit. The actuator can change the length of the optical path of the laser light by moving at least one optical element. The optical elements can be arranged in the light path through which the laser light passes. The gas analysis installation may include a calculation unit. The calculating unit can calculate a concentration of the gas being measured based on the signals detected by the light receiving unit in two states where the optical elements are in positions different from n / 2 times the wavelength of the laser light (n being an integer).
    The light emitting unit may have a light emitting element. The light receiving unit may have a light receiving element. The actuator can move at least one of the light emitting element and the light receiving element.
    The actuating unit can move the optical element by an amplitude of n / 2 times a wavelength of the laser light.
    The light receiving unit can measure an intensity of the laser light, in synchronization with a period in which the actuation unit moves the optical element.
    The light emitting unit may have a plurality of light emitting elements having different light emitting wavelengths. The actuating unit can move the light receiving member.
    The light emitting unit can choose any of the light emitting elements to emit light. The actuator can move the light receiving element by an amplitude corresponding to a light emitting wavelength of the light emitting element, which emits light.
    The light emitting unit can sequentially choose the light emitting elements to emit light. The actuating unit can sequentially move the light receiving elements to positions corresponding to a light emitting wavelength of the light emitting element, which emits light.
    The light emitting unit can have, in addition, a part of heat radiation to radiate heat from the light emitting element. The actuator can move the light receiving element.
    The light emitting unit may have a part radiating heat to radiate heat from the light emitting element and a connecting part, which thermally connects the emitting element. light and the part radiating heat, without fixing a relative position between the light emitting element and the part radiating heat. The actuator can move the light emitting element.
    The light receiving unit may further have a printed circuit board where an amplifier is provided to amplify an output signal from the light receiving element. The actuation unit can move the light receiving member and the printed circuit board.
    The actuating unit can control a vibration waveform indicating a position to which the optical element is moved, by a triangular wave.
    The actuation unit can control a vibration waveform indicating a position to which the optical element is moved, by a rectangular wave.
    The summary clause does not necessarily describe all the characteristics
    of the embodiment of the present invention. The present invention can also consist of a sub-combination of the characteristics described above. SHORT DESCRIPTION OF THE DRAWINGS
    Figure 1 is a sectional view illustrating a schematic configuration of the installation 100 of gas analysis according to the first embodiment of the present invention.
    Figure 2 is a sectional view illustrating a light emission unit 30 by way of example.
    Figure 3 is a sectional view illustrating a light receiving unit 40 by way of example.
    Figure 4 is a diagram illustrating a unit 32 forming a laser light source by way of example.
    Figure 5 is a graph illustrating an exemplary waveform graph of a scan control signal, Figure 6 is an exemplary waveform graph of a modulated signal, which is output from a unit producing a harmonic modulation signal.
    Figure 7 is an exemplary waveform graph of a laser control signal, which is output from a current control unit.
    Figure 8 is a diagram illustrating a schematic configuration of a unit 60 for processing the light reception signal.
    Figure 9 is a graph illustrating examples of a light reception signal, an output signal from a synchronization detection circuit and a trigger signal.
    Figure 10 shows a vibration waveform as an example by an actuation unit.
    Figure 11 shows another vibration waveform by way of example by the actuation unit.
    Figure 12 shows another vibration waveform by way of example by the actuating unit.
    Figure 13 shows another vibration waveform by way of example by the actuating unit.
    Figure 14 shows examples of a measurement waveform and a waveform, which has been averaged, when an element 41 for receiving light is moved to the position of + 1/4 in this embodiment.
    Figure 15 is a sectional view illustrating a schematic configuration of an installation 100 in the gas analysis according to the second embodiment of the present invention.
    Figure 16 shows a vibration waveform as an example by an actuation unit.
    Figure 17 is a flowchart illustrating the treatments carried out by the gas analysis installation. according to the present embodiment.
    DESCRIPTION OF EMBODIMENTS BY way of example We will describe below one (some) embodiment (s) of the present invention. The embodiment or the embodiments do not limit the invention and all the combinations of the characteristics described in the embodiment or. the embodiments are not necessarily essential to the means provided by aspects of the invention.
    Figure 1 is a sectional view illustrating a schematic configuration of an installation 100 for gas analysis according to the first embodiment of the present invention, The installation 100 for gas analysis analysis of the constituents included in the gas being measured. In the present example, the gas analysis installation 100 measures a target gas concentration of the gas being measured included in the gas stream passing through a smoke duct 10. The gas analysis installation 100 can be a gas concentration measurement installation using exposure to laser light. The measurement methods of the gas analysis installation 100 are not limited. Thus, for example, the measurement methods to be used include tunable diode laser absorption spectroscopy (TDLAS method) using the absorption of laser light.
    In Figure 1, the smoke duct 10 forms a flow channel where gas passes. In the present example, the space inside the duct 10 is a space 11 for the object to be measured. The pipe 10 can be a flow pipe for an exhaust gas or a boiler or a combustion furnace. The boiler and combustion furnace can burn coal, heavy oil or garbage. Here, the conduit 10 is not limited to a gas flow channel. The conduit 10 in this specification should only be a device comprising an interior space where gas, being the subject of a measurement, passes and it can be a great variety of types of devices such as a container, a chimney, an exhaust pipe, a denitrification plant, a chemical plant, a steelworks and an oven.
    In the present example, the installation 100 for gas analysis comprises a flange 21 on the side of the light emission, a flange 22 on the side of the light reception, an emission unit 30 light and a light receiving unit 40. The flange 21 on the side of the light emission and the flange 22 on the side of the light reception have cylindrical shapes, having their two ends open. In the present specification, an optical axis direction of the laser light 1 emitted by the light emitting unit 30 is considered to be the direction of the X axis. The longitudinal direction of the conduit 10 is considered to be a direction of Tax Z. A direction orthogonal to the direction of the X axis to the direction of Tax Z is considered a direction of the Y axis.
    The flange 21 on the side of the light emission is fixed to a part 12 of the wall, so as to pass through an opening 14 provided on the part 12 of the wall of the duct 10, on the other hand, the flange 22 receiving light is fixed to the wall portion 12, so as to pass into the opening provided on the wall portion 12 in a position opposite the flange 21 on the side of the light emission, having the conduit 10 between them. The flange 21 on the side of the light emission and the flange 22 on the side of the light reception are fixed, for example, to the wall portion 12 of the duct by welding, etc. The flange 21 on the side of the light emission and the flange 22 on the side of the light reception can be made of metallic material such as stainless steel.
    The light emission unit 30 flies light 1 laser gas being measured. In the present example, the light emitting unit 30 sends laser light 1, through the opening 14 of the wall portion 12 of the conduit 10, towards the space 11 which is the subject of a measurement. The light emitting unit 30 may include a laser light source unit 32 including a laser light emitting element 31. The light emitting unit 30 includes a housing 34. In one example, the housing 34 may be in the form of a bottom cylinder, having one end open, while the other is closed. The housing 34 can be fixed to the flange 21 on the light emission side by means of an emission tube 35.
    The unit 32 forming a laser light source is housed in the unit 30 light emission unit has a collimator lens 33 provided on the emission side. The collimating lens 33 transforms light emitted by the laser light emission element 1 into collimated light. The laser light 1, which is collimated by the collimating lens 33 can be sent to the space 11 being measured. In the present example, the collimating lens 33 is fixed inside the emission tube 35.
    The light receiving unit 40 receives ia light 1 laser having passed through the gas being measured. In the present example, it receives light 1 having passed through the duct. The light reception unit 40 can have a light reception element 41. The light receiving unit 40 comprises a housing 43. In this example, the housing 43 may be in the form of a bottom cylinder having one open end, while the other end is closed. The housing 43 can be fixed to the flange 22 for receiving light via an inlet tube 44. The light receiving element 41 is housed in the housing 43. A condenser lens 42 can be provided on the side of the inlet of the light receiving element 41. The condenser lens 42 may be provided so as to cover an opening in the housing 43. The condenser lens 42 condenses the laser light 1 at a position of the light receiving element 41.
    The installation 100 for analyzing gases comprises a unit 60 for processing a light reception signal. The unit 60 for processing a light reception signal is a calculating unit, for example, for calculating a concentration of the gas being measured on the basis of a signal, which is detected by the light reception unit 40. The light reception signal processing unit 60 is electrically connected to the light reception element 41. FIG. 1 shows the unit 60 for processing a light reception signal outside the housing 43 of the light reception unit 40, but this unit 60 is not limited to this position. At least part of the unit 60 for processing a light reception signal can be provided in the housing 43.
    The installation 100 for analyzing gases comprises the unit 36 for actuating the light emission unit. The actuation unit 36 moves the laser light emitting element 31 in the direction of the optical axis (direction of the X axis). In the present example, the actuation unit 36 moves, in the direction of the optical axis, the unit 32 forming a laser light source, including the element 31 for emitting laser light.
    In the present example, the installation 100 for analyzing gases comprises a unit 47 for actuating the light reception unit. The actuation unit 47 moves the light receiving element 41 in the direction of the optical axis (direction of the X axis), the actuation unit 36 and the actuation unit 47. are examples of an actuation unit for modifying the length of the optical path of the laser light 1, by moving at least one optical element, which is arranged in the light path through which the laser light 1 passes, optical elements to be moved by the actuating unit may include a laser light emitting element 31, a laser light receiving element 41, a collimating lens 33 and a condenser lens 42. Depending on the optical system of the gas analysis installation 100, a window on the side of the light emission can be provided on the side of the emission surface of the collimating lens 33 and a window on the side of the reception of Light may be provided on the side of the entry surface of the condenser lens 42. In this case, the window on the side of the light emission and the window on the side of the light reception may be included in the optical elements.
    In the present example, two actuation units are included as the actuation unit: the actuation unit 36 and the actuation unit 47. However, the actuating unit can move at least one of the element 31 for emitting laser light and for element 41 for receiving laser light. This means that one of the actuating unit 36 and the actuating unit 47 can be omitted. It is also possible to provide three actuation units or more actuation units for moving three or more optical elements.
    The actuation unit moves the optical element with an amplitude of n / 2 times the wavelength 1 of the laser light 1. More specifically, the unit 36 for actuating the light emitting unit moves the element 31 for emitting laser light by an amplitude n / 2 ibis the wavelength 1 of the light 1 laser. The actuation unit 47 of the light reception unit moves the light reception element 41 by an amplitude of n / 2 times the wavelength 1 of the laser light 1. The actuation unit 36 can cause two states where the element 31 for emitting laser light is at positions different from n / 2 times the wavelength of the laser light 1 (n being an integer). Similarly, the actuation unit 48 can cause two states where the element 41 for receiving the light is at positions different from n / 2 times the wavelength of the light 1 laser (n being an integer ). The light reception signal processing unit 60 calculates a concentration of the gas being measured, on the basis of the signals detected by the light reception unit 40 in the two states where the optical elements, such as the element 31 for emitting laser light, are in positions different from n / 2 times the wavelength of the laser light 1 (n being an integer).
    Figure 2 is a sectional view illustrating a light emission unit 30 by way of example. The light emitting unit 30 comprises, in the housing, the unit 32 forming a laser light source and the actuating unit 36. In the present example, the emission tube 35 is provided at one end of the housing 34. The collimating lens 33 is fixed to the emission tube 35. In the present example, the actuating unit 36 may not move the. collimating lens 33. Consequently, the collimating lens can be fixed and, thus, the gas in the duct 10 can be contained in leaktight manner without passing through the housing 34.
    The actuation unit 36 may include a piezoelectric vibration unit 38 using a piezoelectric element. The piezoelectric vibration unit 38 is an actuator by way of example. The actuation unit 36 may have, within it, a control circuit for controlling the piezoelectric vibration unit 38. The piezoelectric vibration unit 38 is deformed by a voltage applied to the piezoelectric vibration unit 38 by the control circuit, which allows the laser light-emitting element 31, etc., which is connected to the 38 piezoelectric vibration unit, to be moved in the direction of the optical axis (direction of the X axis). However, the actuator of the actuation unit 36 is not limited to a piezoelectric vibration unit 38.
    The base end of the actuation unit 36 can be fixed to the base plate 37 of the housing 'piezoelectric vibration unit 38 can be provided at the end of the actuation unit 36. The piezoelectric vibration unit 38 is connected to the unit 32 forming a laser light source. The laser light source unit 32 includes the laser light emitting element 31. The laser light emitting element 31 produces heat and thereby radiates heat. Accordingly, the light emitting unit 30 may include a part 72 radiating heat to radiate heat, which is produced by the element 31 emitting laser light. In the present example, the emission tube 35 also functions, as part 72 radiating heat and heat is sent by radiation from part 72 radiating heat to the housing 34, but, without being limited to that, the housing 34 itself can be the part 72 radiating heat or there can be provided an individual fin for radiating heat etc.
    In the present example, the relative position of the part 72 radiating heat and the element 31 for emitting laser light is not fixed. A connecting part 39 may be included between the part 72 which radiates heat and the unit 32 forming a laser light source, that is to say between the part 72 which radiates heat and the element 31 d emission of laser light. The connecting part 39 thermally connects the element 31 for emitting the laser light and the part 72 which radiates heat. The connecting part 39 is a heat radiating grease for example. Provide the fin to radiate heat in the unit 32 forming the laser light source so that the actuating unit 36 can move the unit 32 forming the laser light source and the fin radiating heat. In this case, the connecting portion 39, such as grease radiating heat, can be provided between, at the same time, the unit 32 forming the laser light source and the fin radiating heat and the emission tube 35 or the housing 34. By providing the connecting part 39, the actuating unit 36 can move the element 31 for emitting laser light, ensuring that heat is radiated from the element 31 laser light emission.
    Unlike the present example, in the light emission unit 30, the unit 32 forming a laser light source can be fixed to the part 72 radiating heat, from the point of view of the heat radiation. In this case, the actuating unit 36 of the light emitting unit is omitted. The light receiving unit actuation unit 47 can move the light receiving member 41.
    Figure 3 is a sectional view illustrating a light receiving unit 40 by way of example. The light reception unit 40 comprises, in the housing 43, a light reception element 41, a printed circuit board 45 and an actuation unit 47. The light receiving element 41 can be held by a light receiving element adapter 41a. The printed circuit board 45 can be connected to the light receiving element adapter 41a. The printed circuit board 45 may have an amplifier 46 amplifier amplifies an output signal from the light receiving element 41. The inlet tube 44 may be provided at one end of the housing 34. The inlet tube 44 may have the condenser lens 42. In the present example, the actuation unit 47 does not move the condenser lens 42. Consequently, the condenser lens 42 can be fixed and, thus, the duct can be sealed and the gas cannot pass through the housing 43.
    The actuation unit 47 may include a piezoelectric vibration unit 49 using the piezoelectric element. The actuation unit 47 may have a control circuit for controlling the piezoelectric vibration unit 49. The piezoelectric vibration unit 49 is deformed by the voltage applied to the piezoelectric vibration unit 49 by the control circuit, which allows the light receiving element 41 etc. which are connected to the unit 49 of piezoelectric vibration, to be moved, in the direction of the optical charge (direction of the X axis). Actuators other than piezoelectric elements can be used as the actuation unit 47.
    The base end of the actuation unit 47 can be fixed to a base plate 48 of the housing 'unit 49 of piezoelectric vibration can be provided at the end of the actuation unit 47. The actuation unit 47 can move both the light receiving element 41 and the printed circuit board 45. More specifically, the piezoelectric vibration unit 49 can move the light-receiving element adapter 41a and the printed circuit board 45. The piezoelectric vibration unit 49 is connected, for example, to the printed circuit board 45.
    As described above, the installation 100 for analyzing gases of the present embodiment has an actuation unit for modifying the length of the optical path of the laser light 1, by moving at least one optical element, which is placed in the light path through which the laser light 1 passes. A concentration of the gas being measured is then calculated on the basis of signals detected by the light reception unit 40 in two states where the optical elements are in positions different from n / 2 times the length d wave of light 1 laser (n being an integer). Interference noise, in a state where the optical element is in the position of + ln / 4 (where 1 is the wavelength of laser light 1 and n is an integer), has a phase opposite to interference noise in a state where the optical element is in the position of -ln / 4. Consequently, interference noise can be reduced by averaging the signals, which are detected by the light receiving unit 40 in two such states. One can thus reduce the interference compared to a case of a fine displacement at random.
    In particular, in the present embodiment, it is not the condenser lens, but at least one of the element 31 for emitting laser light and the element 41 for receiving the light, which is moved as an optical element. Consequently, compared to a case where the condenser lens, such as a quartz lens, which is heavier than the laser light emitting element 31, is moved, the load on the unit 36 of actuation and the unit 47 of actuation can be reduced.
    It is thus possible to reduce the size of the actuation unit 36 and of the actuation unit 47.
    Figure 4 is a diagram illustrating a unit 32 forming a laser light source by way of example. The laser light source unit 32 can be configured as a unit, which houses in a housing a plurality of components, such as the laser light emitting element 31 described below. As shown in the figure, the unit 32 forming a laser light source houses a unit 204 for producing a wavelength scan control signal and a unit 205 for producing a harmonic modulation signal, such as a control unit 202 wavelength, a current control unit 206, the laser light emitting element 31, a thermistor 208, a Peltier device 210 and a temperature control unit 207.
    The unit 204 for producing a wavelength scanning drive signal produces a wavelength scanning signal, in which the light emission wavelength of the element 31 laser light emission is variable, so as to sweep an absorption wavelength of the gas being measured. The unit 205 for producing a harmonic modulation signal produces a sine wave signal of about 10 kHz, for example, to detect the absorption waveform of the gas. The sine wave signal produced is used as the modulated signal. The current control unit 206 transforms the laser control signal into a control current of the laser light emitting element 31 to control the laser light emitting element 31. The laser control signal is a signal obtained by synthesizing the wavelength scanning signal, which is produced at the wavelength scanning control signal production unit 204 and the sine wave signal, which is produced at the harmonic modulation signal production unit 205.
    The element 31 for emitting laser light can be a semiconductor laser diode (LD laser diode). The laser light emitting element 31 emits laser light 1 according to the control current supplied by the current control unit 206. Thermistor 208 is a temperature sensing element for detecting the temperature of the laser light emitting element 31. The Peltier device 210 is a cooling unit for cooling the element 31 for emitting laser light. The element 31 for emitting laser light can be arranged by being in contact with the thermistor. The temperature control unit 207 controls the Peltier effect device 210 on the basis of the temperature measured by the thermistor 208. Thus maintaining the temperature of the element 31 for emitting laser light at a constant level, it is possible to control the wavelength of the laser light 1.
    Figure 5 is a graph illustrating an exemplary waveform graph of the scan control signal. Figure 5 shows an exemplary current waveform output from the wavelength scan control signal generating unit 204 of Figure 4. The length scan control signal S1 wave, to scan the light absorption characteristic of the gas being measured, linearly changes the control current value of the laser light emitting element 31. The emission wavelength of the light coming from the laser light emitting element 31 thus changes little by little. The light emission wavelength changes, for example, so as to sweep a light absorption characteristic of about 0.2 nm. On the other hand, the signal S2 causes the laser light emitting element 31 to emit light at a constant wavelength, maintaining the value of the control current greater than or equal to a threshold current where the the laser light emitting element 31 is stable. In addition, at signal S3, the value of the control current is fixed at 0 mA. Note that the trigger signal is a signal synchronizing the signal S3.
    Figure 6 is a waveform graph, by way of example, of a modulated signal, which is output from a unit 205 for producing harmonic modulation signal. Figure 6 is a waveform graph of the modulated signal output from the harmonic modulation signal producing unit 205 of Figure 4. A signal S4, for detecting the light absorption characteristic of the gas. being measured, is considered, for example, as a sine wave with a frequency of 10 kHz, and modulates the wavelength in a modulation range of about 0.02 nm.
    Figure 7 is a waveform graph, by way of example, of a laser control signal, which is output from a current control unit. Figure 7 shows a laser control signal output from the current control unit 206 of Figure 4. The control signal S5 is sent to the light emitting element 31
    vs ".Y J laser. The laser light emitting element 31 thus exits the modulated light, which can, while modulating the wavelength in the modulation range of about 0.02 nm, detect the light absorption characteristic gas being measured in a wavelength range of about 0.2 nm.
    Figure 8 is a diagram illustrating a schematic configuration of a light reception signal processing unit 60. The light receiving element 41 shown in FIG. 1 is, for example, a photodiode. For the light receiving element 41, an element having sensitivity to the light emission wavelength of the laser light emitting element 31 is applied. The output of the light receiving element 41 is sent to the light receiving signal processing unit 60 by wiring.
    The light reception signal processing unit 60 comprises a converter 61 IV, an oscillator 62, a synchronization detection circuit 63, a low pass filter 64A, a low pass filter 64B and a unit 65 operative. The I-V converter 61 transforms the output of the light receiving element 41 into a voltage output. The low pass filter 64A eliminates higher harmonic noise components from the voltage output. The output signal of the low-pass filter 64A is sent to the synchronization detection circuit 63. The synchronization detection circuit 63 adds, to the output signal of the low-pass filter 64A, a signal (double wave signal) coming from the oscillator 62 and extracts only an amplitude of the double frequency component of the modulated light signal 1 laser. The noise elimination and the amplification are carried out on the output signal of the synchronization detection circuit 63 in the low-pass filter 64B and the signal obtained and sent to the operational unit 65. In the operational unit 65, an operational processing is carried out to detect the concentration of the gas.
    A method of detecting the concentration of gas using the gas analysis installation 100 configured as described above is described. First, the temperature of the element 31 for emitting laser light by the thermistor 208 is detected in advance. In addition, to measure the concentration of the gas being measured at a central part. of the wavelength scan control signal SI represented in FIG. 5, the power supply of the device 210 Peltier is controlled by the temperature control unit 207 and the temperature of the element 31 d is maintained emission of laser light at the desired temperature level.
    While the Peltier effect device 210 maintains the temperature of the laser light emission element 31 at the desired temperature level, the current control unit 206 controls the laser light emission element 31 by modifying the control current. It follows that the laser light 1 is, for the measurement, sent into the conduit 10 where the gas being measured is located. The laser light 1 having passed through the gas being measured enters the light-receiving element 41. If the laser light 1 is absorbed by the gas being measured, a double wave signal is detected by the synchronization detection circuit 63 and a gas absorption waveform appears.
    FIG. 9 is a diagram illustrating an example of a light reception signal, an output signal from the synchronization detection circuit and a trigger signal. FIG. 9 represents an output waveform of the circuit 63 for detecting synchronization when the gas. being measured is detected. Then, at the operating unit 65, a trigger signal is sent from the unit 204 for producing a wavelength scan control signal. The trigger signal is a signal, which is output at each period, which consists of the signals S1, S2 and S 3 described above. The trigger signal is output from the wavelength scan control signal generating unit 204 of the laser light source unit 32. The trigger signal is sent to the operating unit 65 of the light reception signal processing unit 60 by a connecting line. The trigger signal synchronizes the wavelength scan control signal S3 described above.
    In Figure 9, area A surrounded by the dashed line is an output waveform, which is obtained when the gas being measured exists. As shown in FIG. 9, the minimum value B, the maximum value C, the minimum value D are detected in the output waveform of the synchronization detection circuit 63, when determined time periods tb, te, td in advance have elapsed from the start of the application of the trigger signal. These periods of time tb, tc, td determined in advance can be calculated experimentally in advance in the factory or after calibration be saved in the memory, When the periods of time tb, tc, td determined in advance have elapsed from the start of the application of the trigger signal, the operating unit 65 reads the output waveform of the synchronization detection circuit 63 and stores the result in memory. Then, the operating unit 65 calculates a concentration from the output waveform stored. The maximum C value of the peak of the output waveform of the synchronization detection circuit corresponds to the concentration of the gas as it is. Consequently, the operating unit 65 can output a value associated with the maximum value C, as the concentration of the constituent in the gas being measured. As a variant, the operating unit 65 can output, as a concentration, a value associated with at least one of a value obtained by subtracting the minimum value B from the maximum value C, and a value obtained by subtracting the minimum value D of the maximum value C. The operating unit 65 thus measures, as a function of the trigger signal, the concentration of the gas being measured at each single shift.
    The method described above makes it possible to determine the concentration of the gas. Since the laser light emitting element 31 is used as a light source, due to its greater coherence than a normal light source, part of the laser light 1 is reflected in a multiple manner, by example, between the element 31 for emitting laser light and the entry surface of the. collimating lens 33 or between the condenser lens 42 and the light receiving element 41, etc., and this multiple reflection light may be interference noise.
    To reduce interference noise, in the present embodiment, as described in Figures 1 to 3, it is arranged that the actuating unit 36 and the actuating unit 47 move at least l one of the element 31 for emitting laser light and the element 41 for receiving light, with an amplitude of n / 2 times the wavelength of the light 1 laser, relative to a case where you finely move the condenser lens randomly, you can reduce the interference.
    FIG. 10 represents a vibration waveform by way of example by an actuation unit. In the figure, the horizontal axis represents time and the vertical axis represents the displacement of vibration. As shown in the figure, the actuator can control the ton of vibration wave by indicating the position to which the optical element is moved by a triangular wave. More precisely, the actuation unit 36 vibrates the element 31 for emitting laser light with an amplitude of n / 2 times the length 1 of the laser light 1 in the direction of the optical axis (direction of the X axis). The actuation unit 36 moves the laser light emitting element 31 to the positions of +1/4. If the wavelength is between 1.6 and 2pm, the laser light emitting element 31 is moved to the position between +0.4 and +0.5 pm approximately. Likewise, the actuation unit 47 vibrates the light receiving element 41 with an amplitude of n / 2 times the wavelength 1 of the laser light 1 in the direction of the optical axis ( direction of the X axis). In the present example, n = 1.
    A vibration period of the piezoelectric vibration unit 38 can synchronize the period of the wavelength scan control signal S1 shown in FIG. 5. The vibration period of the piezoelectric vibration unit 38 can be n times the period of the wavelength scan control signal SI (n being an integer). In other words, assuming that the frequency of the vibration of the piezoelectric vibration unit 38 is f and the frequency of the wavelength scan control signal is fsl, they can satisfy the relationship: f = fs] / n (n being an integer). As shown in FIG. 9, the signal for wavelength scanning control synchronizes a measurement rate by the light reception unit 40 (output from the synchronization detection circuit). Consequently, the light receiving unit 40 can measure an intensity of the laser light 1, by synchronizing a period when the actuating unit 36 moves the optical element. In particular, the period for acquiring the output of the synchronization detection circuit on the basis of the signal detected by the light reception unit 40 can synchronize the period of the optical element moved by the actuation unit 36. Thus, for example, the actuation unit 36 and the output of the synchronization detection circuit operate according to a common clock signal.
    If the distance between the unit 32 forming the laser light source and the collimating lens 33 is modified by the actuating unit 36, the intensity of the interference light, which is caused by multiple reflections of light between the laser light source unit 32 and the surface of the collimating lens 33 varies, because a condition, in which the interference is produced, changes. The frequency of this variation in interference light is equal to the vibration frequency of the piezoelectric vibration unit 38 of the actuation unit 36. The interference noise loses, in this case, being eliminated from the signal detected by a filtering process, such as by a low-pass filter, which can eliminate the vibration frequency component.
    Also, interference noise, in a state where the element 31 for emitting laser light is in the position of + 1 · η / 4 (1 being the wavelength of the laser light 1 and n being an integer), has a phase opposite to the interference noise in a state where the element 31 for emitting laser light is in the position of -ln / 4. Interference noise can be reduced by averaging the signals, which are detected by the light receiving unit 40 in two such states. It is thus possible to reduce the interference noise, compared to a case of random fine displacement.
    By acquiring a measurement value and averaging it four times in a single measurement period (offset), it can be expected that the intensity of the interference light will be reduced. By controlling the position of movement of the optical element by triangular background, the change in displacement of which is linear, the interference noise can be effectively eliminated.
    Figure 11 shows another vibration waveform by way of example by the actuation unit, In the figure 'horizontal axis represents time and vertical tax represents the displacement of vibration. As shown in the figure, the actuator can control a vibration waveform indicating the position to which the optical element is moved by a sine wave. In the present example, it is possible to calculate a concentration of the gas being measured on the basis of the signals detected by the light reception unit 40 in the two states where the position of the element 31 of emission of laser light is different from n / 2 times the wavelength of ia laser light 1 (n being an integer), This can reduce interference noise.
    Figure 12 shows another vibration waveform by way of example in the actuation unit. In the figure, the horizontal axis represents time and the vertical axis represents the displacement of vibration. As shown in the figure, the actuating unit can control a ton of vibration wave indicating the position towards which the optical element goes by a rectangular wave. This is for example that, if the gas concentration. being the subject of a measurement is calculated in the form of its average over T second (s) (for example over 1 second), during the first half duration T / 2, the actuation unit 36 puts the element 31 light emission base at a position of +1/4. During the last half-time T / 2, the actuation unit 36 sets the element 31 for emitting laser light to the position of -1/4. In the present example, the period of the rectangular wave is an integer multiple of the measurement period (offset). In the example shown in Figure 12, the rectangular wave period is eight times the measurement period (offset).
    Interference noise, in a state where the element 31 for emitting laser light is in the position of +1 n / 4 (1 being the wavelength of the laser light 1 and n being a whole number), has a phase opposite to interference noise in a state where the laser light emitting element 31 is the position of -ln / 4. Accordingly, interference noise can be reduced by averaging the signals, which are detected by the light receiving unit 40 in two such states. With regard to the measurement frequency, the actuation unit 36 can make the frequency of the vibration of the piezoelectric vibration unit 38 lower. Consequently, the piezoelectric vibration unit 38, as an actuator, need not necessarily operate at high speed, so that the piezoelectric vibration unit 38 can operate easily in a stable manner.
    Figures 10, 11 and 12 describe a case in which the actuating unit 36 moves the element 31 for emitting laser light so that the position of the element 31 for emitting laser light is +1/4 and its amplitude is 1/2. However, the gas analysis installation 100, in the present embodiment, is not limited to this. The actuating unit 36 can move the laser light emitting element 31 to the position of +21/4 (+1/2), and the laser light emitting element 31 to the position of +31/4, respectively.
    FIG. 13 shows another vibration waveform by way of example of the actuation unit. In the figure, the horizontal axis represents time and the vertical axis represents the displacement of vibration. As shown in FIG. 13, in the present example, the vibration displacement of the element 31 for emitting laser light changes as a function of time. In the first single shift, in a state where the actuating unit 36 sets the laser light emitting element 31 to the position of +1/4, the light receiving signal processing unit 60 obtains the measurement value of the gas concentration. In the following single shift, in a state where it puts the laser light emitting element 31 in the position of +21 / 4 (+1 / 2), the unit 60 for processing the light reception signal obtains the measurement value of the gas concentration. Then, in the following unique shift, in a state where it puts the element 31 for emitting laser light at the position of +31 / 4, the unit 60 for processing the light reception signal obtains the value of measurement of gas concentration.
    Similarly, the actuation unit 36 puts the element 31 for emitting laser light at the position of -1/4, --21 / 4 (-1/2), -31/4 . In this state, the light reception signal processing unit 60 obtains the measurement value of the gas concentration. As shown in Figure 13, there may be a period of time to put the laser light emitting element 31 at the 1/4 wavelength position (n being an integer), not at the position of an integer multiple of the wavelength 1/4. In this way, if the concentration of the gas being measured is calculated by averaging as a function of the duration T to be output, the amplitude of movement of the optical element by the actuating unit 36 , during duration T, can be changed sequentially.
    As a vibration waveform indicating a position to which the laser light emitting element 31 is moved, combine a plurality of waveforms having different amplitudes, which satisfy the relation ln / 2 (n being an integer), allows noise reduction, whatever the optical systems existing between the element 31 for emitting laser light and the element 41 for receiving light.
    If the optical element vibrates at an amplitude of an integer multiple of the minimum amplitude (1/2), which can eliminate the interference, an effect of eliminating the interference occurs. However, due to the cell difference of the optical systems of the light emitting unit 30 and the light receiving unit 40, their appropriate amplitudes are different. Therefore, moving the optical element of the plurality of amplitudes (1/2, 21/2, 31/2) from the start to average can effectively eliminate the interference noise. It will be noted that in FIGS. 10 to 13, a case has been described in which the actuation unit 36 moves the element 31 for emitting laser light, but the same is true for a case where the unit 47 actuator moves the light receiving unit 41. This is why we will not repeat the description.
    FIG. 14 represents examples of a measurement waveform and of a waveform, which has been averaged, when an element 41 for receiving light is set to the position of +1/4 in the present embodiment. A measurement waveform 5 has, at the moment when the light receiving element 41 is moved to the position of +1/4, a phase opposite to a measurement waveform 6 at the instant when the light receiving element 41 is mu at the position of -1/4. As a result, the interference noise is thus reduced, as shown in an averaged waveform 7, obtained by averaging the signals detected by the light receiving unit 40 in the two states where the light receiving element 41 is at positions different from n / 2 times the wavelength of the laser light 1 (n being an integer).
    Figure 15 is a sectional view illustrating a schematic configuration of the gas analysis installation 100 in the second embodiment of the present invention. The present embodiment has a light emission unit 50 different from that of the gas analysis installation 100 of the first embodiment shown in the figure, with the exception of the light emission unit 50, the gas analysis installation 100 of the present embodiment has the same structure as the first embodiment. Consequently, the description will not be repeated. In the gas analysis installation 100 of the present embodiment, the light emission unit 50 comprises, as a laser light emission element, the first light emission element 51 and the second element 52 light emission. The first light-emitting element 51 and the second light-emitting element 52 are provided in the housing 54. The first light-emitting element 51 and the second light-emitting element 52 are a plurality of light emitting elements, the light emission wavelengths of which differ from one another. The first light-emitting element 51 emits a first laser light 3. The second light-emitting element 52 emits a second laser light 2.
    Depending on the gas constituents being measured, one or the other of the first light-emitting element 51 and of the second light-emitting element 52 may be an emission element of near infrared light, having a light-emitting wavelength band of 0.7 to 2.5 µm, while the other may be a medium-infrared light-emitting element, having a light emission wavelength band of 3 to 10 μm, In the present example, a concave mirror 53 is provided for collimating the second laser light. An opening may be provided in the central part of the concave mirror 53. From the first light-emitting element 51, disposed on the rear face of the concave mirror 53, the first laser light 3 is emitted through the opening. It will be noted that the microlens, to collimate the first laser light 3 output from the first light-emitting element 51, can be provided on the rear face of the concave mirror 53. Provided that there is a plurality of light emitting elements, the light emission wavelengths of which are different from each other, the optical systems are not limited to the structure shown in Figure 15 In the present example, the actuation unit of the light emission unit is not provided. The unit 47 for actuating the light receiving unit is provided. The actuation unit 47 moves the light receiving element 41.
    The light emitting unit 50 chooses the first light emitting element 51 or the second light emitting element 52 to emit light, the actuating unit 47 moves the element 41 receiving light of an amplitude corresponding to the light-emitting wavelength of the light-emitting element, which emits light. For example, if the first light emitting element 51 is a near infrared light emitting element, for emitting the first laser light, having the first wavelength h in the band length range of light emission wave from 0.7 to 2.5 uni, the actuating unit 47 moves the light receiving element 41 by an amplitude lj n / 2 (n = 1), for example d '' an amplitude of 0.35 to 1.25 µm. Likewise, if the second light emitting element 52 is a light emitting element in the infrared medium, for emitting the second laser light having the second wavelength 12 in the wavelength band range d emitting light from 3 to 10 pm, the actuating unit 47 moves the element 41 for receiving the light by an amplitude of 12- n / 2 (n = 1), for example by an amplitude of 1.5 to 5 pm. Consequently, if the second light emitting element 52 emits light, the light receiving element 41 is displaced by a greater amplitude than in the case where the first light emitting element 51 emits light.
    If the actuation unit is provided on the light emission unit 50, a plurality of actuation units are required to move the first light emission element 51 and the second element 52 d light emission. Likewise, since the structure of the light emission unit 50 is complex, the actuation unit is difficult to produce. However, according to the present example, the actuation unit 47 can move the light reception element 41 by an amplitude corresponding to the light emission wavelength of the light emission element. light, which emits light, and can thereby provide a laser type gas analyzer corresponding to a plurality of gas types without increasing the number of actuation units (aetionnateurs).
    If the concentration of the gas being measured is calculated as an average value of the concentration of the gas as a function of the duration T, the light emission unit 50 may, during the duration T, sequentially selecting the first light-emitting element 51 and the second light-emitting element 52 for emitting light. Similarly, in this case, the actuation unit 47 moves the light receiving element 41 by an amplitude corresponding to the light emitting wavelength of the light emitting element, which emits light, FIG. 16 shows a vibration waveform by way of example by the actuation unit 47. In the present example, we show a case where + ln / 4 (n being an integer), where n = 4. In the present example, in the first measurement period (offset), the first element 51 of light emission emits light to emit the first light 3 laser, having the first wavelength lj · Then, we put the element 41 for receiving the light at the position of +1, (+ 1, η / 4, or n = 4). Then, the first light-emitting element 51 ceases to emit light and the second light-emitting element 52 begins to emit light. The second laser light, having the second wavelength 12, is thus emitted. Then, the light receiving element 41 is set to the position of + I2 (+ l2-n / 4, or n = 4). Then, the second light-emitting element 52 ceases to emit light and the first light-emitting element 51 begins to emit light. Then, the light receiving element 41 is set to the position of -ij. Then, the first light-emitting element 51 ceases to emit light and the second light-emitting element 52 begins to emit light. In addition, the light receiving element 41 is set to the position of -12. The above process is repeated.
    Compared to a case where the element 41 for receiving light is vibrated when it is set to the position of + ll5 -lj, +12 and -12 in this order, the quantity of displacement of the piezoelectric vibration unit 49, as an actuator, can be reduced during each shift. Accordingly, if a plurality of light emitting elements having a plurality of wavelengths lb 12i are selected after the plurality of light emitting elements have been sequentially set to positions corresponding to the lengths d wave 1 <, 12 respective, i.e. + 1, n / 4, + l2n / 4 in the first direction, from the reference position (direction + in the X axis), they can be placed sequentially at the positions corresponding to the respective wavelengths lb 12, that is to say -hn / 4, -kn / 4 in the second direction (direction - of the -X axis), which is opposite to the first sense.
    The order of movement of the optical element, such as the element 41 for receiving light is not limited to this. The order of displacement of the optical element can be changed at each duration T, which is an interval for outputting a concentration of the gas being measured.
    Figure 17 is a flowchart illustrating treatments of the installation 100 for analyzing gases in the present embodiment. The light emitting unit 50 chooses the first light emitting element 51 to emit light (stage S101). The actuation unit 47 moves the light receiving element 41 by an amplitude corresponding to the light emitting wavelength h of the first light emitting element 51, which emits light ( stage S102). The concentration of the gas being measured is calculated on the basis of the signal detected by the unit 40 for receiving the. light in the two stages where the light receiving element 41 is in positions different from n / 2 times the wavelength h of the first laser light 3 (n being an integer) (stage S103).
    Then, the light emission unit 50 chooses the second light emission element 52 for emitting light (stage S104). The actuation unit 47 moves the light-receiving element 41 by an amplitude corresponding to the light-emitting wavelength 12 of the second light-emitting element 52, which emits light. A concentration of the gas being measured is calculated based on the signal detected by the light receiving unit 40, in the two states where the light receiving element 41 is in two positions different from n / 2 times the wavelength 12 of the second laser light 2 (n being an integer) (stage S106).
    It will be noted that, in stage S102, if the light receiving element 41 vibrates along the wavelength h of an amplitude nlj / 2 along the optical axis, so as to be in two positions from + nl] / 4, a signal detected by the light reception unit 40 can be acquired. Similarly, in stage S105, if the element 41 for receiving the light vibrates along the wavelength 12 of an amplitude nl2 / 2 along the optical axis, so as to be in two positions of + nl2 / 4, a signal detected by the light receiving unit 40 can be acquired. On the other hand, as shown in the figure, the actuation unit 47 can sequentially place the light receiving element 41 in the positions of: + nij / 4, + nl2 / 4, nij / 4 and nl2 / 4 in this order and can acquire the signals detected by the light reception unit 40 at respective positions of the light reception element 41.
    In the above description, a case has been described where the actuating unit moves, as an optical element, at least one of the element 41 for receiving light and the element 31 d emission of laser light. However, if the structure makes it possible to move the condenser lens 42 etc., the actuating unit can move other optical elements, such as the condenser lens 42. In this case also, a concentration of the gas being measured is calculated on the basis of the signals detected by the light receiving unit in the two states where the optical element is in positions different from n / 2 times the wavelength of the laser light (n being an integer), Thus, compared to a case where the condenser lens is moved randomly, the interference noise can be reduced. In particular, the light reception unit 40 and the light reception signal processing unit 60 can measure an intensity of the laser light and perform signal processing by synchronizing the period when the actuation unit moves the optical element, and thus, one can obtain a gas analysis installation effectively eliminating vibration.
    [0102] Although the embodiments of the present invention have been described, the technical scope of the invention is not limited to the embodiments described above. It goes without saying for those skilled in the art that various modifications and improvements can be made to the embodiments described above. It goes without saying also that the embodiments with modifications or improvements of this kind are part of the invention.
    The operations, procedures, stages and stages of each operation carried out by an installation, system, program and method according to the invention or its embodiments or its diagrams can be carried out in any order provided that
    the order is not indicated by "before" or the like and provided that after a previous transaction, the expression is not used in the last transaction. Even if the flow of operations is described using sentences, such as "first" or "then", both in the embodiments and in the diagrams, this does not necessarily mean that the operations must be carried out in this order. EXPLANATION OF REFERENCES
    1: laser light; 2: second laser light; 3: first laser light; 5: measurement waveform; 6: measurement waveform; 7: average waveform; 10: conduit; 11: space of the object to be measured; 12: wall part; 14: opening; 21: flange on the light emission side; 22: flange on the light receiving side; 30: light emission unit; 31: laser light emitting element; 32: laser light source unit; 33: collimating lens; 34: file; 35: transmission tube; 36: actuation unit; 37: Base plate; 38: piezoelectric vibration unit; 39: connecting part; 40: light receiving unit; 41: light receiving element; 42: condenser lens; 43: housing; 44: inlet tube; 45: printed circuit board; 46: amplifier; 47: actuation unit; 48: base plate; 49: piezoelectric unit; 50: light emission unit; 51: first light-emitting element; 52: second element of light emission; 53: concave mirror; 54: housing; 60: light reception signal processing unit; 61: I-V converter; 62: oscillator; 63: synchronization detection circuit; 64: low pass filter; 65: operating unit; 72: part radiating heat; 100: gas analysis installation; 202: wavelength control unit; 204: unit producing a wavelength scan control signal; 205: unit for producing a harmonic modulation signal; 206: current control unit; 207: temperature control unit; 208: thermistor; 210: Peltier effect device.
    权利要求:
    Claims (1)
    [1" id="c-fr-0001]
    Claims [Claim I] Gas analysis installation (202) for analyzing a constituent included in a gas being measured, characterized in that it comprises: a light emission unit (31) for sending laser light (1) to the gas being measured; a light receiving unit (41) for receiving laser light (1) which has passed through the gas being measured; an actuation unit (48) for changing a length of the optical path of the laser light (1) by moving at least one optical element, which is arranged in a light path through which the laser light (1) passes and a unit (60) calculation for calculating a concentration of the gas being measured on the basis of signals detected by the light receiving unit (41) in two states where the optical element is in positions different from n / 2 times a wavelength of the laser light (1) (n being an integer), [Claim 2] Installation (202) for gas analysis according to claim 1, characterized in that the unit ( 31) light emitting to a light emitting element (32), the light receiving unit (41) has a light receiving element (42) and the actuating unit (48) moves at least one of the light emitting element (32) and the light receiving element (42), [Resell ication 3] Installation (202) for gas analysis according to claim 1 or 2, characterized in that the actuation unit (48) displaces the optical element by an amplitude of n / 2 times a length of wave of laser light. [Claim 4] Installation (202) for gas analysis according to claim 3, characterized in that the light reception unit (41) measures an intensity of the laser light (1), synchronizing a period when the actuation unit (48) moves the optical element. [Claim 5] Installation (202) for gas analysis according to claim 2, characterized in that the light-emitting unit (31) has a plurality of light-emitting elements (32) having lengths of different light emission wave and the actuation unit (48) moves the light receiving element (42). [Claim 6] Installation (202) for gas analysis according to claim 5, characterized in that the light emission unit (31) chooses any of the light emission elements (32) to emit of light and the actuating unit (48) moves the light receiving element (41) by an amplitude corresponding to a light emitting wavelength of the emitting element (32) of light, which emits light. [Claim 7] Installation (202) for gas analysis according to claim 5, characterized in that the light emission unit (31) selects sequentially the light emission elements (32) for emitting light and the actuating unit (48) sequentially moves the light receiving elements (42) to positions corresponding to a light emitting wavelength of the light emitting element (32), which emits light, [Claim 8] Installation (202) for gas analysis according to claim 2, characterized in that the light emitting unit (31) has, in addition, a part (100) of radiation heat to radiate heat from the light emitting element (31) and the actuating unit (48) moves the light receiving element (42). [Claim 9] Installation (202) for gas analysis according to claim 2, characterized in that the light emission unit (31) has: a part (100) radiating heat to radiate heat of the light emitting element (32) and a connecting part, which thermally connects the light emitting element (32) and the part (100) radiating heat, without fixing a relative position between the the light emitting element (32) and the pallet (100) radiating heat and in that the actuating unit (48) displaces the light emitting element (32). [Claim 10] Installation (202) for gas analysis according to claim 2, characterized in that the light receiving unit (41) has, in addition, a printed circuit board (46) or an amplifier (47) is provided to amplify an output signal from the light receiving element (42) and in that the actuating unit (48) moves the light receiving element (42) and the plate ( 46) with printed circuit. [Claim 11] Installation (202) for gas analysis according to any one of Claims 1 to 10, characterized in that the actuation unit (48) controls a vibration waveform indicating a position towards which the optical element is moved by a triangular wave. [Claim 12] Installation (202) for gas analysis according to any one of claims 1 to 10, characterized in that the actuation unit (48) controls a vibration waveform indicating a position towards which the optical element is moved, by a rectangular wave.
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    同族专利:
    公开号 | 公开日
    JP2019117147A|2019-07-18|
    CN109975240A|2019-07-05|
    FR3075961B1|2020-11-27|
    US20190195784A1|2019-06-27|
    US10677719B2|2020-06-09|
    DE102018218684A1|2019-06-27|
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    法律状态:
    2019-09-03| PLFP| Fee payment|Year of fee payment: 2 |
    2020-04-24| PLSC| Search report ready|Effective date: 20200424 |
    2020-08-25| PLFP| Fee payment|Year of fee payment: 3 |
    2021-09-03| PLFP| Fee payment|Year of fee payment: 4 |
    优先权:
    申请号 | 申请日 | 专利标题
    JP2017251920|2017-12-27|
    JP2017251920A|JP2019117147A|2017-12-27|2017-12-27|Gas analyzer|
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