• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    The invention is a gas sensor (1) comprising an enclosure (10) capable of receiving the gas (2), the sensor also comprising: ▪ a light source (11) capable of emitting a light wave (11 ') ) propagating in the enclosure according to a transmission cone (Ω1); ▪ a measuring photodetector (12) and a reference photodetector (13), each being able to detect a light wave emitted by the light source (11) and having passed through the enclosure; the sensor being such that the enclosure (10) extends between two transverse walls (21, 22) arranged one opposite the other, the transverse walls being connected to one another by a peripheral wall (30), extending between the transverse walls, about a longitudinal axis (Z), the peripheral wall (30) comprising: ▪ a first reflecting portion (31) adapted to receive a first portion of the cone of emission (Ω1) to reflect it to the photodetector measurement (3), thereby forming a cone (Ω2) said measuring, converging said photodetector measurement; A second reflective portion (32) adapted to receive a second portion of the emission cone (Ω1) to reflect it towards the reference photodetector (4), thus forming a so-called reference cone (Ω3) converging towards said photodetector reference.
    公开号:FR3063811A1
    申请号:FR1751976
    申请日:2017-03-10
    公开日:2018-09-14
    发明作者:Helene Duprez
    申请人:Elichens；
    IPC主号:
    专利说明:

    Description
    TECHNICAL AREA
    The technical field of the invention is an optical gas sensor, and more particularly a non-dispersive infrared sensor.
    PRIOR ART
    The use of optical methods for the analysis of a gas is quite frequent. Devices make it possible to determine the composition of a gas based on the fact that the species composing a gas have spectral absorption properties which are different from each other. Thus, knowing a spectral absorption band of a gaseous species, its concentration can be determined by an estimate of the absorption of light passing through the gas, using Beer Lambert's law. This principle allows an estimate of the concentration of a gaseous species present in the environment.
    The light source is usually a source emitting in the infrared, the method used being usually designated by the Anglo-Saxon term NDIR detection, the acronym NDIR meaning Non Dispersive Infra-Red. Such a principle has been frequently implemented, and is for example described in numerous documents, for example in US5026992 or WO2007064370.
    According to the most common methods, the gas analyzed extends between a light source and a photodetector, called a photodetector, the latter being intended to measure a light wave transmitted by the gas to be analyzed, and partially absorbed by the latter. The methods generally include a measurement of a light wave, known as a reference light wave, emitted by the source, and not absorbed by the gas analyzed.
    The comparison between the light wave in the presence of gas and the light wave without gas makes it possible to characterize the gas. This involves, for example, determining a quantity of a gaseous species in the gas, according to the technology designated by the term NDIR by absorption. It may also be a question of estimating an amount of particles in the gas, by detecting a light scattered by the latter according to a predetermined angular range of diffusion.
    The reference light wave is measured by a reference photodetector. It may be a reference photodetector different from the measurement photodetector, and arranged so as to be arranged facing the light source, the reference photodetector being associated with an optical reference filter. The reference optical filter defines a reference spectral band, in which the gas to be analyzed does not exhibit significant absorption.
    The documents EP2711687 and EP2891876 describe gas sensors comprising enclosures, in which one or more mirrors are arranged. The mirrors make it possible to maximize the path of the light in the enclosure, and to focus the light rays having crossed the gas on the photodetector (s). This allows the detection sensitivity to be increased while using compact devices.
    The objective of the invention is to propose a gas sensor with optimized performance, in particular favoring compactness and sensitivity.
    STATEMENT OF THE INVENTION
    A first object of the invention is a gas sensor comprising an enclosure, capable of receiving the gas, the sensor also comprising:
    a light source, capable of emitting a light wave propagating in the enclosure according to an emission cone;
    a measurement photodetector and a reference photodetector, each being capable of detecting a light wave emitted by the light source and having passed through the enclosure;
    the sensor being such that the enclosure extends between two transverse walls, arranged one facing the other, the transverse walls being connected to one another by a peripheral wall, in particular cylindrical, extending, between the transverse walls, around a longitudinal axis, the peripheral wall comprising:
    a first reflecting portion, capable of receiving a first part of the emission cone to reflect it towards the measurement photodetector, thus forming a so-called measurement cone, converging on the measurement photodetector;
    a second reflecting portion, capable of receiving a second part of the emission cone to reflect it towards the reference photodetector, thus forming a so-called reference cone, converging towards the reference photodetector.
    According to one embodiment, the enclosure has at least one opening, formed in one of said transverse walls, and intended for the admission or evacuation of gas, the opening being formed, in said transverse wall, at outside of a projection, along the longitudinal axis, and on the transverse wall, of the emission cone and the measurement cone. The transverse walls are preferably reflective walls.
    Preferably, each opening allowing the evacuation or the admission of gas is also located outside a projection, along the longitudinal axis, of the reference cone. The enclosure may have two openings, each opening being formed in one of said transverse walls and being intended for the admission or evacuation of gas, each opening being located, on said transverse wall, outside of projections, according to the longitudinal axis, of the emission cone as well as of the measurement cone, and preferably of the reference cone.
    The transverse walls extend transversely to the longitudinal axis, preferably along a transverse plane, perpendicular to the longitudinal axis. They can be parallel to the transverse plane or substantially parallel to the latter. The term substantially means that an angular tolerance is allowed, for example +/- 20 ° or +/- 30 °.
    The first reflecting portion and the second reflecting portion can in particular be curved. They then describe, in the transverse plane, a curve, the curve being able to be a part of an ellipse or a parabola. The first reflecting portion can follow, in the transverse plane, a first ellipse, the sensor being such that the top of the emission cone is arranged in a first focus of the first ellipse. Preferably, the top of the measurement cone is arranged in a second focal point of said first ellipse, different from the first focal point. According to this arrangement, the first reflecting portion conjugates the light source with the measurement photodetector. The second reflecting portion can also follow, in the transverse plane, a second ellipse, the sensor being such that the top of the emission cone is arranged in a first focus of the second ellipse, and that the top of the reference cone is arranged in a second focus of the second ellipse, different from the first focus of said ellipse.
    The first ellipse may have a major axis extending in one direction, the emission cone extending around a central emission axis, the central emission axis being inclined relative to a direction orthogonal to the direction of the major axis, the angle of inclination being between 5 ° and 20 °.
    The measurement photodetector defines an optical axis, the optical axis preferably being inclined relative to a direction orthogonal to the direction of the major axis, the angle of inclination being between 5 ° and 20 °.
    The distance along the longitudinal axis between the two transverse walls defines a height of the enclosure, for example between lOOprn and 1 cm, and preferably between 500 pm and 1 cm.
    A second object of the invention is a gas detection device comprising several sensors according to the first object of the invention, the device being such that a first sensor and a second sensor are superimposed on each other, l the enclosure of a first sensor being disposed on the enclosure of a second sensor, such that an opening, formed in a transverse wall of the first sensor is connected to an opening formed in a transverse wall of the second sensor, so as to allow gas to flow between the two sensors, through said openings. A transverse wall of the first sensor, comprising an opening, is disposed facing a transverse wall of the second sensor, comprising an opening, so as to allow the circulation of gas through the openings formed in said transverse walls.
    Other advantages and characteristics will emerge more clearly from the description which follows of particular embodiments of the invention, given by way of nonlimiting examples, and represented in the figures listed below.
    FIGURES
    Figure 1 shows a diagram of the main components of an example gas sensor. Figures 2A and 2B show a section describing the geometry of the enclosure of the gas sensor shown in Figure 1, as well as the arrangement of the main components of the sensor.
    FIG. 2C shows an example of opening made in a transverse wall of the enclosure of the sensor. FIG. 2D represents another example of opening made in a transverse wall of the enclosure of the sensor.
    FIG. 3 represents a device obtained by assembling two sensors superimposed on each other.
    FIG. 4A illustrates two tilt angles having an influence on the amount of light detected by the measurement photodetector.
    FIG. 4B shows comparative tests, representing the amount of light detected by a photodetector as a function of an amount of carbon dioxide measured by the sensor, for different angle of inclination of the emission axis of the light source with respect to a direction normal to the major axis of an ellipse, called the first ellipse, and for different angles of inclination of the axis of the measurement photodetector relative to said major axis.
    FIG. 4C shows comparative tests, representing the quantity of light detected by a photodetector of a quantity of methane measured by the sensor, for different angles of inclination of the axis of emission of the light source with respect to a direction normal to the major axis of an ellipse, called the first ellipse and for different angles of inclination of the axis of the measurement photodetector relative to said major axis.
    FIG. 4D represents the change in the quantity of signal detected by the measurement photodetector for different angles of inclination of the emission axis of the light source with respect to a direction normal to the major axis of an ellipse, said first ellipse and for different angles of inclination of the axis of the measurement photodetector relative to said major axis.
    EXPLANATION OF PARTICULAR EMBODIMENTS
    FIG. 1 represents an example of a gas sensor according to the invention. The sensor comprises an enclosure 10, capable of receiving a gas to be analyzed. The enclosure is delimited by two walls 21, 22, called transverse walls, extending along a transverse plane XY. In Figure 1, there is shown a first transverse wall 21, the transverse wall 22 being shown in transparency so as to visualize the interior of the enclosure 10. The transverse walls 21 and 22 are shown in Figures 2C and 2D.
    The transverse walls may be parallel to the transverse plane XY, or substantially parallel to the latter, the term substantially indicating that an angular tolerance, for example +/- 20 ° or +/- 30 ° is allowed. They can be flat or curved.
    The enclosure also includes a wall 30, called the peripheral wall, delimiting the enclosure, and extending between the first transverse wall 21 and the second transverse wall 22. The peripheral wall 30 extends around a longitudinal axis Z, perpendicular to the transverse plane XY. The peripheral wall 30 takes the form of a cylindrical wall, the section of which, in the transverse plane XY, comprises curved portions 31, 32 and flat portions, as described in connection with FIGS. 2A and 2B. The curved portions can in particular be elliptical or parabolic. An elliptical portion follows, along the transverse plane XY, the outline of part of an ellipse. A parabolic portion follows, according to the transverse plane XY, the outline of part of a parabola.
    The gas sensor 1 comprises a light source 11, capable of emitting a light wave 11 'along an emission cone Ω1, the emission cone extending around an emission axis Δ1. The light source 11 is arranged at the top SI of the emission cone Ω1. The light source 11 is capable of emitting the light wave 11 ′, called the incident light wave, according to a spectral band of illumination Δ, the latter being able to extend between the near ultraviolet and the medium infrared, between 200 nm and 10 pm, and most often in the infrared, in particular between 1 μιη and 10 μιη. The light source 11 can in particular be pulsed, the incident light wave 11 ′ being a pulse of duration generally between 100 ms and 1 s. It may in particular be a light source of the suspended filament type, traversed by an electric current, and heated to a temperature between 400 ° C. and 800 ° C. so as to emit infrared light.
    The peripheral wall 30 has a first reflecting portion 31, configured to receive a first part of the emission cone Ω1, so as to reflect it towards a photodetector, called a measurement photodetector 12. In this way, part of the light wave 11 'located in the emission cone Ω1 is reflected towards the measurement photodetector 12. The light wave thus passes through the gas present in the enclosure 10, thus forming a transmitted wave 14 reaching the measurement photodetector 12 and detected by this latest. In the example considered, the photodetector 12 is a thermopile, capable of delivering a signal depending on the intensity of the light wave to which the photodetector is exposed. It can also act as a photodiode or another type of photodetector. The measurement photodetector 12 can be coupled to a bandpass filter 18, the spectral band of which corresponds to a spectral band of a gaseous species G s of which it is desired to determine an amount C s in the gas mixture. The intensity I of the light wave 14 + detected by the measurement photodetector 12 depends on the quantity C s according to the Beer Lambert relation:
    att = - = e ~ ^ Cs) l (1)
    To>
    or :
    - μ (C s ) is an attenuation coefficient, depending on the quantity C s sought;
    -1 is the thickness of gas crossed by the light wave in the enclosure;
    - I o is the intensity of the incident light wave, which corresponds to the intensity of the wave reaching the measurement photodetector 12 in the absence of absorbent gas in the enclosure.
    The comparison between I and I o , taking the form of a ratio -, corresponds to an attenuation att
    Io generated by the gaseous species considered.
    During each pulse of the light source 11, it is thus possible to determine μ (C s ), which makes it possible to estimate C s knowing that the relationship between C s and μ (C s ) is known.
    The term “reflecting wall” means a wall whose reflection coefficient, in all or part of the spectral band Δ of the light wave emitted by the source 11, is greater than 50%, and preferably greater than 80%. A reflective wall can be formed using a reflective material such as a metal, for example gold.
    Expression (1) supposes control of the intensity I o of the light wave emitted by the light source 11. For this purpose, the device comprises a reference photodetector 13, arranged so that it detects a light wave, called reference light wave ll re f, reaching the reference photodetector 13 without interacting with the gas present in the enclosure 10, or without significantly interacting with the latter. The peripheral wall for this purpose comprises a second reflecting portion 32, configured to receive a second part of the emission cone Ω1 emitted by the light source 11, so as to reflect it towards the reference photodetector 13. The intensity of the the reference light wave ll re f, detected by the reference photodetector 13, is designated by the term reference intensity I re f. In this example, the reference photodetector 13 is associated with an optical filter, called the reference optical filter 18 re f. The reference optical filter 18 re f defines a pass band corresponding to a range of wavelengths not absorbed by the sample. The reference bandwidth is for example centered around the wavelength 3.91 μm. The measurement of I re f allows the estimation of I o , which makes it possible to determine p (C s ), then to estimate C s . The measurement of I re f makes it possible in particular to take account of temporal variations in the intensity I o of the light wave emitted by the light source 11.
    In the example shown in FIG. 1, the light source 11, the measurement photodetector 12 and the reference photodetector 13 extend, at least partially inside the enclosure 10. According to variants, the light source 11, and / or the measurement photodetector 12 and / or the reference photodetector 13 are arranged outside the enclosure 10. Transparent windows or openings are then provided in the enclosure 10, so to allow light transmission on either side of the peripheral wall 30.
    FIG. 2A represents a cross section of the gas sensor represented in FIG. 1. The first portion 31 of the peripheral wall 30 receives a part of the emission cone Ω1 emitted by the light source and reflects it towards the photodetector 12 , according to a reflection cone Ω2, called a measurement cone. In the transverse plane XY, the first portion 31 follows the outline of an ellipse portion, called the first ellipse, defining a major axis extending in a direction 31A. The light source 11 is disposed at a first focus of the first ellipse, while the measurement photodetector 12 is disposed at a second focus of the first ellipse. Figure 2A includes a template defining a scale.
    As previously indicated, the peripheral wall 30 comprises a second reflecting portion 32, configured to receive a second part of the emission cone Ω1, so as to reflect it towards the reference photodetector 13, according to a reflection cone Ω3, called the cone of reference. The reference cone is shown in Figure 2B. In the transverse plane XY, the second portion 32 follows the contour of an ellipse portion, called the second ellipse, defining a major axis extending in a direction 32A. The light source 11 is disposed at a first focus of the second ellipse, while the reference photodetector 13 is disposed at a second focus of the second ellipse.
    Preferably, whatever the embodiment, the curved portions 31 and 32 are arranged to combine the light source 11 respectively with the measurement photodetector 12 and with the reference photodetector 13. Thus, the measurement cone Ω2 and the measurement cone reference Ω3 converge respectively on the measurement photodetector 12 and on reference photodetector 13. According to such an arrangement, the measurement photodetector 12 is arranged at the top S2 of the measurement cone Ω2, the reflection photodetector 13 being disposed at the top S3 of the cone Ω3. Such an arrangement makes it possible to optimize the quantity of light detected by each photodetector, and consequently to improve the sensitivity of the sensor. It is specified that the portions 31 and 32 can also be parabolic, or form plane facets, the set of facets describing, according to the longitudinal plane XY, part of a curve, for example a parabola or an ellipse.
    Preferably, the light source 11 is arranged so that the distance, in the transverse plane XY, separating it from each point of the first portion 31, is greater than or equal to the distance separating the focal points of the first ellipse, this distance being usually noted 2c, c denoting the distance between a focal point of the ellipse and its center. Similarly, the light source is arranged so that the distance, in the transverse plane XY, separating it from each point of the second portion 32 is greater than or equal to the distance separating the focal points of the second ellipse. This condition improves the amount of light detected by each photodetector.
    Preferably, the directions of the major axis of the first ellipse and the major axis of the second ellipse are intersecting and form an angle θ less than or equal to 90 °, this angle θ being shown in Figure 2B. In this example, θ = 70 °.
    In the example shown, the first ellipse and the second ellipse have the geometric characteristics indicated below.
    First ellipse (first elliptical portion 31): length of the major axis: 12.3 mm; length of minor axis: 11.9 mm;
    distance between the focal point of the ellipse and the center of the long axis: 3 mm.
    Second ellipse (first elliptical portion 32): length of the major axis: 12.75 mm; length of minor axis: 11.9 mm;
    distance between the focal point of the ellipse and the center of the long axis: 4.6 mm.
    In this example, the peripheral wall 30 extends, along the longitudinal axis Z, at a height h equal to 1.2 mm.
    In addition to the elliptical portions 31 and 32, the peripheral wall 30 includes:
    a third flat portion 33, against which the reference photodetector 13 is disposed, the optical axis Δ3 of the reference photodetector 13 preferably being orthogonal to the third portion 33;
    a fourth flat portion 34, against which the light source 11 is arranged, the central axis Δ1 of the emission cone Ω1 preferably being orthogonal to the fourth portion 34;
    a fifth flat portion 35, against which the measurement photodetector 12 is arranged, the optical axis Δ2 of the measurement photodetector 12 being preferably orthogonal to the fifth portion 35.
    The third portion 33 and / or the fourth portion 34 and / or the fifth portion 35 are preferably reflective. As previously indicated, these portions may include an opening or a transparent window when an element such as a photodetector, or the light source 11, is placed outside the enclosure 10.
    The enclosure 10 has an intake opening 23, allowing the admission of gas into the enclosure as well as an exhaust opening 24, allowing the evacuation of the gas from the enclosure. The positioning of the openings. These openings are formed on one of the transverse walls 21 or 22, as shown in FIGS. 2C and 2D, or on each transverse wall.
    The position of the openings on the transverse walls is not indifferent and it was felt that it was preferable to arrange these openings so that the respective projections, along the longitudinal axis Z, of the emission cone Ω1 and the cone Ω2, are located outside each opening. Thus, each intake 23 or discharge 24 opening is formed in a transverse wall so as to extend outside the projections, on said wall, of the emission cone Ω1 and of the measurement cone Ω2 . Such positioning makes it possible to limit the impact of the opening on the detection carried out by the measurement photodetector 12. Preferably, each inlet or outlet opening is also arranged so as to also extend outside. of the projection, along the longitudinal axis Z, of the reference cone Ω3. This makes it possible to limit the impact of the opening on the detection carried out by the reference photodetector 13.
    In FIGS. 2A and 2B, there are shown, in gray, parts of the enclosure 10 plumb with which can be formed inlet or outlet openings 23, 24, in the transverse walls 21 or 22. FIG. 2C represents a sectional view of the enclosure 10, the transverse walls being spaced from each other by a height h of, for example, between 100 μm and 1 cm and preferably 500 μm and 1 cm. This section is taken in the direction A1 shown in FIG. 2B, and makes it possible to see the location of the opening 23 made in the second transverse wall 22. FIG. 2D represents another view in section of the enclosure 10, produced in the direction A2 shown in FIG. 2B, and making it possible to observe the opening 24 made in the second transverse wall 22.
    The arrangement of the inlet or outlet openings in the transverse walls makes it easier to connect the sensor 1 to a fluid inlet or outlet gas circuit. When an opening 23 is made in the first transverse wall 21 and another opening 24 is made in the second transverse wall 22, it is possible to superimpose two enclosures one on the other, so as to form a device detection comprising at least two 1.1 ′ sensors as previously described. Such a device is shown in FIG. 3. The detection device is arranged so that two enclosures 10, 10 ′ of each sensor are superimposed on each other, a second transverse wall 22 of a first enclosure 10 being assembled to a first transverse wall 21 'of a second enclosure 10', the latter extending between two transverse walls 21 ', 22'. Thus, the gas to be analyzed 2 can flow from one sensor to another through the openings made in each transverse wall. In this figure, the displacement of the gas is illustrated by an arrow. Such a configuration makes it possible to have several sensors superimposed on each other, each sensor being dedicated to the detection of a predetermined gaseous species.
    Furthermore, independently of the position of the intake and exhaust openings described in the preceding paragraphs, it has been found that the position of the light source 11, and more precisely the inclination of the central axis Δ1 of the cone d the emission Ω1 has an influence on the quantity of light detected by the measurement photodetector 12. This is also the case for the inclination of the optical axis Δ2 of the measurement photodetector. This effect is illustrated in Figures 4A to 4C. FIG. 4A represents a tilt angle ai extending between:
    a direction 31Ά, orthogonal to direction 31A of the major axis of the first ellipse, defined by the first portion 31, and the central axis Δ1 of the emission cone Ω1.
    It has been shown, on the basis of simulations, that the inclination angle ai thus defined has an influence on the quantity of light collected by the measurement photodetector 12, according to the arrangement described above. Preferably, this angle is between 5 ° and 20 °, and more preferably between 12 ° and 18 °, or around 15 °.
    FIG. 4A also shows the angle of inclination a2 between the previously defined direction 31Ά and the axis Δ2 of the measurement photodetector 12. Like the inclination angle ai, the angle a2 is preferably between 5 ° and 20 °, and more preferably between 10 ° and 18 °, or around 15 °.
    Simulations were carried out so as to compare the quantity of light received by the measuring photodetector 12 as a function for three values of the angle of inclination ai, respectively equal to 10 °, 15 ° and 25 °, as well as for two values of the angle of inclination a2, respectively equal to 15 ° and 25 °. FIG. 4B represents a change in the quantity of light detected by the measurement photodetector 12 as a function of the concentration in ppm of carbon dioxide in the enclosure 10. The quantity of light detected by the photodetector is expressed in Volts, the photodetector modeled being a thermopile. The three configurations tested are as follows:
    configuration a: ai = 10 °, a2 = 15 °; configuration b: ai = 15 °, a2 = 15 °; configuration c: ai = 25 °, a2 = 25 °.
    Angle values ai = 10 °, a2 = 25 ° (configuration a) or ai = 15 °, a2 = 15 ° (configuration b), make it possible to increase the quantity of light detected, compared to angles ai = 25 °, a2 = 25 ° (configuration c). The curves corresponding to configurations a and b are combined.
    The same conclusion can be drawn from FIG. 4C, representing the quantity of light detected by the measurement photodetector 12 as a function of the methane concentration in the enclosure 10, according to two configurations:
    configuration d: ai = 15 °, a 2 = 15 °;
    - configuration e: ai = 25 °, a 2 = 25 °.
    Configuration d is preferable to configuration e.
    FIG. 4D represents the percentage of light, emitted by the source, detected by the measurement photodetector 12 according to different combinations ai (abscissa) a 2 (ordinates). The percentage is represented in gray levels.
    The preferred range is surrounded by clear dashes.
    The invention can be used for gas sensors in various fields, for example the environment, in particular the control of atmospheric pollution, industry, for example the chemical, petroleum or food industry, or health.
    权利要求:
    Claims (10)
    [1" id="c-fr-0001]
    1. Gas sensor (1) comprising an enclosure (10), capable of receiving the gas (2), the sensor also comprising:
    a light source (11), capable of emitting a light wave (11 1 ) propagating in the enclosure according to an emission cone (Ω1);
    a measurement photodetector (12) and a reference photodetector (13), each being capable of detecting a light wave emitted by the light source (11) and having passed through the enclosure;
    the sensor being such that the enclosure (10) extends between two transverse walls (21, 22), arranged one facing the other, the transverse walls being connected to each other by a peripheral wall (30), extending, between the transverse walls, around a longitudinal axis (Z), the peripheral wall (30) comprising:
    a first reflecting portion (31), capable of receiving a first part of the emission cone (Ω1) to reflect it towards the measurement photodetector (3), thus forming a so-called measurement cone (Ω2), converging on the photodetector of measure; a second reflecting portion (32), capable of receiving a second part of the emission cone (Ω1) to reflect it towards the reference photodetector (4), thus forming a cone (Ω3) called reference, converging towards the photodetector of reference;
    the enclosure comprising at least one opening (23), formed in one of said transverse walls (21, 22), and intended for the admission or the evacuation of gas (2), the opening being formed, in said wall transverse, outside a projection along the longitudinal axis (Z), and on said transverse wall, the emission cone (Ω1) and the measurement cone (Ω2).
    [2" id="c-fr-0002]
    2. Sensor according to claim 1, wherein the opening is also located outside of a projection, along the longitudinal axis (Z), and on said transverse wall, of the reference cone (Ω3).
    [3" id="c-fr-0003]
    3. Sensor according to claim 1 or claim 2, wherein the enclosure (10) has two openings, each opening being formed in one of said transverse walls (21, 22) and being intended for admission or evacuation gas (2), each opening being located, on said transverse wall, outside of projections, along the longitudinal axis (Z), of the emission cone (Ω1) as well as of the measurement cone (Ω2).
    [4" id="c-fr-0004]
    4. Sensor according to any one of claims 1 to 3, wherein the transverse walls (21, 22) extend along a transverse plane (XY), perpendicular to the longitudinal axis (Z).
    [5" id="c-fr-0005]
    5. Sensor according to any one of the preceding claims, in which the first reflecting portion (31) follows, in a transverse plane (XY), perpendicular to the longitudinal axis (Z), a first ellipse, the sensor being such that the apex (SI) of the emission cone (Ω1) is arranged in a first focus of the first ellipse.
    [6" id="c-fr-0006]
    6. The sensor as claimed in claim 5, in which the apex (S2) of the measurement cone (Ω2) is arranged in a second focal point of said first ellipse.
    [7" id="c-fr-0007]
    7. A sensor according to any one of claims 5 and 6, wherein the second reflecting portion (32) follows, in the transverse plane (XY), a second ellipse, the sensor being such that the apex (SI) of the cone d the emission (Ω1) is arranged in a first focus of the second ellipse, and that the vertex (S3) of the reference cone (Ω3) is arranged in a second focus of the second ellipse.
    [8" id="c-fr-0008]
    8. Sensor according to any one of claims 5 to 7, in which the first ellipse has a major axis extending in a direction (31A), the emission cone (Ω1) extending around a central axis emission (Δ1), the central emission axis being inclined relative to a direction orthogonal (31Ά) to the direction of the major axis, the angle of inclination (al) being between 5 ° and 20 °.
    [9" id="c-fr-0009]
    9. Sensor according to any one of claims 5 to 8, in which the first ellipse comprises a major axis (31A), the measurement photodetector defining an optical axis (Δ2), the optical axis being inclined relative to a direction orthogonal (31Ά) to the direction of, the angle of inclination (a2) being between 5 ° and 20 °.
    [10" id="c-fr-0010]
    10. A device for detecting a gas, comprising a first sensor (1) according to any one of the preceding claims and a second sensor (I 1 ) according to any one of the preceding claims (I 1 ), the first sensor and the second sensor being superimposed on each other, so that a transverse wall (22) of the first sensor, comprising an opening (24), is disposed facing a transverse wall (21 ') of the second sensor, having an opening (23 '), so as to allow a gas circulation (2) through the openings formed in said transverse walls.
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    同族专利:
    公开号 | 公开日
    FR3063811B1|2021-08-27|
    EP3593119B1|2021-04-28|
    WO2018162848A1|2018-09-13|
    EP3593119A1|2020-01-15|
    CN110383043A|2019-10-25|
    US20210055212A1|2021-02-25|
    JP2020510223A|2020-04-02|
    US11022547B2|2021-06-01|
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    法律状态:
    2018-03-19| PLFP| Fee payment|Year of fee payment: 2 |
    2018-09-14| PLSC| Search report ready|Effective date: 20180914 |
    2020-04-01| PLFP| Fee payment|Year of fee payment: 4 |
    2021-03-23| PLFP| Fee payment|Year of fee payment: 5 |
    优先权:
    申请号 | 申请日 | 专利标题
    FR1751976|2017-03-10|
    FR1751976A|FR3063811B1|2017-03-10|2017-03-10|OPTICAL GAS SENSOR|FR1751976A| FR3063811B1|2017-03-10|2017-03-10|OPTICAL GAS SENSOR|
    EP18713317.8A| EP3593119B1|2017-03-10|2018-03-07|Optical gas sensor|
    US16/492,802| US11022547B2|2017-03-10|2018-03-07|Optical gas sensor|
    CN201880015979.6A| CN110383043A|2017-03-10|2018-03-07|Optical gas sensor|
    PCT/FR2018/050524| WO2018162848A1|2017-03-10|2018-03-07|Optical gas sensor|
    JP2019571111A| JP2020510223A|2017-03-10|2018-03-07|Sensors and devices|
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