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    • 专利摘要:
    Method and system for the identification of particles based on multi-frequency measurements of resonant plates. The invention relates to a method of identifying adsorbates deposited on resonant plates, where said method comprises performing the following steps: i) a candidate mass and position of the adsorbate is calculated, neglecting the effect of stiffness from the measurement of plate frequencies and prior knowledge of plate mass; ii) the calculated values are used as the starting point to calculate the final values of mass, position of the adsorbate and the different stiffness coefficients from the measurement of the plate frequencies; iii) the values of the adsorbate candidate mass and the calculated coefficients are compared with a set of previously stored reference values, corresponding to a catalog of known adsorbates; The adsorbate deposited on the plate is identified as that belonging to the catalog that presents the greatest similarity with the values obtained. (Machine-translation by Google Translate, not legally binding)
    公开号:ES2776702A1
    申请号:ES201930073
    申请日:2019-01-31
    公开日:2020-07-31
    发明作者:Martinez José Jaime Ruz；Vidal Oscar Malvar；Eduardo Gil-Santos；Gomez Montserrat Calleja；De Miguel Francisco Javier Tamayo
    申请人:Consejo Superior de Investigaciones Cientificas CSIC；
    IPC主号:
    专利说明:

    [0002] METHOD AND SYSTEM FOR THE IDENTIFICATION OF PARTICLES BASED ON MULTIFREQUENCY MEASUREMENTS OF RESONANT PLATES
    [0004] FIELD OF THE INVENTION
    [0006] The present invention is part of the technical field corresponding to the identification technologies of micro and nano-sized particles, through indirect measurement and characterization procedures. More specifically, the invention relates to a method and a system for identifying and classifying individual particles, based on the changes in the different resonance frequencies of thin plate-like structures on which they are deposited. These changes in the resonance frequencies of the plates are produced by the adsorption of the particle to be detected on its surface.
    [0008] BACKGROUND OF THE INVENTION
    [0010] The resistance that a given body offers to deformations depends on different factors, including mainly Young's modulus, as well as the shape and type of deformation experienced. This fact suggests the possibility of studying and identifying individual particles by deforming them in different ways and observing the resistance they offer to the deformation exerted. The information that is obtained from the particle by deforming it can be extremely valuable on certain scales, such as the nano scale. For example, biological organisms, such as viruses, are known to vary in rigidity according to their stage of maturation. Also, some studies indicate that cancer and metastatic cells are softer than healthy cells, which helps them migrate to other parts of the body more easily. It is also known that the human immunodeficiency virus, for example, reduces its stiffness during the maturation process, as a trigger mechanism for infection. These are some examples of the importance of stiffness in biological entities, but of course there are many more.
    [0012] In this context, the detection and identification of species has now become a very active field in multiple research areas, such as chemistry, biology or environmental sciences, as well as in medicine, safety and health. During the last decades, mass spectrometry (MS) has been gaining popularity and is now clearly the main tool for the identification of species in a sample. Thus, as a consequence of the potential of this technique, numerous variants have been developed of MS to meet different needs, and today the number of MS applications is greater than ever and growing.
    [0014] Mass spectrometers need to fragment and ionize large molecular assemblies into smaller ones that are subsequently detected, obtaining information on the mass-charge relationship of each individual fragment. The result is a mass / charge spectrum that can be analyzed and compared with a database, to know the composition of the original sample and allow its identification. MS has a really high resolution and good efficiency for species with relatively small masses. However, measuring large particles is a real challenge for this technique, because these particles can acquire very different states of charge, broadening the peaks of the spectrum obtained and making it very complex and, therefore, difficult to interpret. Furthermore, the detectors commonly used in this field, such as microchannel plates, have low detection efficiencies for high mass ions. In this sense, nanoelectromechanical systems (NEMS) have recently been proposed as a new variant of mass spectrometry that overcomes the problem of measuring large particles. NEMS-based sensors have been developed and studied for decades and have been proposed in the literature in many different forms and applications, demonstrating their potential as ultra-sensitive mass sensors with unprecedented mass resolution. The main operating principle of NEMS as mass sensors is that each time a particle is deposited on its surface, its resonance frequencies change by an amount that is proportional to the mass of the analyte. This effect is completely independent of the particle's state of charge, which makes NEMS-based EM very suitable for measuring neutrally charged particles, such as viruses or bacterial cells close to their native state, since strong ionization could cause major changes in its biological structure. Another advantage of this technique is that the results are much easier to interpret, since they directly measure the mass of the particles and not the mass-charge spectrum.
    [0016] In addition to mass, it has been shown that NEMS can also be used to obtain information on the stiffness of the analyte that is related to its internal structure and composition. It is evident that this fact will improve the potential of NEMS-based MS because the possibility of extracting two orthogonal coordinates (mass and stiffness) will notably improve the distinguishing ability of detection systems based on this technique. In this sense, some lever or “cantilever” type resonators (from its English term) have already been used as detectors of the nanomechanical mass and stiffness spectrometry (MS-NS), with which, for example, the Young's modulus of E. coli bacteria has been successfully measured.
    [0018] As mentioned, the information on the stiffness of the analyte is very useful and clearly represents a potential improvement over known MS techniques. In this area, the most widely used technique to study the stiffness of a sample is atomic force microscopy. However, this technique is tedious as it is time consuming and really invasive. Therefore, in the field of the invention there is currently the need to develop new methods that allow deforming nano-sized particles in a controllable, reliable, fast and non-invasive way, extracting all the possible information from said deformation, for identification purposes and characterization of said particles.
    [0020] The present invention provides a solution to this need, by means of a novel method for the identification of particles based on the change in the frequency of different modes of vibration of a plate due to the rigidity of the adsorbed particle. The method is completely valid for any geometry of the plate and for any mode of vibration, in or out of the plane, and opens the door to new applications in spectrometry of biological entities, as well as to the identification of nanoparticles with excellent precision. The invention thus proposes a general technique for the precise identification of particles, based on the frequency changes of the different modes of vibration of the plates due to the mass and rigidity of the adsorbed particle. Furthermore, the technique can be used very effectively even to distinguish particles with the same mass and Young's modulus, but with a different shape, thus providing a powerful new tool for studying the stiffness of individual biological entities as well. as for the precise identification of particles in nanomechanical spectrometry.
    [0022] BRIEF DESCRIPTION OF THE INVENTION
    [0024] A first object of the present invention relates, as described in the preceding section, to a method for identifying an adsorbate (expression to be used hereinafter to designate any particle or substance to be identified) of mass Ma , deposited on a plate of mass Mp, where said plate comprises a set of vibration modes and where, for said modes, its corresponding resonance frequency f0 is shifted by a certain amount Af when the adsorbate is deposited in an adsorption position (x0 , y0) of it.
    [0025] Advantageously, said method comprises carrying out the following steps:
    [0026] - a candidate mass and position of the adsorbate is calculated from the measurement of the change in frequency of a plurality of vibration modes of the plate and previous knowledge of the mass of the plate Mp. In this first step, the effect of stiffness is preferably neglected in such a way that the change Af is given in the form:
    [0029] where ü and V are the dimensionless displacements along a system of axes in the plane of the plate, and W the dimensionless displacement along the axis perpendicular to the plane of the plate.
    [0030] - the calculated values are used as a starting point to calculate the final values of mass M'a, position of the adsorbate and the different stiffness coefficients and 'depending on the mechanical properties and the geometry of the adsorbate and the geometry of the plate a starting from the measurement of the change in frequency of various modes of vibration of the plate (in this case the stiffness is not neglected) and using the deformation energy Ua of the adsorbate as a function of the strain tensor at the adsorption position, £ xx, yy, xy (x0, i), obtained from the displacement (ü, V, W) in the plane (x, y) defined by the plate for a subset of resonant modes,, in the form:
    [0031] Ua ~ Y x £ xx (x0, y0) Y y £ yy (x0, y0) Y xxyy £ xx (x0, y0) £ yy (x0, y0) Y xy £ xy (x0, y0) Y xxxy £ xx ( x0, y0) £ xy (x0, y0) Y yyxy £ yy (x o , y o ) £ xy (x o , y o );
    [0032] - the values of the candidate mass of the adsorbate M'a and of the coefficients y 'calculated in the previous step are compared with a set of reference values {MaD, ( y ') d} that are calculated from the transformation to reference system of the plate of previously stored values, corresponding to a catalog of known adsorbates deposited on the plate with a certain orientation in a reference plane (x ', y');
    [0033] - The adsorbate deposited on the plate is identified as that belonging to the catalog whose values M 'a y y' show the greatest similarity with the values {MaD, (y ') d}.
    [0035] This achieves a method that allows identifying both the mass of the deposited adsorbate and its shape and orientation in three-dimensional space, unlike other known techniques that only allow calculating the mass, and / or two-dimensional projections and, therefore, restricted from the form of said adsorbate. The present technique allows, therefore, to discriminate between particles that can have different sizes, but whose projection is identical in a detection plane (for example, with current techniques it would not be possible to distinguish the shape of a disk from that of a rectangular plate, in the case of an elevation projection).
    [0037] In a preferred embodiment of the method of the invention, the components and measurements in the reference system of the plate are related to the components and measurements in the adsorbate reference system (those that appear in the catalog) that is rotated one angle 0 around the z axis, using the expression:
    [0042] In another preferred embodiment of the method of the invention, the resonant vibration modes comprise out-of-plane and / or in-plane modes of vibration.
    [0044] In another preferred embodiment of the method of the invention, only resonant vibration modes are selected that undergo a negative change in frequency with adsorbate deposition.
    [0046] In another preferred embodiment of the method of the invention where N> 2 modes are measured in total, and M is the set of said modes with negative frequency change, to calculate the adsorption position in the first step the following function is minimized:
    [0050] where 5fm is the relative frequency shift of the m-th mode measured experimentally, and where:
    [0052]
    [0057] dn2 = ün (x0, y0) 2 vn (x0, y0) 2 wn (x0, y0) 2 is the square of the total displacement of the plate, and the values (x0, y0) and Q that minimize the function F0 (x , and) are the first estimate of the adsorption position.
    [0058] In another preferred embodiment of the method of the invention, the comparison of the values of the candidate mass of the adsorbate M'a and of the coefficients y 'with the set of reference values {MaD, (y') D} is calculated using the similarity estimator I (0):
    [0062] where the superscript D refers to the values of the adsorbate catalog. The value 0 that minimizes I (0) is the most probable value of the adsorbate orientation.
    [0064] In another preferred embodiment of the method of the invention, the adsorbates are inorganic particles, viruses, bacteria, proteins and / or cells.
    [0066] A second object of the invention refers to a system for identifying an adsorbate of mass Ma deposited on a plate of mass Mp, where said plate comprises a plurality of vibration modes and where, for each of said modes, its frequency of The corresponding resonance f0 is displaced by an amount Af as a function of the displacement (Q, V, W) of the plate in the corresponding vibration mode, when the adsorbate is deposited in an adsorption position (x0, y0) of the same, where said system comprises:
    [0067] - one or more plates;
    [0068] - means for deposition of one or more adsorbates on the plates (for example, said means may comprise one or more vacuum chambers and an ionization and / or electrospray system, in charge of spraying the samples on the plates); and - means for measuring the displacement of the resonance frequency when the adsorbate is deposited on one of the plates, for a plurality of vibration modes thereof (for example, said means may comprise piezoelectric materials to perform frequency scanning and / or one or more phase tracking loops, or PLLs; and one or more lasers focused on the plates, and configured to emit a beam on them, which is received by a photodetector and subsequently amplified for reading).
    [0070] Advantageously, said system comprises data recording and processing software and hardware means, configured to read the data generated by the measurement means, and to store a set of reference values {Ma, y}, corresponding to a catalog of known adsorbates deposited on the plate with a certain orientation in a reference plane (x ', y'), the software media being and hardware additionally configured to perform an adsorbate identification method according to any of the embodiments described herein.
    [0072] In a preferred embodiment of the system of the invention, said system comprises a mass spectrometer.
    [0074] A third object of the invention refers to a computer program that incorporates a plurality of steps of a method according to any of the embodiments of the present document, which can be implemented through the software and hardware means for recording and processing data of a system according to any of the embodiments described herein.
    [0076] The objects of the present invention also relate to the methods, systems, and software program described in the claims of the present application.
    [0078] DESCRIPTION OF THE DRAWINGS
    [0080] Figure 1 shows a schematic of a plate with an adsorbate on top. The reference frame of the plate is represented as ( x, y, z) and the reference frame of the adsorbate as ( x ', y', z '). The latter is rotated an angle d relative to the former.
    [0082] Figure 2 shows lever-type plate geometries and six different adsorbate configurations used for a proof of concept of the method of the invention, in a preferred embodiment thereof. In the figure, the mesh used for the numerical calculations of the corresponding FEM simulations has also been represented.
    [0084] Figure 3 shows finite element simulations of the first twelve out-of-plane vibration modes of the square-shaped lever-type plate with a Poisson's ratio of 0.28, as well as the ratio of each frequency to the fundamental frequency of the plate.
    [0086] Figure 4 shows results of the identifications obtained after applying the identification method of the invention, according to a preferred embodiment thereof, as a function of the adsorption position. The darker regions represent the positions where the identification is incorrect and the lighter regions represent the positions where the identification is successful. It can be seen that, for square, cubic, and bar shapes, the The identification is correct for most of the plate, but at positions very close to the corners or edges of the plate the identification is in error. For the case of the disc, the successful identification area is not as successful as for the other particles due to the great similarity between the stiffness parameters of the disc and the square.
    [0088] DETAILED DESCRIPTION OF THE INVENTION
    [0090] As described in the section corresponding to the background of the invention, a plate of arbitrary geometry can vibrate with very different modes and frequencies. When classifying these vibrations into different categories, a distinction is usually made between "out-of-plane" vibrations and "in-plane" vibrations. Out-of-plane vibrations are those for which the main displacement takes place perpendicular to the plane of the plate, and where other types of displacements are negligible. On the other hand, when the main displacements occur in the same plane as the plate, we refer to an in-plane mode of vibration. The bending and torsional modes of lever-type plates are examples of out-of-plane modes, while the radial breathing modes of disc-type plates are examples of in-plane vibration modes. In general terms, and as shown in Figure 1, it is possible to define a coordinate system where the x and y directions are in the plane of the plate and the z direction is perpendicular to the plane of the plate. In this system, the displacement of each point on the plate in the x, y, and z directions can be described by a set of functions u ( x, y ), v ( x, y ), and w (x, y ), respectively. For out-of-plane modes, u ( x, y ) and v ( x, y) are much smaller than w ( x, y), these can be neglected while, for in-plane modes, w ( x, y ) is much smaller than u ( x, y) and v ( x, y), which can be neglected. The frequencies and shapes of the vibration modes of the plate depend on its geometry and its mechanical properties. Also, for a given vibration mode, the frequency corresponding to that mode can be obtained using the Rayleigh-Ritz method, which basically states that the average kinetic energy per cycle of oscillation must be equal to the average deformation energy per cycle of oscillation. Whatever the nature of the oscillation, when a small particle adsorbs on the surface of the plate, two different effects arise:
    [0091] (i) the total mass of the system increases and, therefore, the frequency must decrease to keep constant the average kinetic energy per oscillation cycle; and
    [0092] (ii) As the particle is in contact with the surface of the plate, it deforms together with the plate and therefore increases the average deformation energy per oscillation cycle. To maintain the correct balance between the mean and deformation, the frequency of the system should increase accordingly. Simply put, the mass of the particle causes the frequency to decrease and the stiffness of the particle causes the frequency to increase.
    [0094] Taking these effects into account and assuming that the size of the particle is much smaller than the size of the resonator, the relative frequency change can be expressed as:
    [0096]
    [0097] where T is the mean kinetic energy per cycle of oscillation, U is the average strain energy per cycle of oscillation, and the subscripts p and a correspond to plate and adsorbate, respectively. The effect of particle mass on the resonant frequencies of the plate corresponds to the kinetic energy part of Equation 1.
    [0099] The kinetic energy Tp of the plate can be expressed as:
    [0101] Tp = -2An2 ^ n2Mp , (Eq.2) where M is the mass, is the angular frequency of vibration of the plate and An is an arbitrary amplitude. Assuming that the particle is much smaller than the plate, the displacement along the particle can be considered constant, therefore we can express the kinetic energy of the adsorbate as:
    [0102] Ta = ~ An 2 Mn 2 Ma ( u ( x 0 , i ) 2 + v ( x 0 , y 0 ) 2 + w ( x 0 , y 0 ) 2 ) , (Eq. 3) where u , v and w are the non-dimensional displacement of the corresponding vibration mode and (x0, y0) are the coordinates of the adsorption position on the plate. Using Equation 1 we can finally express the effect of the adsorbate mass on the resonant frequency of the plate as:
    [0104] tÍ = 2 Mp (ü (Xo'y °) 2 V ( x °, y °) 2 ® ( x °, y °) 2) . (Eq. 4)
    [0106] The deformation of the plate when it is vibrating is transferred to the adsorbate that is deposited on its surface. The contact surface between the adsorbate and the plate plays a crucial role in the transmission of deformation. The deformation implies, a spatial variation of the displacements and, therefore, a contact area that is, for example, very narrow in x, can hardly transfer deformation in said x direction, because the displacements are constant for all practical purposes in such a tight space. This implies that, for a contact surface that is perpendicular to the z direction, none of the z components of the strain will be transferred to the
    [0109] adsorbate. Given the state of the deformation in the plane of the plate at the adsorption position sxx (x0, y0), £ yy (x0, y0) and £ xy (x0, y0), the final state of deformation within the adsorbate will be proportional only at these three amounts. The constants of proportionality will depend on the geometry of the adsorbate and also on the nature of the mode of vibration. Because the thickness of the plate is considered small compared to its other dimensions, the mechanical state of the plate can be described by approximating the plane stress, and the mean strain energy of the plate can be expressed as:
    [0113] where E and v are Young's modulus and Poisson's ratio of a perfectly isotropic material. If the material is elastically anisotropic, Equation 5 above must be transformed according to the stress-strain relationships of the anisotropic material. The stress energy within the adsorbate is quadratic with the strain. As mentioned above, the deformation of the adsorbate is proportional to the components in the plane of the plate deformations at the point of adsorption and therefore a general expression of the deformation energy within the adsorbate is:
    [0115] Ua Yx ^ xx (Ao <y0) Yy ^ yy (Ao < Yo) + Yxxyy ^ xx (Ao < Yô ^ yy (Ao < Yo ) Yxy ^ xy (Ao < Yo )
    [0116] Yxxxy ^ xx ( x0, I) £ Xy ( X0, I) YyyxyZyy (* 0, I) £ Xy (* 0, I), (Eq. 6)
    [0118] where the coefficients and are constants that depend on the mechanical properties and the geometry of the adsorbate and the geometry of the plate. A key feature of Equation 6 is that the coefficients and are completely independent of adsorption position and vibration mode and are therefore excellent candidates for accurate adsorbate identification, in other words they make up a "fingerprint "Of adsorbate stiffness, which can be determined experimentally. However, since these coefficients depend on the geometry of the adsorbate, in a general case, they will change if the orientation of the adsorbate is different with respect to the coordinate system in which it is defined. the mode and therefore the deformations. So, to shape said fingerprint univocally for the adsorbate, the actual orientation must be resolved. This can be done if we define said fingerprint in a fixed reference system for the adsorbate (for example, a reference system as shown in Figure 1). This can be done, for example, by applying a rotation to the tension tensor. New coefficients y ' measured in the plate's reference frame are related to the unique set of coefficients and defined in the adsorbate-fixed reference frame as follows:
    [0119]
    [0122] where Q is the angle between the two coordinate systems (see Figure 1). Thus, the set of coefficients [yx, yy, yxy, yxxyy, yxxxy, and yyxy} will be used in the present invention as a single fingerprint of the adsorbate. By studying Equation 7 above there are some consequences that can be deduced. For example, the projection of a regular adsorbate in the plane of the plate has two orthogonal lines of symmetry (this is a good approximation in the case of most of the adsorbates of interest) and when said adsorbate is oriented at 45 degrees with respect to to the plate coordinate system, two conditions must be met, (i) yx = yy y (ii) yxxxy = y yyxy, and these conditions further imply that yxxxy = yyyxy = 0. Therefore, for an adsorbate that does not is extremely irregular, we have four unique parameters y x, y y, yxy and yxxyy, which will allow it to be uniquely identified. The coefficients yxxxy and yyyxy are, for their part, indicative of the irregularity of the adsorbate. An even simpler case is when the adsorbate has azimuthal symmetry around the z axis. In this case, Equation 7 must be independent of the orientation angle and, in that case, yx = yy and yxxyy = 2yx - yxy, and the number of unique coefficients is reduced to two. It is evident then that the quantities ( Vx - Yy) and (2 yx - yxy - yxxyy) are coefficients indicative of the asymmetry of the adsorbate.
    [0124] The present invention additionally enables the adsorption position, mass and different adsorbate stiffness coefficients to be calculated from the relative frequency changes of various vibration modes by numerical calculation. However, the extraction of all the useful information of the relative frequency changes of various vibration modes of a plate is not a task without complexity a priori, due to the high number of parameters involved in the problem. A general optimization problem with a large number of variables can involve, in any case, a high computational cost. However, there are some peculiarities that can be used in different preferred embodiments of the invention, to simplify said optimization. It is important to note that the relative frequency change has a linear dependence on all the parameters of the problem, except the position coordinates ( x 0 , y 0 ). This implies that the position must be calculated accurately to avoid large uncertainties in the rest of the parameters. For the type of adsorbates of typical interest, the effect of mass is generally much greater than the effect of stiffness, therefore a good first estimate of the adsorption position can be made by neglecting the effect of stiffness. This greatly simplifies the optimization problem. Once this estimation has been made, the stiffness parameters can later be included as a small disturbance of the initial problem. In this way, the optimization problem is transformed into smaller and simpler subproblems, which can be solved sequentially. With this objective, it is possible to define two vectors that will be used during the process:
    [0128] where dn2 = un ( x 0 , y 0 ) 2 vn ( x0, y0) 2 wn ( x 0 , y 0 ) 2 is the square of the total displacement. On, for its part, is a vector that contains all the information about the nth vibration mode and A is the vector that contains the unknowns we are looking for, and is completely independent of the vibration mode and the adsorption position.
    [0130] For an example where we are measuring N modes in total and, since stiffness produces positive frequency changes and mass produces negative frequency changes, a good option to ensure an accurate estimate is to choose only the modes that experience negative change. in frequency. Being M the set of said modes with negative frequency change, to calculate the position of adsorption, the following function is minimized:
    [0135] where Sfm is the experimentally measured rn-th mode relative frequency shift. The values ( x 0 , y 0 ) and Q that minimize the function F0 ( x, y) are the first estimate of the adsorption position. It should be noted that the minimum number of modes necessary for this first estimation is three, and at least one must have a notable variation along the x coordinate and another along the y coordinate to solve ( x 0 , y 0 ) correctly. The second step is to include the stiffness terms corresponding to the x , y and xy deformations. The other three terms ( xxyy , xxxy , yyxy ) are generally much smaller than these three and can be neglected in this step. Then,
    [0138] the minimum is searched around the previous calculated position ( x0, y0). The new function to be minimized is:
    [0143] From the minimization of Equation 11, the new position values ( x0, Yo) and the first calculation of A 'for i = 2,3,4 are obtained. In the next step, the rest of the stiffness terms can be included simply by increasing the sums in Equation 11, from i = 1 to i = 5.6 and 7. It is important to mention that the entire procedure to obtain all the components of A can be divided into sequential steps. For example, after the first estimation of the position, it is possible to use the modes in which, at that position, the principal component of the deformation is the x component . In that case, only these vibration modes should be included in Equation 11 and only the terms A1 and A2. After this step, it is possible to include the y component of the stiffness, the xy component and so on, always ensuring that the minimum value found for the F1 function is lower than in the previous step. Mass can be calculated using the mode that has the largest negative change in frequency. With q being said mode, the mass can be calculated as follows:
    [0144] = 2 MpSfq
    [0145] Mr y 7 0 Í A l (Eq. 12)
    [0147] A further application of the technique of the present invention, in a preferred embodiment thereof, is to be able to identify particles with great precision. When we have a set of objects, the distinguishing ability of a given method grows along with the number of properties that the method can measure from the elements of the set. The mass and all the different terms of stiffness make this technique an extremely powerful tool for this task. For each particle of the set, a database is defined with the values of M a, y x, y y, yxy, yxxyy, yxxxy and yyyxy that will be necessary to be able to make a comparison between particles. However, the quantities obtained experimentally to perform this comparison are M a, yx yy yxy yxxyy ', Yxxxy' and Yyyxy '■ To make the comparison, we use Equations 6 with the values from the database and form the following function:
    [0149] K e) = y E = 1 abs ( 0 ^) ( Ma ° - Ma) 2 + y 7i = 2 and SU abs (0Á) ((y¿ ^ A *) ', (Eq. 13) where the superscript D refers to the values in the database. Equation 13 has been weighted giving more importance to those components that have a higher value at the adsorption point, to improve the success of the identification. However, in other embodiments of the invention, other similarity estimators can also be used to identify the particles. The minimization of Equation 13 (or of the chosen similarity estimator, in each case) allows calculating the orientation angle for each particle of the set, being the particle that gives the minimum value of said equation the one that has the most probability of being the particle correct.
    [0151] As a non-limiting example of a preferred embodiment of the invention, the process of identifying four particles with the same mass, the same Young's modulus, the same volume but a different shape, using the out-of-plane vibrations of a square-shaped lever-type plate. In this example, finite element simulations of a plate with that shape and the adsorption of four particles with different shapes have been carried out: a disk, a square, a cube and a bar with three different orientations (see Figure 2, where they are represented different situations). All the particles have a density of 1000 kg / m 3, a Young's modulus of 5 GPa, a Poisson's ratio of 0.25 and a volume of 0.025 gm . The lever type plate used is made of silicon with a side of 50 gm and thickness of 200 nm. Due to the similarity of the four particles, the identification presents a high complexity, so the first twelve out-of-plane modes are used for the calculations (see representation of these modes in Figure 3). For other cases in which the particles to be identified are not so similar, the number of modes required to have accurate predictions would be, in principle, less. For its part, for the square lever-type plate, the x- axis perpendicular to the fixed edge of the plate is chosen, originating from the anchored edge and through the central axis of the plate. As mentioned, Figure 3 shows the first twelve out-of-plane modes of the plate, calculated by finite element simulations for a material with a Poisson's ratio of 0.28.
    [0153] For this type of vibration modes, the only relevant displacement is wfx0, y0) and the deformations in the adsorption position are proportional to the curvatures of the plate:
    [0154] hd 2w ( x 0, y0); f .. ..) _ hd 2w ( _x0, y0); hd 2w ( x 0, y0)
    [0155] Á x o, y 0) 2 dx 2; yy f X ° 'Y o) _ 2 dy 2 ; £ Xy (Xq, y0) 2 dxdy , (Eq. 14) where h is the thickness of the plate. For all the proposed particles, the coefficients Yxxxy and Yyyxy are zero and, therefore, they will have only four stiffness parameters. For more
    [0158] comfort, the parameters and are defined so that the relative frequency change due to stiffness, when the orientation is zero, is given by the expression:
    [0162] EV ( l _v ^ 1 where K = - - and An is a mode-dependent number that comes from the
    [0163] integration in Equation 5. Prior to the test simulations, the four stiffness coefficients Ky x, Kyy, Kyxy and Kyxxyy have been calculated using finite element simulations (FEM) for the four particles, to complete the database represented in Table 1, below:
    [0165]
    [0167] Table 1. Parameters from the database obtained by FEM for the four particles used for the identification test.
    [0169] The identification test therefore consists in calculating the change in relative frequency of the twelve modes of vibration due to the adsorption of each of the particles by means of finite element simulations. The obtained values are used to calculate all the parameters applying the inverse problem. Then, making use of the database shown in Table 1, the identification algorithm described above is applied, in order to identify the corresponding particle. This procedure is applied for the six different particle configurations and varying the adsorption position over the entire surface of the plate.
    [0171] The identification success applying the method of the invention is represented in Figure 4. The identification success percentage is 60.5%, 98.4% 96.3%, 99.5%, 98.7% and 99.3% for the disk, square, cube, bar at 0 degrees, bar at 45 degrees, and bar at 90 degrees, respectively. Except in the case of the disc, the small missing percentage of the rest of the cases corresponds to the adsorption points where the resolution of the stiffness is poor, mainly the corners and edges of the plate. If the mass of the particles were not the same, the points near the edges and the free corners would also have a
    [0174] highly successful identification. The two corners at the clamped end of the plate are quite critical because, at these points, only the x- component of stiffness is large enough to be accurately measured, and in this case, with a similar group of particles, the Single parameter identification cannot be performed. In the case of the disk, the success rate is lower than in the rest of the particles. This is due to the extreme similarity between the disk and the square, as can be seen in Table 1. Almost all the points lost for the disk are due to the incorrect identification of a square (38.8%). The fact that the square's stiffness coefficients are not completely axisymmetric (they have a small dependence on the orientation angle), gives a small variation with the orientation angle and the disk can easily be confused with a square with 45 degrees of orientation.
    [0176] In conclusion, the present invention presents a novel technique for the identification and classification of particles with extremely high precision, based on the relative frequency changes suffered by the vibrations of the plates when these particles are adsorbed on their surface. Due to the special characteristics that these resonant structures present, we can distinguish particles with the same mass and Young's modulus, but with a different shape, which is something that is not possible with the known methods in this field. The invention constitutes, therefore, an important advance for the field of nanomechanical spectrometry, which may have relevant applications such as the identification and classification of viruses, bacteria or particulate matter, considerably improving the ability to distinguish the state of the art procedures. technique.
    权利要求:
    Claims (15)
    [1]
    1.- Identification method of an adsorbate of mass Ma, deposited on a plate of mass Mp, where said plate comprises a set of vibration modes and where, for said modes, its corresponding resonance frequency f0 is shifted by a certain amount Af by depositing the adsorbate in an adsorption position (x0, y0) of the same;
    said method being characterized in that it comprises carrying out the following steps:
    - A candidate mass and position of the adsorbate is calculated from the measurement of the change in frequency of a plurality of vibration modes of the plate, after knowing the mass of the plate Mp, neglecting the effect of stiffness, in such so that the field Af is given in the form:

    [2]
    2.- Method according to the previous claim, where the components and ' measured in the reference system of the plate are related, with the components Y measured in the reference system of the adsorbate belonging to the catalog of adsorbates, which is rotated an angle 0 around the z axis, using the expression:

    [3]
    3. Method according to the preceding claim, wherein the resonant vibration modes comprise out-of-plane and / or in-plane modes of vibration.
    [4]
    4. Method according to any of the preceding claims, where only resonant vibration modes are selected that experience a negative change in frequency with the deposition of the adsorbate.
    [5]
    5.- Method according to the previous claim, where N> 2 modes are measured in total, and M is the set of said modes with negative frequency change and where, to calculate the adsorption position in the first step, the following is minimized function:

    [6]
    6.- Method according to the preceding claim, where to calculate the final adsorption position, the mass M'a and the different coefficients y ', the following function is minimized:

    [7]
    7.- Method according to any of the preceding claims, where the comparison of the values of the candidate mass of the adsorbate Ma and of the coefficients y 'with the set of reference values {MaD, (y') D} previously stored is calculated using the similarity estimator I (0):

    [8]
    8.
    [9]
    9.
    [10]
    10.
    [11]
    eleven.
    [12]
    12.
    [13]
    13.
    [14]
    14.
    [15]
    fifteen. System according to the preceding claim, comprising an amplifier connected to the photodetector and adapted to subsequently amplify the signal for reading.
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    同族专利:
    公开号 | 公开日
    ES2776702B2|2020-12-22|
    WO2020157364A1|2020-08-06|
    EP3919898A1|2021-12-08|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    US20060223171A1|2000-07-12|2006-10-05|Cornell Research Foundation, Inc.|High sensitivity mechanical resonant sensor|
    WO2003091458A1|2002-04-26|2003-11-06|The Penn State Research Foundation|Integrated nanomechanical sensor array chips|
    WO2004029625A2|2002-09-24|2004-04-08|Intel Corporation|Detecting molecular binding by monitoring feedback controlled cantilever deflections|
    WO2006031072A1|2004-09-16|2006-03-23|Korea Institute Of Science And Technology|Method and system for detecting bio-element|
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