• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    Disclosed is a control circuit for control of a semiconductor switching device, such as an IGBT. The control circuit comprising a first feedback path between a first electrode and a control electrode of said semiconductor switching device which has a capacitance. The circuit is operable such that the capacitance in the first feedback path is dependent on the voltage level at said first electrode. In another embodiment the control circuit is operable such that a feedback signal begins to flow in the first feedback path immediately as the semiconductor switching device begins switching off, thereby causing a control action on the semiconductor switching device.
    公开号:AU2012364264A1
    申请号:U2012364264
    申请日:2012-01-05
    公开日:2014-07-10
    发明作者:Denis Rene Pierre Mathieu
    申请人:American Power Conversion Corp；
    IPC主号:H03K17-082
    专利说明:
    WO 2013/102778 PCT/IB2012/000160 1 Apparatus and Method for Control of Semiconductor Switching Devices The present disclosure relates to control of semiconductor switching devices, and in particular insulated-gate bipolar transistors (IGBT). 5 Background The state of the art in power converters provides an adjustable voltage and frequency to the output through a pulse width modulated (PWM, pulse width 10 modulation) voltage source inverter drive. Power converters can be used in uninterruptible power supplies (UPS), electric motors, etc. The PWM command is used in the power converter for controlling power to inertial electrical devices, made practical by modern electronic power switches. The duty cycle of a switch (ratio of on-time to total cycle time) is varied to achieve a desired average output voltage, 15 current etc., when averaged over time. A typical power converter is a switching power converter. It has two or more power semiconductor devices such as power semiconductor switches. The power semiconductor switches can, for example, be implemented by insulated-gate 20 bipolar transistors (IGBT). As the switching speed of such semiconductor switches increase and currents increase, it becomes increasingly difficult to limit turn-off voltages to a permissible range. Should the permissible voltage across the controlled path of a semiconductor switch be exceeded, it will be destroyed. A particularly critical case is that of a short circuit, where the rate of current change 25 di/dt induces in the stray inductances a voltage which is added to the voltage present in any case. The resultant overvoltage can exceed the permissible voltages, particularly across the controlled path of the semiconductor switch. One approach to addressing the overvoltage is to increase the size of the resistor at 30 the gate of the semiconductor switch. However, in order for this to be effective, the size of the resistor becomes too great and switching losses become unacceptable. Another method is to feedback the collector-emitter voltage to the gate of the WO 2013/102778 PCT/IB2012/000160 2 semiconductor switch in order to maintain it in the on-state for a time determined by stray inductances in the high power circuit. The rise in the gate voltage limits the rise in the collector-emitter voltage. However, this method is largely ineffective due to the significant delay between the gate voltage falling below the Miller plateau and 5 the rise of the collector-emitter voltage. Another approach is to provide an active clamp, such as described in US7119586. Here, the active clamp is incorporated in the circuit between the semiconductor switch's collector and the input to the gate driver stage. This active clamp 10 determines the voltage across the emitter-collector path of the semiconductor switch, and in this manner detects the beginning of the cut-off state, thereby freezing the instantaneous value of the switching signal. Since the semiconductor switch remains longer at the voltage level of the Miller Plateau, a small rate of current change di/dt of the collector current is achieved when turning-off particularly 15 high voltages. This method of active clamping tends to result in a change in collector current slope without significantly increasing switching losses. It is an aim of the present invention to address one or more of these issues with the prior art. 20 In a first aspect of the invention there is provided a control circuit for control of a semiconductor switching device comprising a first feedback path between a first electrode and a control electrode of said semiconductor switching device, said first feedback path comprising a capacitance, said control circuit being operable such 25 that the capacitance in the first feedback path is dependent on the voltage level at said first electrode. In a second aspect of the invention there is provided a control circuit for control of a semiconductor switching device comprising a first feedback path between a first 30 electrode and a control electrode of said semiconductor switching device and comprising a capacitance, said control circuit being operable such that a feedback signal begins to flow in the first feedback path immediately as the semiconductor WO 2013/102778 PCT/IB2012/000160 3 switching device begins switching off, thereby causing a control action on said semiconductor switching device. Other optional aspects are as disclosed in the appended dependent claims. 5 BRIEF DESCRIPTION OF THE DRAWINGS Embodiments of the invention will now be described, by way of example only, by reference to the accompanying drawings, in which: 10 Figure 1 shows an active driver circuit according to the prior art, driving an IGBT. Figure 2 shows an active driver circuit according to the present invention, driving an IGBT; 15 Figure 3 shows traces of a number of signal levels over time for an IGBT without any active voltage control; and Figures 4 and 5 show traces of a number of signal levels over time for an IGBT 20 driven using an active driver circuit according to an embodiment of the invention.
    WO 2013/102778 PCT/IB2012/000160 4 DETAILED DESCRIPTION OF THE EMBODIMENTS Figure 1 shows a prior art active driver circuit driving an Insulated Gate Bipolar Transistor (IGBT) 100. The driving circuit receives a switching signal such as a 5 pulse width modulated signal PWM, and drives the IGBT 100 in dependence on the switching signal PWM. The driving circuit consists of at least one driver stage 110, which consists, in this example, of a push-pull emitter follower comprising two bipolar transistors 120a and 120b. One or more further driving stages may precede driving stage 110. The output of the driver stage 110 is connected to the gate of 10 IGBT 100 via gate resistor RG. A first feedback path between collector and the input of driver stage 110 is provided. This first feedback path comprises transient voltage-suppression (TVS) diode 130, capacitor 170, resistor 180 and switch 190. Also provided is a second feedback path between collector and gate of the IGBT. This path comprises TVS diode 130, further TVS diodes in series 140, diode 150 15 and resistor 160. This circuit operates as follows. The PWM signal is received via the driver stage 110 at the IGBT's 100 gate. As the gate voltage changes polarity, the IGBT 100 is cut off and the voltage between emitter and collector of the IGBT 100 rises. Once 20 the threshold set by TVS diode 130 is reached the potential at the capacitor 170 changes and a current flows through the first feedback path via the resistor 180. The voltage dropped across the resistor 180 switches on the switch 190, causing a current to flow through the switch 190. Due to this current, in turn, a positive voltage is dropped across the resistance 195 which holds the IGBT 100 at its Miller Plateau 25 directly via the driver stage 110. Consequently, the IGBT 100 remains in its active region. This significantly reduces the current slope, and hence the instantaneous rate of change in voltage dv/dt across the IGBT is limited. The second, optional, feedback path provides a further clamping action on the 30 IGBT's gate by directly applying the collector-emitter current to the gate, via resistance 160 and TVS diodes 130, 140. The TVS diodes 130,140 in series result in a higher threshold being required before this further clamping action takes effect, WO 2013/102778 PCT/IB2012/000160 5 compared to the threshold required for the clamping action of the first feedback circuit to take effect. This only happens when in an overvoltage situation, under normal operation the collector-emitter voltage will not exceed this higher threshold. 5 Figure 2 shows a modified active driver circuit driving an IGBT 200. The circuit operates in a similar manner to that of Figure 1. The main difference is in the first feedback path, where there is a plurality (in this example, three) capacitors 270a, 270b, 270c, in parallel. The first capacitor 270a has no TVS diode at its input, and therefore the rising collector-emitter voltage is immediately applied to it, resulting in 10 a current flow in the first feedback path. However, as the collector-emitter voltage continues to increase, the threshold set by TVS diode 230a is met, followed by the threshold set by the combination of TVS diodes 230a and 230b. This results in, firstly, current being conducted through capacitor 270b in parallel with 270a and then through all three capacitors 270a, 270b, 270c. The instantaneous current 15 control through this feedback path is given by: control =C.dvc/dt where C is the capacitance in the feedback loop and dvce/dt is the instantaneous 20 rate of change of the IGBT's 200 collector-emitter voltage. Consequently, as each threshold is passed, the effective capacitance in the feedback loop increases, and with it the current in the feedback loop. The way that the feedback current control is used to control the driver stage 210 also 25 differs from the circuit of Figure 1. Figure 2 shows a core control command CCC (which causes the PWM signal) input via isolation 205 and amplification 215 to the driver stage 210. This core control command also provides an inhibition command 225 at the base of switch T2. In parallel with switch T2 is resistor R2 and diode D3. The first feedback path is connected to the gate of switch T1, which connects the 30 positive rail to the driver stage 210 input via diode D2.
    WO 2013/102778 PCT/IB2012/000160 6 Feedback current control passes through resistor R1 with a consequent current being injected into resistor R2. The voltage across resistor R2 rises, and switch T1 is turned on. Switch T1 acts as a current amplifier in order to control transistor 220a such that the power IGBT 200 stays in its active region as described in relation to 5 Figure 1. This action is inhibited as a result of the inhibition command 225 after a delay of (in this example) 1 ps. After that time, switch T2 is turned on and no more action from resistor R2 can occur. The capacitors 270a 270b 270c are discharged through 10 diode D3 and resistor R1 when the power IGBT 200 is turned on, and are therefore ready to control the next turn off of the power IGBT 200. The second feedback path operates in the same was as that of Figure 1. 15 A main difference with the circuit of Figure 1 is that the feedback current control begins to flow in the first feedback path, and therefore the control action occurs, immediately on the IGBT being switched off. In addition, the control signal in the first feedback loop increases with the collector emitter current. In this way, the multilevel thresholds lead to a better overvoltage control, without a significant 20 amount of extra losses. Figure 3 shows traces for the collector current Ic, the gate voltage Vge, the collector-emitter overvoltage Vce, the energy losses eioss and the gate current Ig for a power IGBT without active voltage control, while Figure 4 shows the same traces 25 obtained for a power IGBT using the circuit of Figure 2. The IGBT is turning off 400A in both of these Figures. In Figure 4, the gate voltage Vge can be seen to have a number of peaks, each representing a threshold reached. This results in better control of the collector-emitter overvoltage Vce. In 30 Figure 3 the overvoltage can be seen to peak above 700V while in figure 4 it is constrained below 600V.
    WO 2013/102778 PCT/IB2012/000160 7 Figure 5 shows the same traces as Figure 4 using the circuit of Figure 2, but this time turning off 800A. The IGBT has a max current of 400A (this is a one shot test, as the IGBT cannot withstand this current permanently). At this current, it can be seen that the peak overvoltage Vce is very close to (only very slightly higher) than 5 that shown in Figure 4, for which the IGBT switching off 400A. While this detailed description has set forth some embodiments of the present invention, the appended claims cover other embodiments of the present invention which differ from the described embodiments according to various modifications 10 and improvements and/or which can be envisaged without departing from the spirit or scope of the invention.
    权利要求:
    Claims (19)
    [1] 1. A control circuit for control of a semiconductor switching device comprising a first feedback path between a first electrode and a control electrode of said 5 semiconductor switching device, said first feedback path comprising a capacitance, said control circuit being operable such that the capacitance in the first feedback path is dependent on the voltage level at said first electrode.
    [2] 2. A control circuit as claimed in claim 1 wherein said first feedback path 10 comprises a plurality of capacitors arranged in parallel, and at least one threshold device.
    [3] 3. A control circuit as claimed in claim 1 or 2 wherein no threshold device is provided between a first of said plurality of capacitors and said first electrode. 15
    [4] 4. A control circuit as claimed in claim 1, 2 or 3 wherein a threshold device is provided between each pair of capacitor inputs of said plurality of capacitors arranged in parallel. 20
    [5] 5. A control circuit as claimed in claim 4 being operable such that each threshold device causes a corresponding threshold voltage level to be set, said circuit being operable such that each time the voltage level at the first electrode exceeds a threshold voltage level, a further capacitor is switched into the feedback path and therefore contributes to said capacitance in the first feedback path. 25
    [6] 6. A control circuit as claimed in any of claims 2 to 5 wherein said threshold device(s) comprises a transient-voltage-suppression diode.
    [7] 7. A control circuit as claimed in any preceding claim being operable such that 30 when the level on the control electrode goes low, said semiconductor switching device begins to conduct and the voltage level on said first electrode rises, said first feedback path being operable to apply a feedback signal dependent on the voltage WO 2013/102778 PCT/IB2012/000160 9 level on said first electrode to said control electrode thereby reducing the rate at which the voltage level on said first electrode rises.
    [8] 8. A control circuit as claimed in claim 7 being operable to stop applying the 5 feedback signal to the control electrode and to discharge said plurality of capacitors after a predetermined time delay.
    [9] 9. A control circuit as claimed in any preceding claim wherein said semiconductor switching device is a transistor device, said first electrode is the 10 collector/source electrode and said control electrode is the base/gate electrode.
    [10] 10. A control circuit as claimed claim 9 wherein said semiconductor switching device is an insulated gate bipolar transistor. 15
    [11] 11. A control circuit as claimed in any preceding claim wherein the control circuit comprises a driver stage, for driving said control electrode, the signal level on the driver stage input being dependent on the first feedback path.
    [12] 12. A control circuit as claimed in any preceding claim comprising a second 20 feedback path, said second feedback path comprising a further threshold device and being operable to apply a signal directly to said control electrode when the voltage level at said first electrode exceeds a threshold level set by said further threshold device in said second feedback path. 25
    [13] 13. A control circuit for control of a semiconductor switching device comprising: a first feedback path between a first electrode and a control electrode of said semiconductor switching device and comprising a capacitance, said control circuit being operable such that a feedback signal begins to flow in the first feedback path immediately as the semiconductor switching device begins switching off, thereby 30 causing a control action on said semiconductor switching device. WO 2013/102778 PCT/IB2012/000160 10
    [14] 14. A control circuit as claimed in claim 13 being operable such that when the level on the control electrode goes low, said semiconductor switching device begins to conduct and the voltage level on said first electrode rises, said first feedback path being operable to apply the feedback signal on said first electrode to said control 5 electrode thereby reducing the rate at which the voltage level on said first electrode rises.
    [15] 15. A control circuit as claimed in claim 14 being operable to stop applying the feedback signal to the control electrode and to discharge said plurality of capacitors 10 after a predetermined time delay.
    [16] 16. A control circuit as claimed in any of claims 13 to 16 wherein said semiconductor switching device is a transistor device, said first electrode is the collector/source electrode and said control electrode is the base/gate electrode. 15
    [17] 17. A control circuit as claimed claim 16 wherein said semiconductor switching device is an insulated gate bipolar transistor.
    [18] 18. A control circuit as claimed in any of claims 13 to 17 wherein the control 20 circuit comprises a driver stage, for driving said control electrode, the signal level on the driver stage input being dependent on the first feedback path.
    [19] 19. A control circuit as claimed in any of claims 13 to 18 comprising a second feedback path, said second feedback path comprising a further threshold device 25 and being operable to apply a signal directly to said control electrode when the voltage level at said first electrode exceeds a threshold level set by said further threshold device in said second feedback path. 30
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    同族专利:
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    US9509299B2|2016-11-29|
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    EP2801153A1|2014-11-12|
    WO2013102778A1|2013-07-11|
    CN104040890A|2014-09-10|
    IN2014DN06225A|2015-10-23|
    US20150042397A1|2015-02-12|
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    法律状态:
    2017-09-07| FGA| Letters patent sealed or granted (standard patent)|
    2020-07-30| MK14| Patent ceased section 143(a) (annual fees not paid) or expired|
    优先权:
    申请号 | 申请日 | 专利标题
    PCT/IB2012/000160|WO2013102778A1|2012-01-05|2012-01-05|Apparatus and method for control of semiconductor switching devices|
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