• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    The invention relates to a measuring sensor (1) for a measuring system suitable for dielectric impedance spectroscopy, the measuring sensor (1) comprising at least a first microstrip line (2) consisting of a first conductor strip (3) for a measuring signal, at least in one operating state of the measuring probe (1) , a first dielectric substrate and a first ground plane (5), wherein the first conductor strip (3) can be abutted from outside to a container containing a dielectric material sample to be measured, preferably to a tube, a vessel or a bag.
    公开号:AT517604A4
    申请号:T50850/2015
    申请日:2015-10-06
    公开日:2017-03-15
    发明作者:Dr Jahn Martin；Schiefer Martin
    申请人:Siemens Ag Österreich；
    IPC主号:
    专利说明:

    description
    PROBE
    Field of the invention
    The present invention relates to a measuring sensor for a measuring system suitable for dielectric impedance spectroscopy.
    Furthermore, the invention also relates to a measuring system for dielectric impedance spectroscopy, comprising a sensor according to the invention and a device for
    Generation and evaluation of a measurement signal and / or a reference signal of the sensor.
    Finally, the invention also relates to a method for determining the impedance of a dielectric material sample, preferably a dielectric suspension, held in a container by means of a measuring system according to the invention.
    State of the art
    Many suspensions, such as those in biotechnology, industry, or in the
    Oil exploration often occurrences, are measured and characterized by means of dielectric impedance spectroscopy. Often this is only possible by contact measurements - the probe is thus brought into contact with the suspension to be measured, whereby the risk of contamination of the suspension on the one hand and / or the formation of an unwanted, for the and any further measurement hindering film on the probe on the other hand, it is increasing In addition, measurements in which the probe must be placed in the suspension, usually consuming and difficult to automate.
    In this context, coaxial sensors are known which, on the one hand, permit a broadband measurement but, on the other hand, are also expensive to handle, since they must be immersed in the suspension to some extent during the measurement.
    In addition, measuring methods are known in which the material sample to be measured has to be introduced into the interior of a waveguide (waveguide) or a coaxial sensor, in such a way that the said material sample completely fills the interior. For suspensions working with such sensors measuring methods are therefore not practical, although the measuring principle used, ie the use of physical properties of "transmission lines", would generally allow a very broadband measurement.
    Another known measuring method, which is also not suitable for the measurement of suspensions because of its complexity, comprises a transmitter and a receiver, wherein the material sample to be measured is contactlessly measured by being transilluminated with electromagnetic radiation in the microwave range. However, both the measurement setup and the implementation of such a measurement is quite complex.
    Other methods of dielectric impedance spectroscopy also appear unattractive, in particular in connection with suspensions to be measured. These include induction measurement, parallel plate measurement and the measurement of a dielectric material sample in a resonator.
    Object of the invention
    Therefore, it is an object of the present invention to provide a broadband sensor for a measuring system suitable for dielectric impedance spectroscopy, which is particularly well suited for measuring dielectric suspensions, without having to bring the sensor directly into contact with the suspension to be measured.
    Presentation of the invention
    According to the invention, this object is achieved with a measuring sensor for a measuring system suitable for dielectric impedance spectroscopy, in that the measuring sensor has at least one first microstrip line, consisting of a first microstrip line, at least in an operating state of the measuring probe
    Conductor strip for a measurement signal, a first dielectric substrate and a first ground plane comprises, wherein the first conductor strip from the outside surface to a container containing a dielectric material to be measured containing container, preferably to a pipe, a vessel or a bag, can be applied.
    In a microstrip line, there is a conductor strip between the interfaces of two different dielectrics. Usually, one dielectric is formed by a dielectric substrate of a printed circuit board and the other by air. As a result, a portion of the electromagnetic field of the signal carried in the conductor passes directly between the conductor strip and a ground plane of the circuit board and thus in the substrate of the circuit board, while the other part of the electromagnetic field extends into the other dielectric. Because of the different permittivities of the two dielectrics, the phase velocity of the propagating electromagnetic wave above and below the conductor strip is different, and a quasi-TEM mode is formed.
    According to the invention, it is now provided that, at least in the operating state, the measuring sensor comprises at least one microstrip line for a measuring signal. In this case, one of the two dielectrics is formed by the dielectric material sample to be measured together with the container in which the material sample is located. By applying the probe to the container from the outside, it is now possible to measure the system container material sample by means of dielectricity spectroscopy and without having to bring the probe directly with the material sample, in particular with a suspension in contact. If the suspension changes - be it at different positions of the applied measuring sensor along the outside of the container or if there is a temporal change in the internal structure of the suspension while the position of the measuring probe remains the same - the permittivity of the suspension also changes, which is reflected in the measuring change of the phase of the measurement signal, after passing through the conductor strip noticeable.
    In this case, the phase shift between the signal entering the sensor and the signal leaking out of the conductor strip after passing through it is all the greater-the sensor being all the more sensitive-the longer the conductor strip which lies flat against the container.
    Also, the sensor according to the invention is particularly well suited for broadband measurements due to the resulting TEM mode, since TEM modes have no cutoff frequency.
    In addition, by using the microstrip line, a good signal-to-noise ratio can be achieved, which allows very high signal levels to be used and allows for very accurate measurements.
    Since the production of sensors according to the invention is particularly simple and inexpensive (photolithographic production or by milling), the probe according to the invention is in principle also suitable for single use.
    In order to fit the probe accurately to any shaped containers, it is provided in a preferred embodiment of the sensor according to the invention that the probe is flexible. In this case, the first conductor strip, the first dielectric substrate and the first ground plane are flexible, that is to say they are flexible.
    In order to fit the probe accurately to certain, known form having containers, it is provided in another preferred embodiment of the probe according to the invention that the probe is rigid and at least partially curved. Thus, adapted to a curved or square container, but at the same time rigid design of the probe can be achieved.
    It goes without saying that for a container with a correspondingly large flat outer surface and a rigid planar sensor can be used.
    In a further preferred embodiment of the sensor according to the invention, it is provided that the first dielectric substrate is formed by a first printed circuit board, wherein the first printed circuit board has at least a first outer surface and a second outer surface arranged parallel to the first outer surface and wherein the first conductor strip on the first Outside surface and the first ground surface is disposed on the second outer surface.
    As a result, a particularly simple and uncomplicated configuration of the probe is achieved. On the one hand, the circuit board thus serves as the first dielectric substrate of the microstrip line and at the same time gives the sensor its flexibility if it is designed to be flexible or serves as a shaping element of a rigid measuring sensor if it is rigid. A separate component of the sensor which forms the first dielectric substrate of the first microstrip line is not necessary.
    In order to enable a differential measurement of the phase velocity of the measurement signal or to be able to compare the phase of the expiring from the probe measurement signal with the phase of a reference signal whose electromagnetic field is not propagated by the dielectric material to be measured, it is in another preferred Embodiment of the inventive sensor provided that the sensor comprises a second microstrip line, which consists of a second conductor strip for a reference signal, a second dielectric substrate and a ground plane.
    In this case, the ground surface of the second microstrip line can be formed by a separate, additional ground plane. However, in order to keep the number of required components as small as possible and the structure of the probe as simple as possible, it is provided in a further preferred embodiment of the sensor according to the invention that the ground surface of the second microstrip line is formed by the first ground plane.
    In order to maintain the flexibility or the rigid shape of the probe, it is provided in a further preferred embodiment of the sensor according to the invention, that the second dielectric substrate is formed by a second printed circuit board, which in turn flexible in a flexible probe or rigid again in a rigid probe can be trained.
    In a particularly preferred embodiment of the sensor according to the invention, it is provided that the first circuit board and the second circuit board each form a layer of a two-layer circuit board, wherein the two layers of the two-layer circuit board through the first
    Ground plane are separated from each other.
    Thus, the sensor consists of a single two-layer circuit board, which may be flexible or rigid depending on the design of the first and second circuit board, between the layers of the first ground surface is arranged, and at the opposite, parallel to the first ground surface extending outer surfaces each have a conductor strip is arranged.
    In another preferred embodiment of the sensor according to the invention, it is provided that the first conductor strip and the first ground plane are arranged side by side on the same outer surface of a flexible printed circuit board and that the first dielectric substrate in the operating state of the probe through the container together with the measured therein contained dielectric material sample is formed.
    Especially in connection with cylindrical containers, this embodiment has the advantage that it can be created surrounding the container sections.
    According to the invention, a fastening mechanism can also be provided in order to permanently fasten the measuring sensor to the container. Overall, such an embodiment of the probe according to the invention enables a simple and quick mounting of the probe.
    In order to be able to compare the measuring signal with a reference signal even in such a preferred embodiment, it is provided in a further preferred embodiment of the sensor according to the invention that a second conductor strip arranged on a parallel to the first ground plane and the opposite outer surface of the same portion of the flexible circuit board is, wherein the second conductor strip covers the first ground plane.
    In order to keep the number of components of the probe as small as possible, it is provided in a further preferred embodiment of the sensor according to the invention, that the second conductor strip, the first ground plane and arranged between the second conductor strip and the first ground plane portion of the flexible circuit board Form second microstrip line.
    In order to maximize the distance that the reference signal must travel along the container, it is provided in a further preferred embodiment of the sensor according to the invention that the first conductor strip and / or the second conductor strip is / are formed meander-shaped.
    As a result, on the one hand increases the sensitivity of the probe and on the other hand, this arrangement of the conductor strips also increases the broadband of the probe, as well as operation of the probe with particularly low-frequency signals is possible.
    The object according to the invention can also be achieved by a measuring system for dielectric impedance spectroscopy, comprising a measuring sensor in one of the preceding embodiments and a device for generating and evaluating a measuring signal or a measuring signal and a reference signal of the measuring probe.
    A method according to the invention for determining the impedance of a dielectric material sample, preferably a dielectric suspension, held in a container by means of a measuring system according to the invention comprises the following method steps:
    Contacting the probe with the container by surface application of a first, provided for a measurement signal conductor strip from the outside to the container;
    Feeding a measuring signal entering the measuring sensor at a predetermined frequency;
    Measurement of the measuring signal coming out of the sensor;
    Determination of the phase shift between incoming and outgoing measuring signal;
    Determining the impedance of the dielectric material sample held in the container from the phase shift between incoming and outgoing measurement signal.
    Here, too, the differential determination of
    In a particularly preferred embodiment of the method according to the invention, it is provided that, in addition to the incoming measuring signal, an incoming reference signal with the same frequency also enters a second, for the reference signal, phase shift or the phase velocity of the measuring signal relative to that of an uninfluenced reference signal provided conductor strip of the sensor is fed and subsequently the difference between the phase shift, which has the expiring measurement signal with respect to the incoming measurement signal, and the phase shift, which has the expiring reference signal with respect to the incoming reference signal is determined.
    Brief description of the figures
    The invention will now be explained in more detail with reference to exemplary embodiments. The drawings are exemplary and should be the
    Although set out the idea of the invention, it does not restrict or even reproduce it in any way. Showing:
    Fig. 1 is a schematic view of a sensor according to the invention with a first microstrip line
    Fig. 2 is a schematic view of a first embodiment of an inventive
    Probe with a first and a second microstrip line
    Fig. 3 is a schematic view of a second embodiment of an inventive
    Probe whose first conductor strip and
    Ground plane are arranged on the same outside of a flexible circuit board
    Fig. 4 is a side view of the embodiment of Fig. 3, according to the section line A-A
    Fig. 5 is a view of a sensor according to the invention according to the first embodiment
    Fig. 6 is a view of a sensor according to the invention according to the second embodiment
    Fig. 7 is a view of a sensor according to the invention according to the second embodiment, which
    Sensor to a cylindrical or tubular
    Container is attached
    Ways to carry out the invention
    Fig. 1 shows the structure of a sensor according to the invention 1. The illustrated schematic structure of such
    A first conductor strip 3 and a first ground plane 5 are arranged on opposite outer surfaces 8, 9 of the printed circuit board 4 and connected to this printed circuit board 4. Together, the conductor strip 3, the first circuit board 4 and the first ground plane 5 form the first microstrip line 2 of the sensor 1, wherein the first circuit board 4 forms a first dielectric substrate of the first microstrip line 2.
    2 shows the structure of a first specific embodiment of the sensor 1 according to the invention. The sensor 1 according to this embodiment comprises a first microstrip line 2 for a measurement signal and a second microstrip line 10 for a reference signal.
    The first printed circuit board 4 and a second printed circuit board 12 are separated from one another and connected to the latter by means of a ground surface, which is formed by the first ground surface 5. At each of an outer surface of the circuit board 4 and 12, which outer surface is parallel to the first ground surface 5, a first conductor strip 3 and a second conductor strip 11 is arranged in each case.
    Thus, the probe of this embodiment consists of a first microstrip line 2 comprising the first conductor strip 3, the first circuit board 4 and the first ground plane 5, and a second microstrip line 10 comprising the second conductor strip 11, the second circuit board 12 and the first ground plane 5 ,
    Embodiments of the sensor according to the invention, which have a structure according to one of the two figures discussed above, either flexible so as to be accurately applied to arbitrarily shaped containers, or else be rigid - for example, with one or two rigid and curved executed circuit boards to thereby easy, quick and repeatable to be applied to containers with a certain shape.
    In contrast to the first concrete embodiment described above, both the first conductor strip 3 and the first ground plane 5 of this particular embodiment are arranged side by side on the same outer surface 8 of a flexible printed circuit board 14.
    The concrete embodiment has a meandering arranged first conductor strip 3. The meander-shaped arrangement of the first conductor strip 3 serves to extend the path which the measurement signal in the first conductor strip 3 has to cover. Other arrangements which fulfill this purpose are conceivable.
    In the concrete second exemplary embodiment, the first conductor strip 3 or the first ground plane 5 respectively occupies only part of the half outer surface 8, variants in which the first conductor strip 3 and / or the first ground surface 5 cover the entire half of the outer surface 8 however, equally conceivable and encompassed by the inventive idea.
    Fig. 4 shows a sectional view of the probe 1 of FIG. 3, according to the section line A-A. In this case, the components belonging to the first microstrip line 2 and arranged on the one outer surface 8, namely the first conductor strip 3 and the first ground surface 5, can be seen. On one of these first outer surface 8 opposite and -here parallel to the first ground surface 5 extending - second outer surface 9 of the flexible printed circuit board 14, a second conductor strip 11 is arranged. The first ground plane 5 is separated by a portion of the flexible printed circuit board 14 of the second conductor strip 11 and covers - seen here in the vertical direction - this second conductor strip eleventh
    Fig. 5 shows the first specific embodiment of the sensor 1 according to the invention in a partially bent state. In this case, the first printed circuit board 4 and the second printed circuit board 12, which printed circuit boards 4, 12 are made flexible in the illustrated embodiment, each one layer of a two-layer flexible printed circuit board, wherein the two layers at least partially by the-also flexibly formed - first ground surface 5 from each other are separated.
    In the region of the first ground plane 5, a first conductor strip 3 and a second conductor strip 11 are arranged on the two outer surfaces of the flexible printed circuit board parallel to the first ground surface 5. Thus, the probe of this particular embodiment comprises the first microstrip line 2 and the second microstrip line 10, wherein each of the ground plane of the first 2 and second microstrip line 11 is formed by one and the same ground plane, namely the first ground plane 5.
    Fig. 6 shows the second concrete embodiment of the probe according to the invention, but not in a straight state of the flexible printed circuit board 14, as shown schematically in Fig. 3 and Fig. 4, but in a U-shaped bent state. In this case, the measuring sensor 1, the first microstrip line 2, comprising the first conductor strip 3 and the first ground plane 5, and the second microstrip line 10, which second
    Microstrip line 10, the second conductor strip 11, the first ground plane 5 and the lying between these two components portion of the flexible printed circuit board 14 includes.
    Finally, FIG. 7 shows the measuring sensor 1 of the second embodiment (FIG. 6) in an operating state. In this case, the sensor 1 is peripherally surrounding a cylinder or. tubular container 7 created. In the concrete case, the container 7 is a tube through which a suspension 6 flows.
    In addition, three normal projections of the applied probe 1 are shown.
    Operation of the invention according to the second specific embodiment
    The operation of the invention according to the second concrete embodiment will be described below with reference to FIG.
    The embodiment of the sensor 1 according to the invention according to the second concrete embodiment has the advantage that the sensor 1 can be peripherally attached to a container 7, specifically to a pipe, or attached thereto by means of a closure mechanism of the sensor 1.
    In the operating state of the probe 1 of the embodiment shown, the first microstrip line 2 comprises the first conductor strip 3, the first ground plane 5 and the system arranged between these two components of container 7 and suspension 6 (hereinafter referred to as system container 7 - suspension 6), which System forms the first dielectric substrate of the first microstrip line 2.
    According to the theory of electrodynamics, an electrical signal carried by the first conductor strip 3 and serving as a measurement signal according to the invention causes a part of the electromagnetic field which builds up around the first conductor strip 3 to be directly between the first conductor strip 3 and the first one Ground surface 5 through the system container 7 - 6 suspension runs. However, another part of this electromagnetic field extends into the flexible printed circuit board 14, on which the first conductor strip is mounted.
    Due to the different permittivities of the two dielectrics - namely the system container 7 - suspension 6 and the dielectric material from which the flexible printed circuit board 14 is made - the electromagnetic field of the measurement signal propagates above and below the first conductor strip 3 at different phase velocities it comes to the formation of a TEM mode (transversal electromagnetic mode). TEM modes have the property that their excitation spectrum is not limited by a cut-off frequency, which allows a measurement of the system container 7 - suspension 6 in a very wide frequency spectrum.
    To model this first microstrip line 2, the two dielectrics through which the electromagnetic field propagates, namely the system container 7 - suspension 6 on the one hand and the dielectric material of the flexible printed circuit board 14 on the other hand, are considered to be a single homogeneous dielectric material with an effective permittivity. wherein this effective permittivity is composed of the permittivities of the two separate dielectrics. If the structure of one of the two dielectrics, and thus also its permittivity, changes, this leads to a change in the phase velocity of the electromagnetic field of the measurement signal and thus also to a measurable phase shift of the measurement signal over a predetermined length of the first microstrip line.
    Thus, (local and temporal) changes in the composition of a suspension, for example, by
    Cell growth, measurable, without exposing the sensor to possible contamination by the suspension itself. This makes the sensor particularly well suited for process monitoring in industrial environments. A simultaneous monitoring of the state of the container 7 is possible.
    The measurement itself can either be made directly by comparing the phase of the measuring signal fed into the measuring sensor 1 with the phase of the measuring signal issuing from the measuring sensor 1. In this case, the measurement signal can be conducted either unidirectionally through the first conductor strip 3 arranged meandering in the specific exemplary embodiment and the phase of the transmitted component of the measurement signal can be compared with the phase of the applied measurement signal. On the other hand, it is also possible to short-circuit one end of the first conductor strip or to provide it with an open circuit, and thereby - to generate a strong reflection signal of the measurement signal as an expiring measurement signal. This method has the advantage that the electrical length of the first microstrip line 2 doubles, as a result of which the phase shift caused by the measuring signal is doubled. As a result, either a higher measurement accuracy can be achieved or the structure of the dielectric material sample to be measured can be reduced. The disadvantage of this, however, is that broadband directional coupler are required for coupling the reflection, both for the measurement signal itself and optionally for a reference signal.
    Another possibility of the measurement is a differential method in which a reference signal is fed into the second conductor strip 11 of the second microstrip line 10 provided for this purpose. The second conductor strip 11 is shielded from the first microstrip line by means of the first ground plane 5, with the result that the electromagnetic field of the reference signal is not guided by the dielectric material sample to be measured.
    As a result, such a reference signal, if it has the same frequency as the measuring signal and if the second conductor strip 11, in which the reference signal is guided, has the same electrical length as the first conductor strip 3, will always experience a different phase shift than the measuring signal. The comparison of the two resulting phase shifts with each other then allows, in accordance with the method described above, conclusions to be drawn about the internal composition or structure of the dielectric material sample to be measured. In this case, either the transmitted portions of the measurement signal and the reference signal can be compared with each other, or the respective reflected portions of both signals by shorting both microstrip lines 2, 10 at one end.
    Also, the sensor 1 described in connection with Fig. 5 according to the first specific embodiment works according to the same principle. However, in this embodiment variant, the measuring sensor 1 is more suitable, for example, for dielectric materials which are held in vessels such as tanks or silos or in bags. Whether the flexibility of the printed circuit board 4 or 12, on which the conductor strip 3 or 11 is arranged for the measuring or the reference signal, the sensor 1 according to the invention can easily adapt to different surfaces of such containers. By means of an adhesive device attached away from the respective conductor strip 3, 11, the measuring sensor of this embodiment variant can be applied to the container 7, for example, from the outside in a patchy manner.
    REFERENCE SIGNS LIST 1 sensor 2 first microstrip line 3 first conductor strip 4 first circuit board 5 first ground plane 6 dielectric material sample (suspension) 7 container 8 first outer surface of a flexible printed circuit board 9 second outer surface of a flexible printed circuit board 10 second microstrip line 11 second printed circuit 12 second printed circuit board 13 device for production and evaluation a measurement signal and / or a reference signal 14 flexible circuit board
    权利要求:
    Claims (15)
    [1]
    claims
    1. Sensor (1) for a suitable impedance for the dielectric impedance measurement system, characterized in that the sensor (1) at least in an operating state of the sensor (1) at least a first microstrip line (2) consisting of a first conductor strip (3) for a Measurement signal, a first dielectric substrate and a first ground surface (5), wherein the first conductor strip (3) from the outside surface to a container to be measured dielectric material (6) containing container (7), preferably to a pipe, a vessel or a bag, can be applied.
    [2]
    2. Sensor (1) according to claim 1, characterized in that the measuring sensor (1) is flexible.
    [3]
    3. Sensor (1) according to claim 1, characterized in that the measuring sensor (1) is rigid and at least partially curved.
    [4]
    4. Sensor (1) according to one of claims 1 to 3, characterized in that the first dielectric substrate is formed by a first printed circuit board (4), wherein the first printed circuit board (4) at least a first outer surface (8) and a parallel to first outer surface (8) arranged second outer surface (9) and wherein the first conductor strip (3) on the first outer surface (8) and the first ground surface (5) on the second outer surface (9) is arranged.
    [5]
    5. sensor (1) according to one of claims 1 to 4, characterized in that the measuring sensor (1) comprises a second microstrip line (10), which consists of a second conductor strip (11) for a reference signal, a second dielectric substrate and a ground plane consists.
    [6]
    6. Sensor according to claim 5, characterized in that the ground surface of the second microstrip line (10) through the first ground surface (5) is formed.
    [7]
    7. Sensor (1) according to claim 6, characterized in that the second dielectric substrate is formed by a second printed circuit board (12).
    [8]
    8. Sensor (1) according to claim 7, characterized in that the first printed circuit board (4) and the second printed circuit board (12) each form a layer of a two-layer printed circuit board, wherein the two layers of the two-layer printed circuit board by the first ground surface (5) from each other are separated.
    [9]
    9. sensor (1) according to claim 1, characterized in that the first conductor strip (3) and the first ground surface (5) on the same outer surface (8) of a flexible printed circuit board (14) are arranged side by side and that the first dielectric substrate in the operating state of the sensor (1) is formed by the container (7) together with the therein to be measured dielectric material sample (6).
    [10]
    10. Sensor (1) according to claim 9, characterized in that a second conductor strip (11) on a parallel to the first ground surface (5) extending and this opposite outer surface (9) of the same portion of the flexible printed circuit board (14) is arranged the second conductor strip (11) covers the first ground surface (5).
    [11]
    11. A sensor (1) according to claim 10, characterized in that the second conductor strip (11), the first ground surface (5) and between the second conductor strip (11) and the first ground surface (5) arranged portion of the flexible printed circuit board (14 ) form a second microstrip line (10).
    [12]
    12. Sensor (1) according to any one of the preceding claims, characterized in that the first conductor strip (3) and / or the second conductor strip (11) are formed meander-shaped / is.
    [13]
    13. Measuring system for dielectric impedance spectroscopy, comprising a measuring sensor (1) according to one of the preceding claims and a device (13) for generating and evaluating a measuring signal or a measuring signal and a reference signal of the measuring sensor (1).
    [14]
    14. Method for determining the impedance of a dielectric material sample (6), preferably a dielectric suspension, held in a container (7) by means of a measuring system according to claim 13, characterized in that the method comprises the following method steps: - contacting the measuring sensor (1 ) with the container (7) by flat application of a first, provided for a measurement signal conductor strip (3) from the outside to the container (7); - feeding a measuring signal entering the measuring sensor (1) at a predetermined frequency; - Measurement of the measuring signal issuing from the measuring sensor (1); - Determination of the phase shift between incoming and outgoing measuring signal; - Determining the impedance of the container in the container (7) held dielectric material sample (6) from the phase shift between incoming and outgoing measuring signal;
    [15]
    15. The method according to claim 14, characterized in that in addition to the incoming measurement signal and an incoming reference signal with the same frequency in a second, provided for the reference signal conductor strip (11) of the sensor (1) is fed and subsequently the difference between the Phase shift, which has the expiring measurement signal with respect to the incoming measurement signal, and the phase shift, which has the outgoing reference signal with respect to the incoming reference signal is determined.
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    同族专利:
    公开号 | 公开日
    US20180284045A1|2018-10-04|
    CN108139341A|2018-06-08|
    WO2017060263A1|2017-04-13|
    AT517604B1|2017-03-15|
    EP3359956A1|2018-08-15|
    JP2018531386A|2018-10-25|
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    优先权:
    申请号 | 申请日 | 专利标题
    ATA50850/2015A|AT517604B1|2015-10-06|2015-10-06|PROBE|ATA50850/2015A| AT517604B1|2015-10-06|2015-10-06|PROBE|
    EP16775738.4A| EP3359956A1|2015-10-06|2016-10-05|Sensing element for a measurement system suitable for dielectric impedance spectroscopy|
    JP2018517592A| JP2018531386A|2015-10-06|2016-10-05|Sensors used in measurement systems suitable for dielectric impedance spectroscopy|
    PCT/EP2016/073723| WO2017060263A1|2015-10-06|2016-10-05|Sensing element for a measurement system suitable for dielectric impedance spectroscopy|
    CN201680058197.1A| CN108139341A|2015-10-06|2016-10-05|For being suitable for the sensing element of the measuring system of dielectric Impedance Analysis|
    US15/766,055| US20180284045A1|2015-10-06|2016-10-05|Sensing Element for a Measurement System Suitable for Dielectric Impedance Spectroscopy|
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