• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    The invention relates to a circuit arrangement and a method for testing a light-emitting diode branch (2) of a circuit arrangement (1), in particular emergency lighting, for the functionality of its light-emitting diode or light-emitting diodes (3), wherein the light-emitting diode branch (2) has at least one light-emitting diode (3) and at least a resistor (4), in which method the LED branch (2) is converted from its operating state by impressing a constant electrical current (I1) with at least a first current intensity into a test state while impressing an electrical current (I2) with a different current intensity, wherein, taking into account at least one direct or indirect measurement of at least one electrical variable of the circuit arrangement (1), the light-emitting diode branch (2) is tested. To create simple process conditions, it is proposed that the light-emitting diode branch (2) in the test state a constant electric current (I2) is impressed and that in the operating and test state as electrical variable depending on a voltage (U1, U2) at least over the light-emitting diode branch (2 ), wherein the light-emitting diode branch (2) is tested for functionality of its light-emitting diode (3) or light-emitting diodes (3), taking into account the voltages (U1, U2) measured in the operating and test states.
    公开号:AT512751A1
    申请号:T50111/2012
    申请日:2012-03-29
    公开日:2013-10-15
    发明作者:
    申请人:Din Dietmar Nocker Facilityman Gmbh；
    IPC主号:
    专利说明:

    -1 - [102012/50111
    The invention relates to a circuit arrangement and a method for testing a Leuchtdiodenzweigs a circuit arrangement, in particular emergency lighting on functionality of its LED or light emitting diodes, wherein the LED branch at least one light emitting diode and at least one resistor, in which method the LED branch from its operating state under impression a constant electric current having at least a first current intensity is converted into a test state while impressing an electric current with a different current intensity, the light diode branch being tested taking into account at least one direct or indirect measurement of at least one electrical variable of the circuit arrangement,
    In order to detect a failure of a light-emitting diode (LED), it is known from the prior art (DE102009029930B3) to convert a light-emitting diode branch from an operating state in which its light-emitting diodes are operated with current from a constant current source into a test state. In the test state, measurements of electrical variables of the circuit arrangement are now made, with the aid of these measurement data being used to infer the operating parameters of the light-emitting diodes of the light-emitting diode branch. It is thus proposed to connect the circuit arrangement in the test state to a constant voltage source and to measure the current intensity in this state, after which the measured current values are assessed in comparison with a stored standard current value. A short circuit of one or more light-emitting diodes, however, can disadvantageously lead to considerable currents in the circuit arrangement, whereby damage to other circuit parts is to be feared. In addition, the storage of standard current values for the purpose of a current comparison is relatively complex and also represents a relatively unreliable approach to fault detection - among other reasons, because currents can also change due to aging phenomena -2- of the LEDs. A method for detecting a function failure of a light-emitting diode, which is based on the comparison with the standard current value and does not take these circumstances into consideration, can thus fail.
    It is therefore an object of the invention, starting from the above-described prior art, to provide a method by which the functionality of light-emitting diodes can be tested safely and reliably.
    The invention achieves the stated object with regard to the method in that the light-emitting diode branch in the test state, a constant electric current is impressed and that measured in the operating and test state as electrical variable depending on a voltage at least on the light-emitting diode branch, wherein the light-emitting diode branch taking into account In the operating and test state measured voltages for functionality of its LED or light-emitting diodes is tested.
    The fact that the light-emitting diode branch in the test state, a constant electric current is impressed, can be avoided, inter alia, that form in an eventual short circuit of a light diode unacceptably high currents in the circuit arrangement. Thus, damage to the circuitry during the test condition can be easily avoided, which can ensure a safe method of testing functionality. If, in the operating and test state, a voltage is measured at least across the light-emitting diode branch, the light-emitting diode branch being tested for functionality of its light-emitting diode or light-emitting diodes, taking into account the voltages measured in the operating and test states, in contrast to the prior art stored standard values are omitted for the purpose of checking the functionality of the light-emitting diode path or the light emitting branch. Namely, only the voltage levels measured in the operating and test states can be sufficient to ensure a reliable and reliable checking of preferably all light-emitting diodes of the light-emitting diode branch. With this functional test of the light-emitting diode or light-emitting diodes according to the invention, greater certainty can now be gained as to whether the light-emitting diode branch functions within the planned framework conditions or whether certain properties are present or not. In fact, information about the magnitude of the voltages can be obtained as to whether these are still characterized by a nonlinear voltage-current characteristic of the light-emitting diode, which in the affirmative case would speak for a functioning light-emitting diode or light-emitting diodes-and also different high constant current strengths based on the nonlinearity the voltage-current characteristic of a light-emitting diode to comparatively similar high voltages. On the other hand, in the event of a fault on at least one light-emitting diode, be it in the case of a short circuit or even a line break, significantly different voltage levels can be expected. In this case, the non-linearity of the voltage-current characteristic of a light emitting diode no longer applies, whereby the resistors contribute to increased voltage shifts. Compared to the prior art, therefore, a comparatively simple method for checking the operation of a light-emitting diode can be provided. In addition, the method according to the invention is also comparatively robust. For example, aging of the light-emitting diode also has only a slight effect on the method result, because even aged light-emitting diodes lead to a non-linear voltage-current characteristic and thus enable testing of the light-emitting diode or the light-emitting diodes according to the invention. In addition, the method by the voltage tap on the LED branch almost no dependence on the structural design, so that can result in a very versatile application or a wide range of applications.
    Advantageously, the method can also be used where the light-emitting diode branch has a plurality of light-emitting diodes connected in series and / or in parallel, each with a resistor in series. For example, even a short circuit of a light-emitting diode can be detected reproducibly in the case of six light-emitting diodes connected in parallel. The faulty current path via the short-circuited LED and -4 - its series-connected resistor led namely to a significant voltage shift between operating and test condition.
    A comparatively simple procedure can result if the test takes into account a ratio of the voltages measured in the operating and test states. In particular, however, the quotient of the voltage values can contribute to a meaningful result and thus to a reliable test of the light-emitting diode.
    If it is tested based on the quotient of the measured voltages whether one or more light-emitting diodes or light-emitting diodes of the light-emitting diode branch are functional, a simple procedure for the detection of errors in the light-emitting diode branch can be made possible, by which both a short circuit and a line break can be detected. Possible parameter fluctuations in the LED branch can be compensated if a threshold value is taken into account.
    It is a further object of the invention to provide, starting from the above-described prior art, a structurally simple circuit arrangement whose LED branch can be safely tested for defects and / or the nature of the defects of LEDs.
    The invention solves the problem with regard to the circuit arrangement in that the constant current source in the current that can be generated is made variable with regard to its constant current, wherein the test device for a test state of the LED branch is connected to the constant current source for generating a constant current of a current that is different from the constant current ,
    Constructive simplicity may result when using a constant current source that is variably variable in the current that can be generated in terms of its constant current, so as to differentiate the light-emitting diode branch.
    To operate current states. As a result, it can also be made possible for one and the same constant current source also to be used for the test state of the light-emitting diode branch. For this purpose, the test device may be connected to the constant current source for generating a constant current of a different current to the constant current.
    A particularly reliable determination of defects in the light-emitting diode branch can be made possible if the test device has a voltage measuring circuit with a measuring tap over at least the light-emitting diode branch for measuring one voltage each in its operating and test state.
    If the test device has a ratio circuit for forming a ratio of the voltages to one another in the operating and test state of the light-emitting diode branch, a comparatively high degree of constructive simplicity can be achieved in the circuit arrangement.
    In the figures, the subject invention is shown, for example. 1 shows a circuit arrangement and
    2 is a voltage-current characteristic diagram of the circuit arrangement according to FIG. 1.
    In the circuit arrangement 1 shown by way of example according to FIG. 1, a light-emitting diode branch 2 with six light-emitting diodes 3 lying in parallel is shown, to each of which a resistor 4 is connected in series. This parallel circuit 5 is connected in series with a further parallel circuit 6, which also has six parallel LEDs 3, each with a resistor 4 in series.
    In the operating state of the light-emitting diodes 3, the light-emitting diode branch 2 is supplied with a constant electric current U or impressed on this light-emitting diode branch in order to supply it with electrical power. For this purpose, a constant current source 7 is used. In general, it is mentioned that the constant current
    strength for generating the current li, for example, can be adjusted according to the brightness requirements and this constant current can certainly be adapted to a changing brightness requirements - for example: by dimming. Such a setting of the desired current intensity can also be carried out by a test device 8, which measures the voltage across this resistor 9 via a resistor 9 known in the impedance and regulates the constant current source 7 with regard to the desired constant current intensity.
    This LED branch 2 is tested or checked for the functionality of its LEDs 3 by the LED branch 2 is transferred from its operating state in a test state. For this purpose, the light-emitting diode branch 2 is charged with an electric current b with a current intensity which differs from the current intensity of the constant current h in the operating state.
    In order to avoid any damage to other components of the circuit arrangement 1 in the case of defective light-emitting diodes 3, which may, for example, also be in a short circuit, a constant electric current I 2 is likewise impressed in the test state. For this purpose, the constant current source 7 is made variable in the generatable current with respect to its constant current h or l2. A test device 8 switches the constant current source 7 from a constant current h to a constant current I 2, in that the test device 8 connected to the constant current source 7 in the control network actuates a control line 10. Taking into account a direct measurement of voltages Ui and U2 as electrical variables of the circuit arrangement 1, the light-emitting diodes 3 are now tested for their functionality. As shown in FIG. 1, these voltages Ui and U2 are measured at the measuring tap 11 via the light-emitting diode branch 2 in the operating and test state.
    In the following, reference will now be made in detail to FIG. 2, which illustrates, by way of example, the effects of various defects of a circuit arrangement. If there is no defect of a light-emitting diode 3, the result is the voltage-current characteristic curve 12. Is a
    7 of the light emitting diodes 3 is defective, by causing a short circuit, a voltage-current characteristic 13 can be observed. If three light-emitting diodes 3 of the light-emitting diode branch 2 are defective in that they have a line break (open), the voltage-current characteristic 14 results.
    The following voltages Ui and U2 could be measured in these cases using U with a first current of 60mA and I2 with a current of 240mA:
    Case 12 Case 13 Case 14 U 5.72 volts 3.73 volts 5.91 volts u 2 6.80 volts 6.26 volts 7.38 volts
    For measuring the voltages Ui and U2, the test device 8 has a voltage measuring circuit 15 with a measuring tap 11 over the light-emitting diode branch 2. In particular, the voltage measuring circuit 15 is expanded with a ratio circuit 16. The ratio circuit 16 stores the measured voltage Ui in the operating state in order to be able to set this in relation to the voltage U2 measured in the test state, which automates and facilitates the test of the light-emitting diodes 2.
    The following quotients U2 / U1 are formed: • in case 12 (without a defective light-emitting diode 3) 1.18 • in case 13 (with a short-circuited light-emitting diode 3) 1.68 • in case 14 (with three open light-emitting diodes 3) 1, 25
    Cases 13 and 14 differ significantly in their ratios compared to damage-free case 12. In the case of a faultless light-emitting diode branch 2, because of the intact non-linear voltage-current characteristics of the light-emitting diodes 3, the ratio approaches 1. The clear differences can be detected quickly.
    -8- ΙΜΡβϋΙ animals, analyzed and reproducible from a test result on the functioning of the LED branch 2 are formed.
    In order to achieve increased test safety, a threshold value can be taken into account. Thus, it is conceivable to assume a defect in the light-emitting diode branch 2 only when a threshold value of 1.2 is exceeded.
    In general, it is also conceivable to use the size of the difference of the measured ratio U2 / U1 to the damage-free ratio U2 / U1 (case 12 without defect), in order to distinguish the type of damage event - for example with regard to a short circuit or a line break at the light-emitting diodes 3 - make.
    权利要求:
    Claims (7)
    [1]
    1. A method for testing a light-emitting diode branch (2) of a circuit arrangement (1), in particular of an emergency lighting, for functionality of its light-emitting diode or light-emitting diodes (3), wherein the light-emitting diode branch (2) has at least one light-emitting diode (3). and at least one resistor (4), in which method the LED branch (2) is transferred from its operating state by impressing a constant electrical current (IO having at least a first current intensity into a test state while impressing an electrical current (12) with a different current intensity , wherein, taking into account at least one direct or indirect measurement of at least one electrical variable of the circuit arrangement (1), the light-emitting diode branch (2) is tested, characterized in that the light-emitting diode branch (2) is impressed in the test state, a constant electric current (l2) and in Operating and test condition as electrical variable in each case a voltage (Ui, U2) is measured at least over the light-emitting diode branch (2), the light-emitting diode branch (2), taking into account the voltages (Ui, U2) measured in the operating and test states, for the functioning of its light-emitting diode (3) or light-emitting diodes ( 3) is tested.
    [2]
    -2- a threshold is tested, whether one or more light emitting diodes (3) of the LED branch (2) are inoperative.
    2. The method according to claim 1, characterized in that the light-emitting diode branch (2) has a plurality of series-connected and / or parallel light-emitting diodes (3) each having a resistor (4) in series.
    [3]
    3. The method according to claim 1 or 2, characterized in that the test takes into account a ratio of the voltages measured in the operating and test states (Ui, U2).
    [4]
    4. The method according to claim 3, characterized in that based on the quotient of the measured voltages (Ui, U2) under any consideration



    [5]
    5. Circuit arrangement, in particular for lighting an emergency lighting, for carrying out the method according to one of claims 1 to 4 with a light-emitting branch (2) having at least one, in particular a plurality of light emitting diodes (3) and at least one resistor (4), with a the light-emitting diode branch (2) electrically connected constant current source (7) for electrical power supply, and with a test device (8) for testing the light-emitting diode branch (2) for functionality of its light-emitting diode (3) or light-emitting diodes (3), characterized in that the constant current source ( 7) in the generatable current is variable with respect to its constant current (L or I2), wherein the test device (8) for a test state of the LED branch (2) with the constant current source (7) for generating a constant current (L2) of the constant current (L) different current is connected.
    [6]
    6. Circuit arrangement according to claim 5, characterized in that the test device (8) has a voltage measuring circuit (15) with a Meßabgriff (11) over at least the light emitting diode branch (2) for measuring each voltage (Ui, U2) in its operating and test state having.
    [7]
    7. Circuit arrangement according to claim 5 or 6, characterized in that the test device (8) has a ratio circuit (16) for forming a ratio of the voltages (Ui and U2) to each other in the operating and test state of the LED branch (2).

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